1. The Solar-B EUV Imaging Spectrometer: an Overview of EIS J. L. Culhane Mullard Space Science Laboratory University College London

2. AIA HMI Team Meeting, Monterey 13-17 Feb., 2006 EIS Instrument Overview 2 EIS Optical Diagram Grating Front Baffle Entrance Filter Primary Mirror CCD Camera

3. AIA HMI Team Meeting, Monterey 13-17 Feb., 2006 EIS Instrument Overview 3 Each element measured independently at Brookhaven Complete instrument calibrated end-to-end at RAL Instrument contamination budget maintained by keeping at positive dry Nitrogen pressure Continuous QCM monitoring pre and post launch Temperature insensitive lines in QS measured throughout mission Two GSFC EUNIS rocket flights during mission Philosophy based on SOHO CDS approach. EIS Calibration

4. AIA HMI Team Meeting, Monterey 13-17 Feb., 2006 EIS Instrument Overview 4 EIS Effective Area Primary and Grating: Measured- flight model data used Filters: Measured- flight entrance and rear filters CCD QE: Measured- engineering model data used Following the instrument end-to-end calibration, analysis indicates that the above data are representative of the flight instrument

5. AIA HMI Team Meeting, Monterey 13-17 Feb., 2006 EIS Instrument Overview 5 Spectroscopic Performance Long Wavelength Band Ne III lines near 267 Å from the NRL Ne–Mg Penning discharge source Gaussian profile fitting gives the FWHM values shown in the right-hand panel 57.7 mÅ 58.1 mÅ 57.9 mÅ  ~ 4600

6. AIA HMI Team Meeting, Monterey 13-17 Feb., 2006 EIS Instrument Overview 6 Spectroscopic Performance Short Wavelength Band Mg III lines near 187 Å from the NRL Ne–Mg Penning discharge source Gaussian profile fitting gives the FWHM values shown in the right-hand panel 47 mÅ  ~ 4000 Following further new line identifications in the Penning source spectrum, an absolute wavelength scale may be possible

7. AIA HMI Team Meeting, Monterey 13-17 Feb., 2006 EIS Instrument Overview 7 END OF TALK

8. AIA HMI Team Meeting, Monterey 13-17 Feb., 2006 EIS Instrument Overview 8 Observables Observation of single lines –Line intensity and profile –Line shift (  ) → Doppler motion –Line width (  w) and temperature → Nonthermal motion Observation of line pair ratios –Temperature –Density Observation of multiple lines –Differential emission measure  ww

9. AIA HMI Team Meeting, Monterey 13-17 Feb., 2006 EIS Instrument Overview 9 EIS Field-of-View 360  512  EIS Slit Maximum FOV for raster observation 512  900  Raster-scan range Shift of FOV center with coarse-mirror motion 250  slot 40  slot 512 

10. AIA HMI Team Meeting, Monterey 13-17 Feb., 2006 EIS Instrument Overview 10 EIS Sensitivity IonWavelength (A) logTN photons ARM2-Flare Fe X184.546.001536 Fe XII186.85 / 186.886.1113/21105/130 Fe XXI187.897.00-346 Fe XI188.23 / 188.306.1141 / 15110/47 Fe XXIV192.047.30- 4.0  10 4 Fe XII192.396.1146120 Ca XVII192.826.7031 1.8  10 3 Fe XII193.526.11135305 Fe XII195.12 / 195.136.11241/16538/133 Fe XIII200.026.2020113 Fe XIII202.046.203582 Fe XIII203.80 / 203.836.207/2038/114 Detected photons per 1  1  area of the Sun per 1 sec exposure. IonWavelength (A) logTN photons ARM2-Flare Fe XVI251.076.40-108 Fe XXII253.167.11-71 Fe XVII254.876.60-109 Fe XXVI255.107.30- 3.3  10 3 He II256.324.7016 3.6  10 3 Si X258.376.111462 Fe XVI262.986.4015437 Fe XXIII263.767.20- 1.2  10 3 Fe XIV264.786.3020217 Fe XIV270.516.3017104 Fe XIV274.206.301476 Fe XV284.166.35111 1.5  10 3

11. AIA HMI Team Meeting, Monterey 13-17 Feb., 2006 EIS Instrument Overview 11 Doppler Velocity and Line Width Uncertainties Doppler velocity Line width Bright AR line Flare line Photons (1  1  area) -1 sec Photons (1  1  area) -1 (10sec) -1  One-  uncertainty in: - Doppler shift (  v in km/s) - Non-thermal line width (  FWHM in km/s)  Values are plotted against number of detected photons in the line for: - Bright AR line (Fe XV/284 Å) - Flare line (Fe XXIV/255 Å)

12. AIA HMI Team Meeting, Monterey 13-17 Feb., 2006 EIS Instrument Overview 12 First 90 Day Observing Plan Flare Trigger and Dynamics: patial determination of evaporation and turbulence in a flare  Spatial determination of evaporation and turbulence in a flare Active Region Heating:  Spatial determination of velocity field in AR loops for a range of T e values Quiet Sun Studies:  Correlate coronal T e, n e, v with the magnetic topology inferred from FPP Coronal Holes and Hole Boundaries:  Measurement of intensity and velocity field at a coronal hole boundary and at selected sites in coronal holes

13. AIA HMI Team Meeting, Monterey 13-17 Feb., 2006 EIS Instrument Overview 13 SUMMARY Following SOHO CDS, the EIS instrument will provide the next steps in EUV spectral imaging of the corona: –x 10 enhancement in A eff from use of multilayers and CCDs –x 5 enhancement in spectral resolution –x 3 enhancement in spatial resolution –Like CDS; absolute calibration performed to ± 20% EIS will: –Address a broad range of coronal science topics –Enable major goals of Solar-B mission by relating coronal response to magnetic flux emergence and material flows

14. AIA HMI Team Meeting, Monterey 13-17 Feb., 2006 EIS Instrument Overview 14 Large Effective Area in two EUV bands: 170-210 Å and 250-290 Å –Multi-layer Mirror (15 cm dia ) and Grating; both with optimized Mo/Si Coatings –CCD camera; Two 2048 x 1024 high QE back illuminated CCDs Spatial resolution: 1 arc sec pixels/2 arc sec resolution Line spectroscopy with ~ 25 km/s per pixel sampling Field of View ： –Raster: 6 arc min×8.5 arc min; –FOV centre moveable E – W by ± 15 arc min Wide temperature coverage: log T = 4.7, 5.4, 6.0 - 7.3 K Simultaneous observation of up to 25 lines/spectral windows EIS - Instrument Features

15. AIA HMI Team Meeting, Monterey 13-17 Feb., 2006 EIS Instrument Overview 15 EIS on the Solar-B Spacecraft Roles and Responsibilities UK (MSSL (PI), Birmingham, RAL):  CCD cameras, Structure, On-board Processor, Filter Housing, Calibration USA (NRL, GSFC, Columbia):  Optics, Coatings, Mechanisms, Filters, Japan (NAOJ, ISAS):  Testing, Integration with Spacecraft Norway (UiO):`  EGSE Software All participants are involved in Post-launch Mission Operations and Data Analysis

16. AIA HMI Team Meeting, Monterey 13-17 Feb., 2006 EIS Instrument Overview 16 Processed Science Data Products Intensity Maps (T e, n e ):Intensity Maps (T e, n e ): – images of region being rastered from the zeroth moments of strongest spectral lines Doppler Shift Maps (Bulk Velocity):Doppler Shift Maps (Bulk Velocity): – images of region being rastered from first moments of the strongest spectral lines Line Width Maps (Non-thermal Velocity):Line Width Maps (Non-thermal Velocity): – images of region being rastered from second moments of the strongest spectral lines

17. AIA HMI Team Meeting, Monterey 13-17 Feb., 2006 EIS Instrument Overview 17 Doppler velocity Line width Bright AR line Flare line Photons (1  1  area) -1 sec -1 Photons (1  1  area) -1 (10sec) -1 Number of detected photons Doppler Velocity and Line Width Uncertainties

18. AIA HMI Team Meeting, Monterey 13-17 Feb., 2006 EIS Instrument Overview 18 Primary Mirror Raster Drive Primary Mirror Assembly Multilayer-coated mirror shown installed in the instrument structure

19. AIA HMI Team Meeting, Monterey 13-17 Feb., 2006 EIS Instrument Overview 19 Grating Assembly Grating Focus Drive

20. AIA HMI Team Meeting, Monterey 13-17 Feb., 2006 EIS Instrument Overview 20 Atomic Force Microscope Profile of Laminar Grating. Mean groove depth is 6.4 nm and the land width is 108 nm (4200 lines/mm) AFM profile of grating grooves in a 1 μm x 1 μm region near grating center for grating FL-8 Grating substrates fabricated by Zeiss - Holographic technique used to form a sinusoidal groove pattern - Ion beam etching used to shape laminar grooves and to achieve specified groove depth

21. AIA HMI Team Meeting, Monterey 13-17 Feb., 2006 EIS Instrument Overview 21 Dual CCD Camera CCD Camera and Readout Electronics Camera and associated electronics installed in the instrument structure CCDs with cold finger attachments

22. AIA HMI Team Meeting, Monterey 13-17 Feb., 2006 EIS Instrument Overview 22 Slit/Slot and Shutter Assembly Slit/Slot Wheel Shutter Slit/Slot Wheel - before blackening

23. AIA HMI Team Meeting, Monterey 13-17 Feb., 2006 EIS Instrument Overview 23 EIS Instrument Pre-Calibration EIS Instrument Completed