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Richard M. Bionta XTOD Breakoutbionta1@llnl.gov July 19-21, 2005 UCRL-PRES-xxxxxx X Ray Diagnostics LCLS FAC Meeting Oct. 27, 2005
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Richard M. Bionta XTOD Breakoutbionta1@llnl.gov July 19-21, 2005 UCRL-PRES-xxxxxx FEE Layout Fast close valve Slit Ion Chamber Diagnostics Package Gas Attenuator Solid Attenuator SiC Mirror 1 Be Mirrors 2 & 3 SiC Mirror 2 Collimator 1 Diagnostics Package
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Richard M. Bionta XTOD Breakoutbionta1@llnl.gov July 19-21, 2005 UCRL-PRES-xxxxxx Damage Considerations Dose along the beam line for different materials at Gaussian peak (under normal illumination) z (m from end of undulator) Dose (eV/atom) (maximum over 827-8267eV) Shown is the maximum dose (over E photon =827 to 8267eV) SiC melt Si melt B 4 C melt Be melt
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Richard M. Bionta XTOD Breakoutbionta1@llnl.gov July 19-21, 2005 UCRL-PRES-xxxxxx Dose obtained at TTF
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Richard M. Bionta XTOD Breakoutbionta1@llnl.gov July 19-21, 2005 UCRL-PRES-xxxxxx TTF VUV Beamline
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Richard M. Bionta XTOD Breakoutbionta1@llnl.gov July 19-21, 2005 UCRL-PRES-xxxxxx Damage experiment chamber Sample holder Visible spectrometer Microscope TOF ion spectrometer
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Richard M. Bionta XTOD Breakoutbionta1@llnl.gov July 19-21, 2005 UCRL-PRES-xxxxxx SiC thin film, 1 shot, 8 x melt
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Richard M. Bionta XTOD Breakoutbionta1@llnl.gov July 19-21, 2005 UCRL-PRES-xxxxxx SiC thin film, 10000 shots, ~ 1 x melt Emission spectra shows plasma was formed
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Richard M. Bionta XTOD Breakoutbionta1@llnl.gov July 19-21, 2005 UCRL-PRES-xxxxxx SiC thin film, 10000 shots, 10% melt No spectra can be distinguished above background
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Richard M. Bionta XTOD Breakoutbionta1@llnl.gov July 19-21, 2005 UCRL-PRES-xxxxxx First shot Second shot Si/C mirror reflects for one shot
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Richard M. Bionta XTOD Breakoutbionta1@llnl.gov July 19-21, 2005 UCRL-PRES-xxxxxx Desired FEL Measurements uTotal energy / pulse 1 Photon wavelength Photon wavelength spread Pulse centroid Beam direction f(x,y)Spatial distribution u, 1 Temporal variation in beam parameters Pulse duration
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Richard M. Bionta XTOD Breakoutbionta1@llnl.gov July 19-21, 2005 UCRL-PRES-xxxxxx Desired Spontaneous Measurements f(x,y, 1 )Spatial distribution around 1 1 1st harmonic Photon wavelength 1st harmonic wavelength spread Beam direction uTotal energy / pulse u, 1 Temporal variation in beam parameters
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Richard M. Bionta XTOD Breakoutbionta1@llnl.gov July 19-21, 2005 UCRL-PRES-xxxxxx FEE Cartoon Solid Attenuator Gas Attenuator High-Energy Slit Start of Experimental Hutches 5 mm diameter collimators Muon Shield FEL Offset mirror system Total Energy Calorimeter WFOV Direct Imager Spectrometer / Indirect Imager mirror Windowless Ion Chamber e-e- Diagnostic Package Spectrometer camera
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Richard M. Bionta XTOD Breakoutbionta1@llnl.gov July 19-21, 2005 UCRL-PRES-xxxxxx Redundant Commissioning Instrumentation InstrumentPurposeAdjustmentCalibration and Physics risks Direct ImagerSP f(x,y), look for FEL, measure FEL u, f(x,y), x,y ND filter, Attenuators Scintillator linearity, Attenuator linearity and background Indirect ImagerMeasure FEL u, f(x,y), spectral imaging of SP and FEL harmonics, attenuator calibration Mirror AngleMirror reflectivity, damage Total EnergyFEL uAttenuatorsEnergy to Heat, damage Ion ChamberFEL u, x,y,x',y'PressureSignal strength SpectrometersFEL, SP spectra AttenuatorsResolution, damage
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Richard M. Bionta XTOD Breakoutbionta1@llnl.gov July 19-21, 2005 UCRL-PRES-xxxxxx Wide Field of View Direct Imager Single shot measurement of f(x,y), x, y,u Camera Photoelectrons generated by 0.01% FEL Scintillators
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Richard M. Bionta XTOD Breakoutbionta1@llnl.gov July 19-21, 2005 UCRL-PRES-xxxxxx Indirect Imager Single shot measurement of f(x,y), x, y, u Multi shot measurement of Angle selects energy and attenuation
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Richard M. Bionta XTOD Breakoutbionta1@llnl.gov July 19-21, 2005 UCRL-PRES-xxxxxx B 4 C/SiC Test Multilayers Fabricated 40 layer pairs = 0.7 P = 6 nm Data at Cu K , 8 keV
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Richard M. Bionta XTOD Breakoutbionta1@llnl.gov July 19-21, 2005 UCRL-PRES-xxxxxx Total Energy Calorimeter CMR Sensor array 100 pixels Cold Si substrate Cooling ring Xray Beam Single shot measurement of f(x,y), x, y, u Nd 0.8 Sr 0.2 Mn O 3 t = 0 t = 100 s t = 300 s Thermal diffusion calculations performed T T, ms 0 5 Sample CMR at LLNL for etching and R(T) measurements
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Richard M. Bionta XTOD Breakoutbionta1@llnl.gov July 19-21, 2005 UCRL-PRES-xxxxxx Sensor Development: Nd 0.8 Sr 0.2 MnO 3
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Richard M. Bionta XTOD Breakoutbionta1@llnl.gov July 19-21, 2005 UCRL-PRES-xxxxxx Ion Chamber Segmented cathodes for position measurement Single shot, non destructive, measurement of x’, y’, x, y,u Imaging of optical emission for position measurement 10 cm 1 torr
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Richard M. Bionta XTOD Breakoutbionta1@llnl.gov July 19-21, 2005 UCRL-PRES-xxxxxx Measuring K with photons On axis: Effect of changing K But
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Richard M. Bionta XTOD Breakoutbionta1@llnl.gov July 19-21, 2005 UCRL-PRES-xxxxxx Near-Field calculations of detuned single undulator segments First and Last 2mm x 2mm First 2 x 2 mm Last 1 x 1mm First 2 x 2 mm Last 1 x 1mm First 8.2658 Last 8.2362 First 8.2658 Last 8.2651 First 8.2658 Last 8.2645 Mean, keV Photon Energy, keV Photons/pulse/20 eV Last has K(1+10 -4 )
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Richard M. Bionta XTOD Breakoutbionta1@llnl.gov July 19-21, 2005 UCRL-PRES-xxxxxx Single Shot 8 keV Spectrometer P = 20 nm N = 1x10 4 D = 200 m Sputter-sliced SiC / B 4 C multilayer 33 m thick Single shot measurement of Beam 200 m 20 m downstream 1.4991 Å 1.4994 Å Problems: Don't have 20 m. Signal degradation due to grating thickness (coupled waveguides.) Only possible at high photon energies.
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Richard M. Bionta XTOD Breakoutbionta1@llnl.gov July 19-21, 2005 UCRL-PRES-xxxxxx Other candidates for Single-Shot Spectrometers Asymmetric cut multilayer Mosaic Graphite crystal Only one diffracted order
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Richard M. Bionta XTOD Breakoutbionta1@llnl.gov July 19-21, 2005 UCRL-PRES-xxxxxx Summary X-ray characterization for LCLS is challenging Dose limits materials choice Large range of signal levels Some measurements require precision near = 10 -4 Redundant diagnostics techniques will be used to measure pulse energy Total energy calorimeter Direct Imager Indirect Imager Ion chamber Much work needed on single-shot spectral measurements TTF damage experiment to be analyzed
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