1. FPIX0 Electronic Test Marina Artuso Paul Gelling Jianchun Wang  The system works fine with charge injection calibration  Gain curve, threshold, and noise calibration  Americium source calibration

2. 04/18/01Jianchun (JC) Wang2 FPIX0 Chip

3. 04/18/01Jianchun (JC) Wang3 Gain Curve Calibration Scan step 1mV ~ 31.25 e High Gain Cell Normal Gain Cell

4. 04/18/01Jianchun (JC) Wang4 Efficiency curve around threshold can used to measure both noise and threshold Attenuation factor: 0.31826

5. 04/18/01Jianchun (JC) Wang5 Threshold Distribution Threshold Voltage set to 1.95 V

6. 04/18/01Jianchun (JC) Wang6 Noise Distribution

7. 04/18/01Jianchun (JC) Wang7 Calibration with X-ray Source  Americium-241: 60 KeV (35.7%)  Peak expected: Q ~ 60 / 3.6 = 16.7 Ke  Charge – ADC curve from pulse calibration applied Q cluster (Ke) Number of Clusters 60 KeV peak

8. 04/18/01Jianchun (JC) Wang8 Am-241 with Al Filter Q cluster (Ke) Number of Clusters 9 mm (later 4 mm) Al filter used lower energy peak is suppressed

9. 04/18/01Jianchun (JC) Wang9 Relative Scale Calibration Col 1 Row 1Col 5 Row 11 Q cluster (Ke) Number of Clusters 220,000 Clusters recorded for 11  63 cells

10. 04/18/01Jianchun (JC) Wang10 Peak Position Distribution Column Row Peak Position (Ke) Number of Cells

11. 04/18/01Jianchun (JC) Wang11 Scale Correction Corrected Charge (Ke) Number of Clusters Single Point (60KeV) Calibration  Scale Factor only

12. 04/18/01Jianchun (JC) Wang12 Summary  Pulse and source calibrations so far work fine, and can be used for future test  Strong X-ray source, more point calibration  Laser beam is much better choice ( investigating )