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Diffraction of “low energy” electrons from free-standing transmission gratings Ben McMorran and Alex Cronin University of Arizona
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free-standing silicon nitride gratings note the cross section
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SEM basics objective lens sample ~3mm to 42mm 100 µm aperture SE I +10V detector PMT phosphor ~ +500V
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SEM basics sample SE I +10V detector PMT phosphor ~ +500V objective lens ~3mm to 40mm 100 µm aperture
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basic setup to observe diffraction objective lens diffraction grating 4 µm diameter tungsten wire ~30 mm SE I ~40 mm 100 µm aperture
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images of 4 micron wire through diffraction grating 4 keV beam twist = -10±2° 1.5 keV beam twist = 5±3°
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images of 4 micron wire through diffraction grating 4 keV beam twist = -10±2° 1.5 keV beam twist = 5±3°
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images of 4 micron wire through diffraction grating 1.5 keV beam twist = 5±3° 4 keV beam twist = -10±2°
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images of 4 micron wire through diffraction grating spacing between orders Δs E -1/2 why is there asymmetry? 160 140 120 100 80 60 40 20 0 -40-2002040 200 150 100 50 0 -60-40-200204060 4 keV beam twist = -10±2° 1.5 keV beam twist = 5±3°
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grating geometry w l gold coating grating bar grating k vector
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grating geometry ( ,z) z
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grating geometry z ( ,z)
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grating geometry ( ,z) z
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grating geometry ( ,z) z
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grating geometry ( ,z) z
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grating geometry ( ,z) z
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grating geometry ( ,z) z
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grating geometry ( ,z) z
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calculation of phase due to image charge o{o{ z ( ,z) r1r1 r2r2
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calculation of phase due to image charge o{o{ z ( ,z) r1r1 r2r2
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calculation of phase due to image charge o{o{ z ( ,z) r1r1 r2r2
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calculation of phase due to image charge o{o{ z ( ,z) r1r1 r2r2 where
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calculation of phase due to image charge o{o{ z ( ,z) r1r1 r2r2 where
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calculation of phase due to image charge o{o{ z ( ,z) r1r1 r2r2 where E = 1 keV v ~ 10 7 m/s τ ~ 10 -14 sec
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target twist axis Electron beam So, if we measure diffraction at different twist angles…
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…we ought to see something like this:
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grating 1 st aperture target (4 µm wire) sliding platform 3 rd aperture description of apparatus
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grounding strap twist lever tilt stage
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diffraction profiles - comparison 10±2°: 5±2°: 0±2°: -10±2°: 500 eV 1.5 keV 4 keV
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data refining 160 140 120 100 80 60 40 20 0 -40-2002040 200 150 100 50 0 -60-40-200204060 4 keV beam twist = -10±2° 1.5 keV beam twist = 5±3°
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4 keV beam twist = -10±2° 160 140 120 100 80 60 40 20 0 -40-2002040 200 150 100 50 0 -60-40-200204060 1.5 keV beam twist = 5±3° data refining
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1.5 keV beam twist = 5±3° boil images down to I n data – compare to theory 160 140 120 100 80 60 40 20 0 -40-2002040 200 150 100 50 0 -60-40-200204060 4 keV beam twist = -10±2° data refining
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conclusion have seen diffraction of electrons with energies down to 500 eV through a transmission grating have seen asymmetry in diffraction pattern due to interaction with grating a simple model using image charges seems to explain asymmetry
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goals more angles with better precision more energies include detector capable of measuring absolute intensity of diffraction orders (not just relative intensity) search for energy-dependent permittivity
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