Download presentation
Presentation is loading. Please wait.
1
1 Micro-fabrication Process
2
2 Clean Room
3
3 Clean room classifications and applications
4
4 Clear room classification Class 1000: fewer than 1,000 particles (>0.5μm) in 1 cubic foot of air Class 100: fewer than 1,00 particles (>0.5μm) in 1 cubic foot of air
5
5 Micromachining Materials Substrates: Silicon GaAs Other elemental or compound semiconductors Metals (bulk and foils) Glasses Quartz Sapphire Ceramics Plastics, polymers and other organics
6
6 Micromachining Materials Additive Materials: Silicon (amorphous, polycrystalline, epitaxial) Silicon compounds (oxides, nitrides, carbides, …) Metals and metal compounds Glass Ceramics Polymers and other organics Biomaterials
7
7 Silicon Crystallography
8
8 Cubic Lattices Simplest arrangements of atoms in three dimension in which the unit cell is a cubic volume Simple Cubic (sc) structure has an atom located at each corner of the unit cell Body Centered Cubic (bcc) has an additional atom at the center of the cube Face Centered Cubic (fcc) unit cell has atoms at the eight corners and on the six faces.
9
9 Cubic Lattices sc bcc fcc How is the arrangement of atoms in Silicon? Silicon has fcc + (1/4x, 1/4y, 1/4z) fcc structure a is lattice constant
10
10 Si crystal structure Si crystal= fcc +1/4(x,y,z)fcc
11
11 Planes and directions Lattice vector R= r*a+ s*b+ t*c, r, s & t are integers We can define a plane in a crystal lattice with three integer, called Miller indices 1. Find the intercepts of the plane in terms of integral multiples of the basis vectors [Fig 2, 4, 1] 2.Take the reciprocal of the integers and reduce to smallest set of integers h, k, l, in this case 2,1,4 3.Label the plan (214) & direction is a b c (214) plane
12
12 Planes and directions a b c a b c a b c Blue is (100) plane, yellow arrow is dir n Blue is (010) plane, yellow arrow is dir n Blue is (110) plane, yellow arrow is dir n
13
13 晶圓製作流程
14
14 Czochralski Method For growing single-crystalline ingot
15
15 CZ 晶體提拉過程
16
16 Floating Zone Method(FZ)
17
17 懸浮帶區法 (FZ 法 ) 因 CZ 法缺點,乃因坩鍋內的氧原子會滲入單晶錠長晶過 程中。 FZ 法可以生產含氧量非常低的單晶錠。 先以模子鑄出含摻雜物多晶矽棒。 種晶被熔融並接合於棒的下端。 射頻 (RF) 加熱線圈沿軸向上移動,多晶棒熔融,原子排成 種晶方向。 缺點 – 無法生成大直徑晶錠。 – 差排 (dislocation) 密度較高。 生成的晶錠以製造 – 功率晶體 (thyristor) 。 – 大功率整流元件 (rectifier) 等為主要目的。
18
18 比較柴氏和浮動區長晶法 兩法之比較 柴氏法 (Czochralski) – 較普遍、便宜。 – 較大晶圓尺寸 (300 mm in production) 。 – 原料可再度使用。 懸浮帶區法 (FZ 法 ) – 純矽晶 ( 無坩堝 ) 。 – 較昂貴,晶圓尺寸較小 (150 mm) 。 – 主要用來製造分離式功率元件所需晶圓。
19
19 比較柴氏和浮動區長晶法
20
20 晶圓的備製 去除末端:用鋸將晶錠的兩端 ( 頸及尾 ) 切除。 研磨直徑尺寸:用無心研磨機 (centerless grinder) 。 檢測結晶方向、導電形式,以及阻抗性結晶方向 檢測方法 -X 光繞射 (diffraction) 、平行 (collimated) 光束折射。 晶錠刻意偏移主方向 (off-orientation) 幾度:離子植 入。
21
21 晶塊修整 “ 裁切 ” 錐形的晶塊與錐體末端。 驗證程序控制以控制小塊金屬或雜質。 晶塊本體研磨至所需直徑,並加上平的或槽口記號。
22
22
23
23
24
24
25
25
26
26 Silicon Wafer Cuts Miller indices indicated by ground edges called “flats”. “n”-type and “p”-type refer to “doping”. N means “negative” (phosphorous) and P means “positive” (boron).
27
27 Photolithography
28
28 Lithography devices
29
29 Lithography process
30
30 Lithography process-cont.
31
31 Positive/negative resist
32
32 Positive/negative resist-cont.
33
33 Positive/negative resist-cont.
34
34 Masking and Exposure
35
35 Mask fabrication process
36
36 Lithographic masks
37
37 Lithographic light source
38
38 Exposure Light Source (UV)
39
39 Development
40
40 Developing the pattern (C)
41
41 Oven Baking
42
42 Lithographic processing: Repeat process
43
43 Etching
44
44 Etching Mechanism Etching type Wet etching Dry etching Etching steps Oxidation Reaction Remove products
45
45 Factors in Wet Etching Limited Reaction limited Diffusion limited Factors Concentration Temperature Stirring
46
46 Anisotropic Wetting Etching HNA system
47
47 Anisotropic Etch
48
48 Anisotropic Etchants
49
49 Wet anisotropic etching
50
50 Etch the material
51
51 Dry Etching Ion bombardment Plasma reactor
52
52 Bulk machining using dry etch
53
53 Lithographic processing: Final release
54
54 Micro device integration: Packaging
55
55 Commercial micro devices: sensors and actuators
Similar presentations
© 2025 SlidePlayer.com. Inc.
All rights reserved.