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Preliminary Results from Structured Beam Test CMS Trigger Meeting June 3, 2003 Brian Mohr UCLA Dept. of Physics
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Expect muons in 48 out of 924 bx due to beam structure Verified here by CLCT bxn from data
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Relative position of key half strip from CLCTs from chamber 2 vs. Chamber 1 Note: Chamber 1 is vertically higher than Chamber 2 (thus the offset in position).
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Scan over ALCT delay chip settings Efficiency defined as number of events in maximum bin divided by total number of events.
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Approximately optimal timing settings for: –Cathodes: Bxn at TMB L1A - Bxn at CLCT (above) –Anodes: Bxn at ALCT L1A - Bxn at ALCT (below)
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Acknowledgements Special Thanks to: –Slava Valuev –Jason Mumford for producing the preceding plots: Based on code from Caltech, Florida, Rice, Los Angeles Thanks also to participants in beam test: –Darin Acosta, Jason Gilmore, Jianhui Gu, Misha Ignatenko, Pat Murray, Greg Pawloski, Jay Roberts –others not listed here
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