1. Semiconductor Materials and Device Characterization
半導體量測技術
Semiconductor Materials and Device Characterization
Topic 7: time-of-flight technique and carrier mobility
Instructor: Dr. Yi-Mu Lee
Department of Electronic Engineering
National United University

2. Review and new topics: Charge pumping method (p. 379)
Haynes-Shockley experiment (time of flight)
Photoelectric effect (time of flight)
Introduction to mobility
Presentation: 12/29 = 3 students
01/05 = 5 students
Final exam: (3:00pm~5:30pm)

3. Time-of-flight (drift mobility)

4. QA

12. Mobility MOSFET mobility Effective mobility Field-effect mobility
Time-of-flight or drift mobility
Mobility and carrier velocity at high E-field

13. D. K. Schroder, p. 540

15. D. K. Schroder, p. 541

16. D. K. Schroder, p. 541

17. D. K. Schroder, p. 541

18. D. K. Schroder, p. 542~543

19. D. K. Schroder, p. 541
Continue to study p. 545

20. D. K. Schroder, p. 547

21. D. K. Schroder, p. 548

22. D. K. Schroder, p. 549

23. D. K. Schroder, p. 549

24. Continue to study p. 551
D. K. Schroder, p. 550

25. Review suggested 8.4 8.5 8.6 8.8 (in D. K. Schroder)
(in D. K. Schroder)
*You are welcome to submit the above homework to get extra bonus for your semester grade!!
**These questions are still in the range of final exam!!