1. Measurement of the index of refraction for uranium dioxide in the extreme ultraviolet and some other stuff to make the name longer Presented by Heidi Dumais

2. Some Background XUV: 1nm – 60nm Borders molecular scale Things like to absorb it… in particular air

3. Applications – Why We Might Care Microelectronics Astronomical imaging Microscopy

4. Procedure Anatomy of a thin film ALS beamline Transmission measurements Reflection measurements

5. Analysis Transmission data gives alpha*thickness Reflection data gives thickness Together we get alpha → complex index of refraction

6. Reflection Analysis Reflection data fit to Parratt recursive model – vary the index and the thickness

8. Transmission Analysis (1 st Approx) Fit the “rocking transmission” curves to a model to extract alpha*thickness Divide out thickness from Reflection to get alpha Alpha gives beta

12. Redo

13. Acknowledgments Dr. Turley and Dr. Allred Zephne Larsen, Allison Wells, Keith Jackson NASA BYU DOE and Eric Gullikson