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– 1 – Data ConvertersDACProfessor Y. Chiu EECT 7327Fall 2014 DAC Architecture.

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Presentation on theme: "– 1 – Data ConvertersDACProfessor Y. Chiu EECT 7327Fall 2014 DAC Architecture."— Presentation transcript:

1 – 1 – Data ConvertersDACProfessor Y. Chiu EECT 7327Fall 2014 DAC Architecture

2 – 2 – Data ConvertersDACProfessor Y. Chiu EECT 7327Fall 2014 Nyquist DAC architectures –Binary-weighted DAC –Unit-element (thermometer-coded) DAC –Segmented DAC –Resistor-string, current-steering, charge-redistribution DACs Oversampling DAC –Oversampling performed in digital domain (zero stuffing) –Digital noise shaping (ΣΔ modulator) –1-bit DAC can be used –Analog reconstruction/smoothing filter

3 – 3 – Data ConvertersDACProfessor Y. Chiu EECT 7327Fall 2014 Binary-Weighted DAC

4 Binary-Weighted CR DAC – 4 – Data ConvertersDACProfessor Y. Chiu EECT 7327Fall 2014 Binary-weighted capacitor array → most efficient architecture Bottom plate @ V R with b j = 1 and @ GND with b j = 0 C u = unit capacitance

5 Binary-Weighted CR DAC – 5 – Data ConvertersDACProfessor Y. Chiu EECT 7327Fall 2014 C p → gain error (nonlinearity if C p is nonlinear) INL and DNL limited by capacitor array mismatch

6 Stray-Insensitive CR DAC – 6 – Data ConvertersDACProfessor Y. Chiu EECT 7327Fall 2014 Large A needed to attenuate summing-node charge sharing

7 MSB Transition – 7 – Data ConvertersDACProfessor Y. Chiu EECT 7327Fall 2014 Largest DNL error occurs at the midpoint where MSB transitions, determined by the mismatch between the MSB capacitor and the rest of the array. Code 0111 Code 1000

8 Midpoint DNL – 8 – Data ConvertersDACProfessor Y. Chiu EECT 7327Fall 2014 δC > 0 results in positive DNL δC < 0 results in negative DNL or even nonmonotonicity δC > 0 δC < 0

9 Output Glitches – 9 – Data ConvertersDACProfessor Y. Chiu EECT 7327Fall 2014 Glitches cause waveform distortion, spurs and elevated noise floors High-speed DAC output is often followed by a de-glitching SHA Cause: Signal and clock skew in circuits Especially severe at MSB transition where all bits are switching – 0111…111 → 1000…000

10 De-Glitching SHA – 10 – Data ConvertersDACProfessor Y. Chiu EECT 7327Fall 2014 SHA output must be smooth (exponential settling can be viewed as pulse shaping → SHA BW does not have to be excessively large). SHA samples the output of the DAC after it settles and then hold it for T, removing the glitching energy.

11 Frequency Response – 11 – Data ConvertersDACProfessor Y. Chiu EECT 7327Fall 2014

12 Binary-Weighted Current DAC – 12 – Data ConvertersDACProfessor Y. Chiu EECT 7327Fall 2014 Current switching is simple and fast V o depends on R out of current sources without op-amp INL and DNL depend on matching, not inherently monotonic Large component spread (2 N-1 :1)

13 R-2R DAC – 13 – Data ConvertersDACProfessor Y. Chiu EECT 7327Fall 2014 A binary-weighted current DAC Component spread greatly reduced (2:1)

14 – 14 – Data ConvertersDACProfessor Y. Chiu EECT 7327Fall 2014 Unit-Element DAC

15 Resistor-String DAC – 15 – Data ConvertersDACProfessor Y. Chiu EECT 7327Fall 2014 Simple, inherently monotonic → good DNL performance Complexity ↑ speed ↓ for large N, typically N ≤ 8 bits

16 Code-Dependent R o – 16 – Data ConvertersDACProfessor Y. Chiu EECT 7327Fall 2014 R o of ladder varies with signal (code) On-resistance of switches depend on tap voltage Signal-dependent R o C o causes HD

17 DNL – 17 – Data ConvertersDACProfessor Y. Chiu EECT 7327Fall 2014

18 INL – 18 – Data ConvertersDACProfessor Y. Chiu EECT 7327Fall 2014

19 INL and DNL of BW DAC – 19 – Data ConvertersDACProfessor Y. Chiu EECT 7327Fall 2014 A BW DAC is typically constructed using unit elements, the same way as that of a UE DAC, for good component matching accuracy.

20 Current-Steering DAC – 20 – Data ConvertersDACProfessor Y. Chiu EECT 7327Fall 2014 Fast, inherently monotonic → good DNL performance Complexity increases for large N, requires B2T decoder

21 Unit Current Cell – 21 – Data ConvertersDACProfessor Y. Chiu EECT 7327Fall 2014 2 N current cells typically decomposed into a (2 N/2 ×2 N/2) matrix Current source cascoded to improve accuracy (R o effect) Coupled inverters improve synchronization of current switches

22 – 22 – Data ConvertersDACProfessor Y. Chiu EECT 7327Fall 2014 Segmented DAC

23 BW vs. UE DACs – 23 – Data ConvertersDACProfessor Y. Chiu EECT 7327Fall 2014 Binary-weighted DAC Pros –Min. # of switched elements –Simple and fast –Compact and efficient Cons –Large DNL and glitches –Monotonicity not guaranteed INL/DNL –INL(max) ≈ (√N/2)σ –DNL(max) ≈ 2*INL Unit-element DAC Pros –Good DNL, small glitches –Linear glitch energy –Guaranteed monotonic Cons –Needs B2T decoder –complex for N ≥ 8 INL/DNL –INL(max) ≈ (√N/2)σ –DNL(max) ≈ σ Combine BW and UE architectures → Segmentation

24 Segmented DAC – 24 – Data ConvertersDACProfessor Y. Chiu EECT 7327Fall 2014 MSB DAC: M- bit UE DAC LSB DAC: L-bit BW DAC Resolution: N = M + L 2 M +L switching elements Good DNL Small glitches Same INL as BW or UE

25 Comparison – 25 – Data ConvertersDACProfessor Y. Chiu EECT 7327Fall 2014 Example: N = 12, M = 8, L= 4, σ = 1% Architectureσ INL σ DNL # of s.e. Unit-element0.32 LSB’s0.01 LSB’s2 N = 4096 Binary-weighted0.32 LSB’s0.64 LSB’sN = 12 Segmented0.32 LSB’s0.06 LSB’s2 M +L = 260 Max. DNL error occurs at the transitions of MSB segments

26 Example: “8+2” Segmented Current DAC – 26 – Data ConvertersDACProfessor Y. Chiu EECT 7327Fall 2014 Ref: C.-H. Lin and K. Bult, “A 10-b, 500-MSample/s CMOS DAC in 0.6mm 2,” IEEE Journal of Solid-State Circuits, vol. 33, pp. 1948-1958, issue 12, 1998.

27 MSB-DAC Biasing Scheme – 27 – Data ConvertersDACProfessor Y. Chiu EECT 7327Fall 2014 Common-centroid global biasing + divided 4 quadrants of current cells

28 MSB-DAC Biasing Scheme – 28 – Data ConvertersDACProfessor Y. Chiu EECT 7327Fall 2014

29 Randomization and Dummies – 29 – Data ConvertersDACProfessor Y. Chiu EECT 7327Fall 2014

30 References – 30 – Data ConvertersDACProfessor Y. Chiu EECT 7327Fall 2014 1.M. J. M. Pelgrom, JSSC, pp. 1347-1352, issue 6, 1990. 2.D. K. Su and B. A. Wooley, JSSC, pp. 1224-1233, issue 12, 1993. 3.C.-H. Lin and K. Bult, JSSC, pp. 1948-1958, issue 12, 1998. 4.K. Khanoyan, F. Behbahani, A. A. Abidi, VLSI, 1999, pp. 73-76. 5.K. Falakshahi, C.-K. Yang, B. A. Wooley, JSSC, pp. 607-615, issue 5, 1999. 6.G. A. M. Van Der Plas et al., JSSC, pp. 1708-1718, issue 12, 1999. 7.A. R. Bugeja and B.-S. Song, JSSC, pp. 1719-1732, issue 12, 1999. 8.A. R. Bugeja and B.-S. Song, JSSC, pp. 1841-1852, issue 12, 2000. 9.A. van den Bosch et al., JSSC, pp. 315-324, issue 3, 2001.


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