1. Determining Optical Properties of Uranium Oxide Richard Sandberg Brigham Young University Special Thanks to Kristi Adamson, Shannon Lunt, Elke Jackson, Dr. David Allred, Nathan Orton, Mike Diehl, Dr. Steven Turley

2. Why study Uranium Oxide? IMAGE Satellite Mirror Project High Theoretical Reflectivity Applications: Medical Equipment Space Observation Lithography

3. Creating our samples. Reactive DC Magnetron Sputtering Creates a uranium oxide film We create samples with thickness of 15–30 nanometers

4. Characterizing Samples Why these tools? X-Ray Diffraction- thickness Atomic Force Microscopy-thickness & roughness X-Ray Photoelectric Spectroscopy- chemical state Ellipsometry- thickness & valence state

5. Determining Composition with XPS Peaks indicate electron binding energy Peaks shift with varying oxidation states

6. Ellipsometry Polarized light hits sample Reflects elliptically polarized light

7. Finding Constants from Ellipsometry Lorentz Oscillator models were used to extract reflectance and n and k Ellipsometry Limitations Comparison to Literature They used bulk samples, we use thin films We know our layers are hybrid of different layers

8. Suggestion of Band Model for UO 2 (D: Electron density of states) From Naegele et al 1976

9. Reflectance of Our Samples Sample 1 Sample 2 Sample 3Sample 4

11. Further Research Depth Profiling At-wavelength reflection measurements Monochrometer Longer time scale for oxidation

12. Thank you Richard Sandberg Brigham Young University E-mail rls62@email.byu.edu Phone (801) 368-7779