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Novel approach for calibration breakdown voltage of large area SiPM

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Presentation on theme: "Novel approach for calibration breakdown voltage of large area SiPM"— Presentation transcript:

1 Novel approach for calibration breakdown voltage of large area SiPM
Sergei Dolinsky Imaging Technologies GE Global Research Center Niskayuna, NY International Workshop on New Photon-Detectors: PhotoDet 2012 June 13-15, 2012 – LAL Orsay, France

2 Geiger Mode APD and Gain
Operation principle: Photodiode-> APD ->Break down -> Geiger I Break down G=1 APD Geiger VOV V VBD VOp GainGeiger = VOV*Cdiode

3 DC vs. pulsed Gain Calibration
Gain definition Diode, Gain1 APD, Gain <1000 Geiger Mode APD, Gain ~ Gain 1, QE measurement Linear mode: QE and Gain(V) Geiger mode, with limited Ncells PDE(Vov), Gain(Vov) DC OK OK, dark current contribution is small Difficult: After pulses and Crosstalk Pulsed mode Slow pulse, low noise, low bandwidth amplifier Medium intensity light pulse ~1 SPE per pulse. Need high gain, low noise amplifier Linear - PMT, PIN diode or APD Signal = NPh*QE*Gain SiPM Signal = NPh*QE*PGeiger*GSPE PGeiger(Vov , Nph/Ncells) Need high gain, low noise amplifier or different method

4 SPE based calibration Works very well for small devices ~1-10 mm2
Can use non-calibrated light source Need for PDE vs. Vov measurements Need high gain, low noise amplifier MPPC – S C SN#407, 3x3 mm2 MPPC – S C SN#407, 3x3 mm2 Laser 405 nm PicoQuant LDH-D-C-405, MHz 10 kHZ , attenuated OD 4.0 Preamp. 50 Ohm, Oscilloscope LeCroy WaveRuner 610Zi 1 GHz , filter -BW 20 MHZ

5 SPE based calibration Works very well for small devices ~1-10 mm2 with low noise Need high gain, low noise amplifier Problematic for big devices ~ mm2 : Long recharging time, high dark count rate, crosstalk and after pulses make it difficult MPPC – S C SN#407, 4 x 3x3 mm2 3x3 mm2 -> 6x6 mm2 MPPC-50um intrinsic impedance 35 Ohm+320 pF -> Ohm+1500 pF Recovery time  = CSiPM*(RSiPM+RInput)  = 27 ns >  = 75 Ohm 1 SPE, Vov=1 V @50 Ohm Vpeak = 165 uV -> Vpeak = 60 uV.

6 Average pulse based calibration
Measure average pulse amplitude and charge vs. Vbias for ~ SPE Fast method Pulse shape is the same as SPE pulse shape Measure PDE*GSPE *(1+Xtalk) Non-linear behavior in Vbr region -> difficult to interpolate Afterpulses Crosstalk

7 “High intensity” pulsed calibration
Let’s trigger all cells by HUGE light pulse PDE(Nph)~ 1-exp(-PGeiger*Nph/Ncells) No PDE dependence Signal is linear for small Vov

8 “High intensity” pulsed calibration
Optical power requirements: Epulse = Eph(λ)*Ne-h/QE*Ncells*AreaIlluminated/AreaSiPM For 1 cm2 illuminated area and 50 um u-cell Epulse(405 nm) =1.2 pJ 1 ns pulse PeakPowerOptical (405) = 1 mW PicoQuant LDH-D-405 ~50-60 pJ /pulse Laser Diodes ~100mW available Use SiPM below Vbr to measure pulse intensity I(G=1) = Frep*Ncells*Ne-h*Qe =10 kHz*3600*30*1.6e-19 = 180 pA

9 Dark current measurement
Keithley 2400 SourceMeter I-V measurements: How fast to do I-V scan? Remove C from Vbias ( RC, leakage ~nA) ! SiPM stabilization time ~10 sec VBias Rload SiPM Ampl. VLED A Keithley 2400

10 “High intensity” pulsed calibration
MPPC – S C SN#407, 3x3 mm2 Laser 405 nm PicoQuant LDH-D-C-405, MHz 10 kHZ , attenuated OD For wide range of light intensity I-V has linear part

11 “High intensity” pulsed calibration
Gain/dV = dI/dV/Frep/Ncell = Cdiode I diode e-h/ucell Gain/dV Vbr No filter 4.5 nA 800 152 fF 69.76 ND 0.3 2.4 nA 420 145 fF ND 0.7 0.8 nA 140 132 fF 69.78 ND 1.0 0.28 nA 50 122 fF 69.85 ND 1.5 0.07 nA 12 97 fF 70.05

12 “High intensity” pulsed calibration
50 Ohm = Vov* 50/(RSiPM +50) e-h/ucell Slope Gain/dV No filter 800 0.9 152 fF ND 0.7 140 0.75 132 fF ND 1.5 12 0.6 97 fF

13 “High intensity” pulsed calibration HPK 6x6 mm2
50 Ohm = Vov* 50/(RSiPM +50) e-h/ucell Slope Gain/dV Laser spot ~5 cm2 30 1.0 129 fF

14 “High intensity” pulsed calibration SensL 6x6 mm2
50 Ohm = Vov* 50/(RSiPM +50) SensL Micro SM X13 Lot e-h/ucell Slope Gain/dV Laser spot ~5 cm2 10 0.58 158 fF

15 Gain = (I – Idark)/(I27V-Idark,27V)
SiPM as APD Gain = (I – Idark)/(I27V-Idark,27V) SiPM works as APD Limited linearity Gain ~1000 at Vbr

16 Conclusion The High Intensity pulse calibration method is simple and reproduces Vbr measured by SPE I-V measurement can be used during SiPM production No need of a high gain amplifier, can be used with FE electronics optimized for scintillator pulses SiPM can operate as an APD below break down Simple model of SiPM and Geiger avalanche development does not work for very high number of primary e-h


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