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Group Meeting Reporter: Welson T.H. Sung Date: 2008/3/5 Topic: Raman and cathodoluminescence study of dislocation in GaN
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JOURNAL OF APPLIED PHYSICS [VOLUME 92, NUMBER 11] (2002) H. Leia) and H. S. Leipner Center of Materials Science, Hoher Weg 8, Martin Luther University Halle-Wittenberg, D-06120 Halle, Germany J. Schreiber Department of Physics, Friedemann-Bach-Platz 6, Martin Luther University Halle-Wittenberg, D-06108 Halle, Germany J. L. Weyher Experimental Solid Physics III, RIM, University of Nijmegen, Toernooiveld 1, 6525 ED Nijmegen, The Netherlands T. Wosin´ ski Institute of Physics, Polish Academy of Sciences, aleja Lotniko´w 32/46, PL-02668 Warsaw, Poland I. Grzegory High Pressure Research Center, Polish Academy of Sciences, ulica Sokolowska 29/37, PL-01142 Warsaw, Poland
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Outline Motivation Background info of Sample: GaN Growth & Etching Equipment & Method: Microindenter Raman&CL Analyze Spectrum Conclusion
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Motivation The cause of YL Band (550nm) Intrinsic defects V Ga, dislocation Impurity( Oxygen, Carbon) For my further work of analyzing pillar’s spectrum
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Background info of Sample: GaN Growth: N-polar(0001), Wurtzite structure, 250~350 o C Compress: Vickers, 2N, 1~20mins ( Stress induce fresh dislocation ) Etching: 200~250 o C, KOH-NaOH ( Intrinsic dislocation )
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Equipment & Method Micro-Raman: Laser source: 632.8nm( green), 1um spot, 0.1cm -1 CL: 10K (For increase radiation free electron, decrease thermal radiation) SEM-JSM6400 ( 20kV)
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Phonon-Plasmon mode C 6v space group(#183 P6mm) 8 phonon modes: E 2 X2 (Stress free 567cm -1 ) A 1 (TO) (518cm -1 ) LOPP -1 E 1 (TO) (740cm -1 ) matrix B 1 X2 A 1 (LO) E 1 (LO) Energy transmit between Raman and Lattice vibration
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Analyze Spectrum
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Intensity decrease from 1 to 4
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Comparision (Near center) Curves 1 (intensity X1 ) & 2(intensity X2.3 ) C1:LPP combine with A1(TO) C2: Split: Free electron concentration ( close to center), A1(TO) broad. Curves 1-3 EF peak Curves3 & 4 EF blue shifting: Free electron concentration X wrong Compress stress induce
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Comparision (Near center) Curve 4: Broad,weak of peak E 2 (poor order) Other: Peak P1 P2: might be phase transformation (wurtzite => rock-salt structure) Raman Mapping : (E2 mode peak) compress 1.5GPa Max
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Dislocation nonradiative recombination Intrinsic dislocation etching pit 15um -> larger -20% compare with Matrix
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CL result Source: 400~1100nm YL: 550nm V Ga : N-type native acceptor
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CL spectrum Curve 1: intrinsic vacancy Curves 2~6: compress induce dislocations and vacancies(blue shift)
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Conclusion GaN brittle to ductile V Ga induce edge dislocation jogging Intensity of radiation: recombinative recombination at vacancy nonradiative recombination at dislocations. Other possibility
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Thank You for Your Attention
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