2. Figure 2. 1in X 1in, 2-layer FR4 capacitance test board (left) top view, (right) bottom view. Figure 1. Recommended test setup for measuring capacitance.

3. Figure 3. Open-circuit response of a 518-Ω capacitance test setup. Figure 4. Measuring the time constant using the 63% method.

4. Figure 5. Improper implementation of the 63% method for measuring the time constant. Because the time constant is approximately equal to the rise-time, measuring the time constant from the point when the voltage (yellow) starts to rise will introduce significant error. Figure 6. Correct implementation of the 63% method for measuring the time constant. Method 1Method 2..

5. Figure 7. Resulting error in measuring capacitance.

6. Figure 9. 1in X 1in, 2-layer FR4 inductance test board (left) top view, (right) bottom view. R1: 33 Ω R2: 18 Ω Figure 8. Test setup for measuring inductance.

8. Figure 12. Inductor voltage decay when the time constant is comparable to the rise time. Rise time is measured based on the 37% method. Figure 13. Resulting error in measuring inductance.