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1 Charm Mixing and Strong Phases Using Quantum Correlations at CLEO-c Werner Sun, Cornell University 5-8 August 2007, Charm07 Workshop, Ithaca, NY Motivation Technique Results
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5-8 August 2007, Charm07 Workshop, Ithaca, NYWerner Sun, Cornell University 2 Charm Mixing So Far H 12,H 21 0 flavor eigenstates mass eigenstates. Previous studies: Direct lifetime measurements: Compare K K and with K . Time-dependent Dalitz analysis of K 0 S : Intermediate CP-eigenstates give y. Interference between CP+ and CP gives x. Time-dependent wrong-sign rate D 0 K : Interfering DCS and mixing amplitudes modulate exponential decay time. Ambiguity from strong phase: y’ = y cos x sin Time-dependence gives 1 st -order x/y sensitivity: Need boosted D mesons to resolve decay time. / = re i Pre-winter 2007
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5-8 August 2007, Charm07 Workshop, Ithaca, NYWerner Sun, Cornell University 3 Quantum Correlations at CLEO-c At CLEO-c, interference comes for free. Appears in time-integrated yields. 1 st -order sensitivity to y: Reconstruct K K (CP+) decay other side must be D 1 (CP ) Inclusive K K rate probes y. First measurement of cos : Reconstruct K K with K K must come from D 1 (CP ). e e * D 0 D 0 C = 1 Forbidden by CP conservation CP+ CP Maximal enhancement CP+ CP Forbidden if no mixing KK KK Interference of CF with DCS KK CP± KK Unaffected X K l Effective B at (3770) (3770)
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5-8 August 2007, Charm07 Workshop, Ithaca, NYWerner Sun, Cornell University 4 Coherent vs. Incoherent Decay We use yields for single tags (one D reconstructed) double tags (D and D reconstructed) Compare QC effective B with incoherent B to give y and cos . Sources of incoherent B : Externally measured B s. Semileptonic tags at (3770) (immune to QC). CP violation neglected. DT KK e+e+ CP+ CP KK R M /r 2 KK 1+2r 2 (1 2cos 2 ) ee 11 CP+ 1 + 2rcos + r 2 10 CP 1 2rcos + r 2 120 ST 1 + 2yrcos + r 2 1 1 y 1 + y quantum-correlated rate incoherent rate DD Xi DD ji Yield / No-QC prediction 012 Quantum correlations are seen in data! ST DT
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5-8 August 2007, Charm07 Workshop, Ithaca, NYWerner Sun, Cornell University 5 Analysis Overview Dataset: 281 pb -1 = 10 6 C-odd D 0 D 0. Combine inputs + error matrix in a 2 fit. ST and DT yields Efficiencies (signal and background) Crossfeed/background estimates Systematic errors (small compared to stat.) External B and y (‘) measurements Single tag yields (8): Fully-reconstructed DT yields (24): Inclusive e or e vs. hadronic (14): K 0 L 0 (=CP+) vs. hadronic (5): KK 1 + 2yrcos + r 2 KK KKKK 1 y K0S00K0S00 K0S0K0S0 1 y K0SK0S K0SK0S KK KK (1) 1+2r 2 (1-2cos 2 )+r 4 KK KK (1)(x 2 + y 2 )/2 KK KK (1)(x 2 + y 2 )/2 KK CP+(3) 1 + 2rcos + r 2 KK CP (3) 1 2rcos + r 2 CP+ CP (9)2 ee KK (1)1 ee KK 1 e /e CP+(6)1 e /e CP (6)1 K0L0K0L0 KK (2) 1 + 2rcos + r 2 K0L0K0L0 CP (3)2 CP+ CP
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5-8 August 2007, Charm07 Workshop, Ithaca, NYWerner Sun, Cornell University 6 Yield Measurements Fully-reconstructed single tags: Fit beam-constrained mass distribution. Fully-reconstructed double tags: Two fully-reconstructed STs Count events in 2D M BC plane. Inclusive semileptonic DTs: One fully-reconstructed ST Plus one electron candidate Fit e ± momentum spectrum K 0 L 0 double tags: One fully-reconstructed ST Plus one 0 candidate Compute missing mass-squared Signal peaks at M 2 (K 0 ).
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5-8 August 2007, Charm07 Workshop, Ithaca, NYWerner Sun, Cornell University 7 External Measurements External inputs dramatically improve y and cos precision. All correlations among measurements included in fit. Standard fit includes: Info on r needed to obtain cos : R WS = r 2 + ry’ + R M R M = (x 2 + y 2 )/2 Assume xsin = 0 y’~= ycos CP-eigenstate B s: Also K because correlated in PDG Extended fit averages y and y’: CP+ lifetimes (y) K 0 S Dalitz analysis (x, y) K CP-conserving fits (y’, r 2, R M ) Includes covariance matrices from Belle, BABAR, CLEO (thanks!)
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5-8 August 2007, Charm07 Workshop, Ithaca, NYWerner Sun, Cornell University 8 Fit Results Likelihood curves +95% CL ULs Standard fit: cos > 0.54 |sin | < 0.72 Extended fit: cos > 0.38 |sin | < 0.84 ParameterStandard FitExtended Fit N D D 10 6 1.046±0.019±0.0131.044±0.019±0.012 y (10 -3 ) 33 ± 16 ± 10 [4.3 ± 1.3 ± 0.7] r 2 (10 -3 )[6.6 ± 1.9 ± 0.8][3.39 ± 0.08 ± 0.00] cos 1.03 ± 0.19 ± 0.080.93 ± 0.32 ± 0.04 x 2 (10 -3 ) [ 0.6 ± 1.3 ± 0.7] [0.05 ± 0.05 ± 0.00] B (K ) (%) [3.77 ± 0.07 ± 0.03] B (K K ) (10 -3 )[3.81 ± 0.09 ± 0.03][3.88 ± 0.08 ± 0.03] B ( ) (10 -3 ) [1.35 ± 0.03 ± 0.01][1.36 ± 0.03 ± 0.01] B (K 0 S 0 0 )(10 -3 ) 8.08 ± 0.34 ± 0.518.35 ± 0.32 ± 0.52 B (K 0 S 0 ) (%) [1.18 ± 0.03 ± 0.03][1.14 ± 0.03 ± 0.03] B (K 0 S ) (10 -3 ) [4.56 ± 0.21 ± 0.25][4.41 ± 0.19 ± 0.25] B (K 0 S ) (%) [1.16 ± 0.04 ± 0.06][1.11 ± 0.03 ± 0.05] B (X e ) (%) 6.55 ± 0.16 ± 0.176.59 ± 0.16 ± 0.17 B (K 0 L 0 ) (%) [0.98 ± 0.03 ± 0.02][1.02 ± 0.03 ± 0.02] 2 /ndof 27.8/4658.1/58 B measurements do not supersede other CLEO-c results! [ ] = with external input CLEO PRELIMINARY
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5-8 August 2007, Charm07 Workshop, Ithaca, NYWerner Sun, Cornell University 9 Comments on Results Information in inputs: observe change in parameter errors when removed from fit. y: [Info: 50% KK ST+ B ext, 20% ST+ B ext, 15% e ± /CP DTs] 2.1 discrepancy between CLEO-c and world average. Checked extensively for bias; none found statistical fluctuation. cos : [Info: 45% K /CP+ DTs, 45% K /CP DTs] Strong nonlinearity introduced by R WS ~= r 2 + 2yrcos : 1- likelihood contours in y vs. cos (excludes xsin error) Extended fit Error on cos depends on value of y Standard fit y’ not incl. Standard fit
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5-8 August 2007, Charm07 Workshop, Ithaca, NYWerner Sun, Cornell University 10 Other Systematic Effects (I) C+ contamination of initial state (not expected, cf. A. Petrov): e e D 0 D 0 is C+, but photon must be radiated from D 0 or D 0, or from (3770) itself. ISR, FSR, bremsstrahlung photons do not flip C eigenvalue. Allow fit to determine C+ fraction. Include same-CP double tags (CP±/CP±). Allowed decay only for C+. All yields consistent with zero. Fit each yield to sum of C and C+ contributions. Results: C+/C = 0.003 ± 0.023. No evidence for C+. Other results unchanged.
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5-8 August 2007, Charm07 Workshop, Ithaca, NYWerner Sun, Cornell University 11 Other Systematic Effects (II) Standard fit, for (xsin ) = ±0.0034: cos = 1.03 ± 0.19 (stat) ± 0.08 (syst) ± 0.02 (xsin ) y = 0.033 ± 0.016 (stat) ± 0.10 (syst) ± 0.00 (xsin ) Extended fit, (xsin ) still under investigation: cos = 0.93 ± 0.32 (stat) ± 0.04 (syst) ± 0.?? (xsin ) y = +0.0043 ± 0.0013 (stat) ± 0.0007 (syst) ± 0.00?? (xsin ) Alternative: fit for xsin by sacrificing improvement in y precision. Variation of cos and y with xsin —include additional systematic error: CLEO PRELIMINARY Standard fit Extended fit
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5-8 August 2007, Charm07 Workshop, Ithaca, NYWerner Sun, Cornell University 12 Summary First measurement of cos (needed to interpret other D mixing results). Allows y’ to be added to world-average y, but with the assumption xsin = 0. Can measure xsin using C+ D 0 D 0 pairs from e e D 0 D 0 at E cm = 4170 MeV. Demonstrated new technique for charm mixing studies. Time-independent 1 st -order sensitivity to mixing parameters and phases. Different systematics from other experiments. With full CLEO-c dataset (E cm = 3770 & 4170 MeV) expect: (cos )~±0.1—0.2 (y)~±0.01 (xsin )~±0.03 Extended fit: cos = 0.93 ± 0.32 (stat) ± 0.04 (syst) ± 0.?? (xsin ) y = +0.0043 ± 0.0013 (stat) ± 0.0007 (syst) ± 0.00?? (xsin ) Standard fit: cos = 1.03 ± 0.19 (stat) ± 0.08 (syst) ± 0.02 (xsin ) y = 0.033 ± 0.016 (stat) ± 0.10 (syst) ± 0.00 (xsin ) CLEO PRELIMINARY
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5-8 August 2007, Charm07 Workshop, Ithaca, NYWerner Sun, Cornell University 13 BACKUP SLIDES
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5-8 August 2007, Charm07 Workshop, Ithaca, NYWerner Sun, Cornell University 14 Previous Results (Oct 2005) PANIC’05 prelim. results: 281 pb -1. No systematics. Only one CP mode. With r 2 constrained to world average, cos = 1.08 ± 0.66. No other external measurements. Now: Added 70% more CP K 0 S K 0 S Added K 0 L 0. Param.ValuePDG04 or CLEO-c NDDNDD (1.09 ± 0.04)x10 6 (1.01 ± 0.02)x10 6 y-0.057 ± 0.0660.008 ± 0.005 r2r2 -0.028 ± 0.069 (3.74 ± 0.18)x10 -3 PDG + Belle + FOCUS rz0.130 ± 0.082 RMRM (1.74 ± 1.47)x10 -3 < ~1x10 -3 B (K ) (3.80 ± 0.29)%(3.91 ± 0.12)% B(KK)B(KK)(0.357 ± 0.029)%(0.389 ± 0.012)% B()B() (0.125 ± 0.011)%(0.138 ± 0.005)% B(K0S00)B(K0S00) (0.932 ± 0.087)%(0.89 ± 0.41)% B(K0S0)B(K0S0) (1.27 ± 0.09)%(1.55 ± 0.12)% B (X e ) (6.21 ± 0.42)%(6.87 ± 0.28)%
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5-8 August 2007, Charm07 Workshop, Ithaca, NYWerner Sun, Cornell University 15 Mode-dependent correlated uncertainties cancel in y and cos , but only if external measurements are not included. Tracking, 0, , K 0 S, PID, EID efficiency, FSR systematics: use DHad. E cut, mass cut, K 0 S mass cut, K 0 S flight significance cut, K 0 S PID. Peaking background BFs: values and errors from PDG. Multiple candidates, SL form factor. Event selection variations: dominates y and cosd syst error. Uncorrelated uncertainties: Fit function variations. Systematic Uncertainties
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