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Advanced Evaluation Techniques and Hardware-In- The-Loop Simulation Darcy Bullock, P.E. Professor Purdue University.

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Presentation on theme: "Advanced Evaluation Techniques and Hardware-In- The-Loop Simulation Darcy Bullock, P.E. Professor Purdue University."— Presentation transcript:

1 Advanced Evaluation Techniques and Hardware-In- The-Loop Simulation Darcy Bullock, P.E. Professor Purdue University

2 Requested Topics What is Hardware-in-the-Loop (HITL) Why would you use it Historical Perspective Future Challenges

3 What is HITL Testing and Evaluation of control equipment/algorithms with a simulated plant

4 What is HITL Goal Typical HITL Simulated Controller Simulated Plant Control Equipment Simulated Plant Control Equipment Real World Traffic

5 Why would you want to use HITL So you can make mistakes (and learn from them) in the lab, not the field. Then when you deploy, there should be fewer surprises. So you have a controlled environment in which to experiment and quantify benefits. So you have a facility for students to try things and learn from their mistakes. Probe the “corners” of a control system without worrying about the consequences of failure

6 Functional Evaluation

7 Hmm. What if we could control a suitcase tester with a computer. Monitor 24 volt phase outputs Ground loop detector inputs as directed.

8 Performance Based Evaluation

9 Still Do Suite Case Testing

10 System Setup w/ Master

11 Alternative to HITL Suitcase tester Ok feature individual tester Virtually impossible to evaluate interaction of various features on a single controller much less a “system” of controllers “Full Up Testing”…. Plug everything together and hope they work

12 Historical Perspective HITL has been used extensively by other industries for several decades. 1985 at University of Vermont when Prof Bob Dawson explained his simulation system for testing/developing the control system on a PDP-11 controlling the gravel washing/production system.

13 Gate Control Logic 1986 worked on a speed sieve design for gate control at the IBM Essex Junction Plant 1987 senior design project worked with EE student and.. he built the control hardware.. I built a simulator in Modula II.

14 1993 Moved to LSU in Baton Rouge, LA Tom Urbanik invites me to participate with his team on the IVHS Research Center Proposal Developed HITL concept for Smart Diamond Testing

15 Dec 1993 Smart Diamond Testing Concept

16 1994 Smart Diamond Test Plan

17 1994 Smart Diamond Equipment Concept

18 Further Developments TexSIM developed for Smart Diamond Monty willl discuss next CORSIM extended for hardware in the loop

19 Controller Interface Device (CID) ~1997

20 1997-Present CID Uses Testing ACS Lite algorithms Algorithm development Controller feature testing Laboratory Based Instruction

21 1997 – Present Hardware TTI Platform Idaha Platform Univ. of Minnesota Platform Naztec/Eagle Platform Portland PLC Platform Emergence of a Software Platform (Univ of Arizona, Siemens, Univ of Utah)

22 Purdue HITL Laboratory

23 Project Setup Choose a real system to design and simulate Obtain plans, volumes, etc. from DOT Systems that are being constructed, need to be upgraded, or were recently upgraded are ideal

24 Project Selections

25 Project: Design Process Calculate timing parameters 555510 77 3.0 4.0 3.5 1.5 2.0 20 50 40 3.0 2.5 15 7777

26 Project: Design Process Obtain cycles, offsets, and splits from Synchro or Highway Capacity Software

27 Project: Real-Time Simulation Controllers are configured with the calculated timings and coordination timings

28 Project: Real-Time Simulation Simulation model is built using proposed geometries and vehicle volumes and imported into CORSIM ITRAF CORSIM

29 I/O Mapping Vehicle sensors are mapped to the corresponding phases by the students Detector Cards Controller Mapping

30 “Final Lab Exam” 1 controller plugged into 1 CID for each intersection All CIDs plugged in to 1 PC running CORSIM All controllers plugged in to 1 PC running remote software

31 Closed Loop Monitoring Screens PC set up to monitor the system remotely Change controller parameters View signal and detector status

32 For future HITL Challenges Commercially viable CIDs that supports both TS2 Type 1 and Type 2 I/O AND a Well supported integration with an accepted simulation model (CORSIM) Blurring of software/hardware in the loop Formally addressing the timing latency issue between simulation clock and controller.


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