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Stacked-Die Chip Scale Packages Adeel Baig. Microsystems Packaging Objectives Define Stacked-Die Chip Scale Packages (S- CSP) Explain the need for S-CSP.

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Presentation on theme: "Stacked-Die Chip Scale Packages Adeel Baig. Microsystems Packaging Objectives Define Stacked-Die Chip Scale Packages (S- CSP) Explain the need for S-CSP."— Presentation transcript:

1 Stacked-Die Chip Scale Packages Adeel Baig

2 Microsystems Packaging Objectives Define Stacked-Die Chip Scale Packages (S- CSP) Explain the need for S-CSP Define the challenges faced Present strategies for improving the electrical performance and yield of wire bound S-CSP

3 S-CSP S-CSP refers to a type of multi-die package in which the die are stacked vertically and interconnected electrically via wire bonding in most cases. Microsystems Packaging

4 S-CSP Microsystems Packaging

5 Why Wirebonding? Advantages  Greater flexibility  More cost effective Microsystems Packaging

6 Why S-CSP? For many hand held devices, there is a need for greater functionality crammed into a smaller package. These features require  Greater memory capacity  Smaller footprint  Thinner profile  Lower package cost Microsystems Packaging

7 Functions Added to Cell Phones Microsystems Packaging

8 Sensors in Cell Phones MECHANICAL (Accelerometer)  Joystick games  Shock detectors CHEMICAL  Pollution  Alcohol OPTICAL  Imaging  Optical mouse CAPACITIVE  Fingerprint detection Microsystems Packaging

9 Worldwide Cell Phone Sales (Millions) Microsystems Packaging

10 Challenges Faced Increasing wire bond density  Additional space and height requirements for wire looping Yield Issues  Wire shorting is the main cause of low yield in high- density packages If one die fails, all of the other stacked and assembled dies are lost as well Microsystems Packaging

11 Key Factors Wire Sweep  Bonded wires are misaligned in the horizontal plane. Problems Created  The mutual inductance of adjacent wires can be altered and simultaneous switching noise can be created  An electrical short can occur when the wires touch. Microsystems Packaging

12 Key Factors Wire Spacing  Distance between adjacent wires Problems Created  If there is not adequate space between the wires, the risk of an electrical short is greatly increased.  If the wires are more likely to touch and short, a lower yield will result. Microsystems Packaging

13 Optimizing Design Minimize Wire Length  With increased wire length, there is a greater possibility that wire sweep problems will develop  Greater wire length has an adverse effect upon electrical performance The impedance will be increased Inductive coupling will be more likely to occur The package operating speed will be reduced Microsystems Packaging

14 Optimizing Design By shifting the die location or moving the die with respect to another die, it is possible to reduce wire length while achieving greater die to die bonding  Option B results in lower wire length Microsystems Packaging

15 Optimizing Design Die Setup  There are two main factors in the design process 1. Location of the die 2. The manner in which they are stacked. Microsystems Packaging

16 Optimizing Design Optimizing performance by shifting die position.  Figure (b) eliminates a bond wire to pad short Microsystems Packaging

17 Optimizing Design The die that has more stringent performance requirements should be placed on the bottom of the stack Microsystems Packaging

18 Wire Encapsulation In order to maximize yield, it has been necessary to inspect wires for shorts and eliminate them. Wire spacing is not an issue with this encapsulation technology.  Experiments show that using this method can reduce wire sweep and separate electrically shorted wires. Microsystems Packaging

19 Wire Encapsulation A silica filled liquid polymer is dispensed onto the wires following the wire bonding process. This material has many qualities that allow it to remain functional and reliable during the manufacturing process.  Adheres well  Has low moisture absorption  Minimized CTE mismatch that help to enhance reliability Microsystems Packaging

20 Wire Encapsulation Microsystems Packaging

21 Wire Encapsulation Ring Lock method is superior  The amount of encapsulant material utilized can be greatly reduced by 80-95%  Less time is needed in the dispensing procedure Microsystems Packaging

22 Wire Encapsulation Encapsulant can help fix wire shorts Microsystems Packaging

23 Wire Encapsulation Results show that wire encapsulation increases yield Microsystems Packaging

24 Conclusion Although flip chip technology seems superior, wire bonding is still widely used in the packaging and manufacturing industry. Challenges faced in wire bonding S-CSP are becoming more complicated  By utilizing the two approaches (Design and Wire Encapsulation) jointly, it is possible to overcome these obstacles. Microsystems Packaging


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