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JTAG over the internet!
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The problem Until now device testing was physically (geographically) limited as the DUT (device under test) and the TAP controller had to be located in close proximity.
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(continue) This may be problematic when devices are Inaccessible due to various reasons such as geographical distance (different states / outer space) or After having been deployed (logistical and financial considerations)
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The solution Harnessing the internet and various forms of communication to allow long distance testing!
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The implementation Simulation of direct connectivity – both controller and DUT believe they are directly connected and communicate with IEEE-1149.1 specifications
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Data Transceiving TMS-TDI Information is sent from Uplink to Downlink. TCK is generated by the Downlink, asynchronously to original. TDO information is sent from Downlink to Uplink.
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Delay Compensation Boundary scan relies on synchronous communication. This is a potential problem as propagation delays become significant over large distances data from last link in BS chain won’t arrive to controller on time!
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Example If for example, the target TCK frequency is 10MHz, which equates to a TCK clock period of 100 ns. This effectively, only leaves a period of 50 ns for TDO data to travel from the last DUT in the chain to the test controller. (1/2 cycle)
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(Example continued) Assuming the propagation delay of the cable is 5ns/m, a maximum cable length of 10 metres can only be used!
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The solution: Virtual cells! “Virtual Cells” are added to the end of Boundary- Scan Chain Additional time is gained for compensating transmission delays
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Session management Since the number of virtual cells is a function of the communication line congestion (and thus delay) which varies with time, the number of virtual cells should change with time as well!
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(continue) A connection oriented (TCP like) session is established between uplink and downlink and channel loop-back tests are performed to calculate the optimum number of virtual cells, using EMWA : (Where X(k) is the estimation at time k and 0 < alpha < 1)
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Embedded implementation Both uplink and downlink units can be embedded onto the chip allowing for smaller packaging (which is of high importance for small proportioned devices)
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Performance Using a 1 Gigabit Ethernet connection makes it possible to execute boundary-scan tests on the target design at acceptable TCK frequencies of up to 40MHz over an unlimited distance.
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Possible uses Factory with multiple production lines - Often a manufacturing facility will have multiple production lines; this will centralize testing and may dramatically reduce costs
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Some more uses Testing performed on devices orbiting the earth – where the only means of communication is unwired Cellular phones testing / firmware updates Configurations and contingency operations remotely
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Benefits (conclusion) Late test access and SW/FW updates possible Real time diagnostics made possible from one, remote place Enable access to otherwise inaccessible devices Scalable
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