1. MS, LG, XS PXL ladder tests at IPHC, May 1-7, 2012 1 1 1 Preliminary Ladder Testing Results At IPHC MS, XS, LG

2. MS, LG, XS PXL ladder tests at IPHC, May 1-7, 2012 2 2 2 Outline Ladders Testing Goals Voltage, power and temperature on ladder Baseline comparisons to probe test results Sensor performance in ladder configuration Issues What we have learned? Future testing

3. MS, LG, XS PXL ladder tests at IPHC, May 1-7, 2012 3 3 3 Ladders Thin and thick sensor ladders. Large bypass caps at either end, no small bypass caps (pads area available for VDDA, VDDD, VCLP). Hand assembled quickly from probe tested sensors that function but have not been extensively characterized and are not necessarily optimum. Tested at LBNL for JTAG function, test mode line pattern, normal mode readout was checked for proper header pattern. Ladders were then shipped to IPHC. Probe system used primarily test modes. Normal RDO mode implemented(mostly) at IPHC.

4. MS, LG, XS PXL ladder tests at IPHC, May 1-7, 2012 4 4 4 Testing goals Validate the cable design – Cable design driven by mechanical requirements Test results from Phase-1 sensor ladders Expected large power consumption at startup – Basic funcitonality (JTAG, Power distribution, etc.) – Characterization of sensor performance Test mode Normal readout mode As a function of bypass capacitance

5. MS, LG, XS PXL ladder tests at IPHC, May 1-7, 2012 5 5 5 Voltage, power and temperature on ladder

6. MS, LG, XS PXL ladder tests at IPHC, May 1-7, 2012 6 6 6 Voltage, power and temperature on ladder Thin Sensor Cable HIGH threshold settings LOW threshold settingsOne sensor @ regulator3.97 3.5 Driver section GND on the cable67 mV73 mV12mV Sensor power3.5833.5463.448 Driver power3.4713.4673.48 Begin low mass section GND153 mV170 mV23 mV Power3.4783.4273.435 End of ladder power3.4593.4063.433 End of ladder GND172 mV190 mV23 mV Thin Sensor CableHIGH threshold settings LOW threshold settings One sensor Beginning of ladder3.3253.257n.a. End of ladder3.2873.216n.a. Thick Sensor CableHIGH threshold settings LOW threshold settings One sensor Beginning of ladder3.2563.172n.a. End of ladder3.2133.122n.a.

7. MS, LG, XS PXL ladder tests at IPHC, May 1-7, 2012 7 7 7 Voltage, power and temperature on ladder Cooling liquid @ 22.5 °C

8. MS, LG, XS PXL ladder tests at IPHC, May 1-7, 2012 8 8 8 Baseline comparisons to probe test results No damage during shipping – JTAG and basic functionality Sensor damage during construction: – 1 sensor on the “thick” ladder (L1) – 2 senosrs on the “thin” ladder (L2) We suspect VCLP failure – to be tested later

9. MS, LG, XS PXL ladder tests at IPHC, May 1-7, 2012 9 9 9 Baseline comparisons to probe test results

10. MS, LG, XS PXL ladder tests at IPHC, May 1-7, 2012 10

11. MS, LG, XS PXL ladder tests at IPHC, May 1-7, 2012 11 Sensor performance in ladder configuration

12. MS, LG, XS PXL ladder tests at IPHC, May 1-7, 2012 12 Issues: threshold shift

13. MS, LG, XS PXL ladder tests at IPHC, May 1-7, 2012 13 Issues: self-induced noise 13 5×5× -1 mV-2 mV A60 11.5 k B951.3 k1.9 M C0.5 k3.7 k64 k D1.5 k10.0 k0.2 M

14. MS, LG, XS PXL ladder tests at IPHC, May 1-7, 2012 14 Issues: missing header/trailer bits

15. MS, LG, XS PXL ladder tests at IPHC, May 1-7, 2012 15 What we have learned? We need to work on our probe testing to be sure that we are getting good results. We need to be more careful of ESD during ladder construction. The voltage drop on the ladders appears to be manageable. The threshold baseline shifts with applied VDD and noise. Self induced sensor noise is possible. The noise observed without any bypassing capacitors in the sensor array is significant. Additional testing is needed

16. MS, LG, XS PXL ladder tests at IPHC, May 1-7, 2012 16 Future testing Add bypass capacitors Retest existing ladders In parallel, design split-power cable Assemble split-power ladder in Berkeley Continue intensive testing at LBL

17. MS, LG, XS PXL ladder tests at IPHC, May 1-7, 2012 17 Discussion points Additional measurments An onboard regulator may help with the threshold shifts and with noise immunity, but at the cost of power dissipation …

18. MS, LG, XS PXL ladder tests at IPHC, May 1-7, 2012 18 Back up slides

19. MS, LG, XS PXL ladder tests at IPHC, May 1-7, 2012 19 Issues: ladder induced noise