1. Deformation measurement by compton alignment Satoru Takahashi, Nagoya Univ. OPERA emulsion workshop

2. Procedure of compton alignment for large area global alignment by X-ray mark division small area and local alignment with compton tracks for each area –unit area:5*5mm 2 CS pl1 CS pl2

3. PH>=10 dr<150μm dθ<0.4rad signal : 35.5 significance : 27.8 shift vector: 10.80, -8.66 peak# : 37 Area:119 (11, 9) mean : 1.49 RMS : 1.28 BG#/(6×6)μm 2 position displacement ev : 174969, CS : 2-20, KCl : 14h

4. Area:000 (0, 0) signal : 12.7 significance : 11.4 shift parameter: -2.12, 0.97 Area: 050 (2, 4) signal : 33.59 significance : 26.97 shift parameter: 1.62 -3.85 Area:150 (6, 12) signal : 27.62 significance : 23.05 shift parameter: 5.01 -3.92 Area:100 (4, 8) signal : 29.46 significance : 23.68 shift parameter: 2.41 -3.82

5. shift vector map Shift vector shows X-ray mark alignment error and deformation.

6. shift vector distribution Mean [micron] : 3.4, -4.8 : X-ray mark alignment error RMS [micron] : 3.9, 2.6 : deformation Max [micron] : 13.8 : maximum position displacement due to X-ray alignment error and deformation

7. differential vector map RMS : 0.32um/mm

8. ev : 124528, CS : 6-9, KCl : 14h Mean [micron] : -4.3, -15.0 RMS [micron] : 4.2, 5.4 Max [micron] : 26.7

9. 0.30[micron/mm]

10. ev : 124528, CS : 5-9, KCl : 14h Mean [micron] : -2.9, 11.0 RMS [micron] : 4.3, 7.8 Max [micron] : 31.5

11. 0.33[micron/mm]

12. ev : 3874834, CS : 12-7, KCl : 4h Mean [micron] : 5.6, 2.7 RMS [micron] : 3.5, 2.1 Max [micron] : 12.6

13. 0.30[micron/mm]

14. Summary X-ray alignment error [micron] : (4.8, 11.1) deformation [micron] : (4.0, 4.5) maximum position displacement [micron] : 31.5 4.8, 11.1 (RMS) 4.0, 4.5 (average) 31.5 (Max.)