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Design Consideration for Future RF Circuits Circuits and Systems, 2007. ISCAS 2007. IEEE International Symposium 27 May 2007 Author : Behzad Razavi Presenter : Kyungjin Yoo
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I.Introduction RF circuits - 2 trends Device level: speed, noise System level: System-on-chips New paradigm Multi-band, multi-mode transceivers Baseband processors Issues in this paper Technology scaling Design techniques
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II.Impact of Technology Scaling 1. Lower supply voltages 2. Higher gate leakage currents 3. Lower transistor output impedances
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Supply Voltage Scaling Noise, linearity, gain Trade off Mixer Oscillator VCO
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Transistor Output Impedance Lower the Q of oscillators deQing effect of ro >> Rp Negligible in 90-nm technology : ro=2.3 Kohm Problematic in 65-nm and 45-nm generation
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Gate Leakage Current Gate leakage current in 90-nm tech : 10~100pA/micrometer^2 90-nm : IG/Cp70-700 microV/ns Tin=50ns causes 3.5-35mVpp ripple
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III.Design Techniques 1. Low-Voltage Active Mixers 2. Multi-Band Techniques
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Low-Voltage Active Mixers Principle : bias current to the switching pair and the loads < bias current to the RF transconductor device
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Multi-Band Techniques Goal Minimize area avoid long interconnects at high freq. Layout compaction Stacked inductors: LNA,VCO Nested inductors: dual-band oscillator
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Thank you! Q&A
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