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Bulk/surface micromachining. Lithography process sequence mask making wafer cleaning/drying spin resist soft bake exposure post-exposure bake.

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Presentation on theme: "Bulk/surface micromachining. Lithography process sequence mask making wafer cleaning/drying spin resist soft bake exposure post-exposure bake."— Presentation transcript:

1 Bulk/surface micromachining

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6 Lithography process sequence mask making wafer cleaning/drying spin resist soft bake exposure post-exposure bake development de-scumming hard bake (additive or subtractive steps) resist stripping

7 Lithography process

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10 positive/negative resist

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13 Dark/light field

14 Buck micromachining

15 Anisotropic Etch

16 Anisotropic Etchants

17 HNA Isotropic Etching

18 Lift-off

19 Surface Micromachining

20 The MEMS materials used in different places

21 Surface Micromachining

22 Stiction during Drying Process

23 Solutions of Sticking Problem This problem can be avoided by using thick structural and sacrificial layers, and short structures. If long or thin plates and beams are needed, there are several options for preventing adhesion. -Reduce contact area -Reduce the surface tension of the final rinse solution -Release by applying external forces:

24 Material properties Good step coverage Excellent adhesion. Low residual stress. Low pin hole density. Good mechanical strength. Good chemical resistance.

25 LIGA : Lithographie, GaVanoformung, Abformung Lithographie( 德 ) = lithography ( 英 ) 印刷術,光刻術,微影 ( 中 ) Galvanoformung ( 德 ) = electroforming ( 英 ) 電版術成型,電沉積,電鑄 ( 中 ) Abformung ( 德 ) = mold forming ( 英 ) 製模成型,模造 ( 中 ) LIGA

26 1975 年, Romankiw 等人 (IBM) 結合 X-ray 曝 光及電鍍技術,製作厚度 20mm 之高深寬比金 屬結構。 1982 年,由德國 W. Ehrfeld 等人在 Karlsruche Nuclear Research Center (KernForschungszentrum Karlsruhe, KfK) 所 發展。 最初目的:為了製作高深寬比的核能原料分離 元件。 美國 Wisconsin 大學之 Guckel 教授,將 LIGA 技術與半導體製程結合,使 LIGA 接近 標準的 製造技術。

27 LIGA 製程

28 LIGA 的特色 可達到次微米的精確度,製造 3D 高深寬比細微結 構與零組件。 材料選擇範圍廣 ( 高分子、金屬、陶瓷、複合材料 ) 。 批次製造,產品品質均一,適合工業化量產。 易與 IC 製程整合,達成機電整合效果。 同步輻射 X 光源設備昂貴,取得不易。 X-Ray 光罩設計製作成本高。


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