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Spintronics at Univ. L’Aquila Firstprinciples calculations: FLAPW, PWSCF, DMol 3 A. Continenza, S. Picozzi Northwestern Univ., USA (Y.J.Zhao, A.J.Freeman, T.Shishido ) Univ. Trieste (M. Peressi, A.De Bernardi )
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Spintronics at Univ. L’Aquila Univ. Catania (F. Priolo et al. ) Experiments (growth + cha- racterization) Univ.Camerino (N.Pinto, F. Gunnella, M. De Crescenzi) F. D’Orazio, F. Lucari, M. Passacantando, P. Picozzi
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Materials explored Heusler Alloys (Co 2 MnSi, Co 2 MnGe, Co 2 MnSn) Mn-doped II-IV-V 2 Mn: CdGeP 2 (i.e. Mn: CdGeP 2 ) Mn-doped I-III-VI 2 (i.e. Mn: CuGaS 2 Mn: CuGaS 2 ) Heusler/semiconductorInterfaces (I.e. Co 2 MnGe/GaAs, Co 2 MnGe/Ge) Mn-doped Si, Ge, SiGe alloys Mn, Cr and V-dopedBeTe
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Spin injection at Co 2 MnGe/semiconductor interfaces: ab-initio study Focus on Half-metallicity of heusler compound: Effect of defects Effect of junction S. Picozzi et al. JAP 94, 4723 (2003); PRB 66,094421 (2002) ? ?
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Co-antisite Co-Mn swap Mn-antisite 38.000.33Mn antisite 36.001.17Co-Mn swap 38.370.84Co antisite M tot ( B ) H f (eV) Quite low formation Energies Half-metallicity is kept (lost) with Mn (Co) antisites Ge Mn Co Defect effects
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Interface effects perturbationsinterface Strong perturbations induced by the interface Interface gap statesboth Interface gap states present at both sides sides of the interface Interface gap states Interface gap states in the Heusler Heusler side: half-metallicity is locally lost ! locally lost ! States decay away from interface (3 to 5 layers): interface (3 to 5 layers): D(E F ) vs z at D(E F ) vs z at Co 2 MnGe GaAs [001]
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Schottky barrier height: effect of the semiconductor 0.08 eV 0.5 eV < B < 0.7 eV B = E F - VBM semic “Ohmic”“Tunnel”Spin-injection process Almost ohmic for holes (E F close to VBM) Schottky (E F pinned in the gap) Type of contact GeGaAs Co2MnGe/GaAs Co2MnGe/Ge
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Mn-doping in Ge and Si Mn Ge Spin density localized on Mn sites Induced negative mom. on nearest neighbor with evident p- character: AFM Mn- Ge coupling re- lated to Zener FM? Oscillatory trend for induced moment as a function of distance from Mn impurity
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Trends with Mn concentration in Si, Ge: relevant properties FA : Difference between FM and AFM total energy: FM favored Similar behavior for Si and Ge FA Increases with Mn conc x: Consistent with expts Magnetic moments: MnGe keeps integer moment (equal to 3 B ) for all x MnSi show variations with x: larger p-d hybridization for Si Magnetism essentially of 3d origin
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“Real atoms” Absolute magnetic moments Total magnetic moments Formation energies Virtual crystal Mn-doping in Si x Ge (1-x) cells (3.13% Mn)
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Mn/Digital alloys The Mn-doped layers produce a potential well The depth of the potential well is affected by the Mn concentration: upon doubling of the concentration, the barrier doubles A potential barrier is also present for carriers in the Ge- region (not dependent on spin). Mn_ML 1 Ge spacer 3 Ge spacers Mn-doped planes
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Carrier properties Charge on Ge Spin. Dens. on Ge
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What can we do? First principles calculations of: Structural properties heats of formation phase stability defects energetics Electronic and magnetic properties magnetization magnetic alignment Carrier properties Carrier confinment, spin-polarization Magneto-optics related quantities (MOKE, XMCD) Conductivity tensor STM and Spin-Pol. STM maps
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