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Chapter 10 Fundamentals of Wafer-Level Packaging Jason Mucilli Vincent Wu October 1, 2007.

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Presentation on theme: "Chapter 10 Fundamentals of Wafer-Level Packaging Jason Mucilli Vincent Wu October 1, 2007."— Presentation transcript:

1 Chapter 10 Fundamentals of Wafer-Level Packaging Jason Mucilli Vincent Wu October 1, 2007

2 What is Wafer-Level Packaging?  IC packaging formed at the wafer level on the wafer in the wafer foundry  Front end IC fabrication and back end IC assembly performed at wafer foundry  CSP (chip-scale package)  20% larger than IC’s-done ass single chip packages at IC level, assembled by standard SMT, encapsulated and tested  Flip Chip  Done at wafer level and solder bonded with face down  Wafer level packaging  Goes extra step in forming electrical connections on the wafer, assembled face down but with SMT equipment, then encapsulating, testing and singulating as packaged IC’s

3 What is Wafer-Level Packaging? Cont.  Today’s wafer and IC packaging vs. new wafer level packaging process:

4 Why Wafer-level packaging?  Possible benefits  Smallest system size  Enabling interconnect continuum from IC to PWB because of thin-film processing  Reduced cost of packaging, testing and burn-in because all done at the wafer level  Elimination of underfill because compliancy of leads or other ways to achieve reliability  Improved electrical performance due to short lead lengths

5 Why Wafer-level packaging? Cont.  Size benefits  Shrinking size of portable and hand-held electronic devices  Ultimate IC packaging option-the package and the area it occupies on the PWB are equal to the size of an IC

6 Why Wafer-level packaging? Cont.  Cost benefits-achieved by 2 techniques:  Increasing wafer size results in more IC’s per wafer  Decreasing feature size on the IC- causes “die- shrinks” which result in more IC’s for a given wafer size  Equipment Costs  As wafer gets larger, the cost of the equipment also goes up  Cost increase is more than offset by increased production capacity

7  Disadvantages  Incompatibility of PWB  Very high I/O IC’s would require very small solder balls on a very tight pitch  Requires very high density PWB to interconnect- expensive

8 Why Wafer-level packaging? Cont.  Disadvantages Cont.  ALL the IC’s (good and bad) are packaged at the wafer level  Results in bad IC’s packaged early on when yields are low

9 WLP Technologies  Evolution of the Silicon wafer in size  30 years ago-82.5mm  Now-300mm  Factor of 10 in IC productivity-also drives down cost

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11 WLP Technologies Cont.  More than a dozen different ways of forming wafer-level packages: 3 categories  Redistributing WLP  Encapsulated WLP  Flex/Tape WLP

12 Redistribution of WLP Technologies  WLP Processes  Redistribution  Flip-Flop technology  Figure 10.10

13 Redistribution of WLP Technologies cont.

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16  Redistribution technology offers protection  WLP technology use same technology as flip chip or bare die direct chip attachment to organic board  Difference in solder balls size

17 Encapsulated WLP Technologies  Encapsulated technology  Seals the chip between glass plates.  Peripheral Pads  Technology and material similar to redistribution.  Wafer  Front and Backside  Thickness  lithography

18 Encapsulated WLP Technologies

19 Flex Tape WLP Technologies  Flex Tape WLP  Conventional flex tape  Copper-polyimide flex tape  Wafer  IC  Connected by wirebonding  Liquid encapsulant  protection

20 Flex Tape WLP Technologies cont.

21 WLP Reliability  Fundamentals of reliability  Coffin-Mason  Modified Equation  Reliable connection  Four Ways

22 WLP Reliability cont. Has been used for over 30 years.

23 Need for Underfill in WLP  WLP  IC packaging technology at wafer level w/o underfill is reliable.  But…  Interconnection b/w IC board rigid connection  Ex. Solder

24 Need for Underfill in WLP cont.  Underfill  Distributes stress across the substrate and PWB  Minimize stress concentration in solder balls  Increase Lifetime in thermal shock

25 Need for Underfill in WLP cont.

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27 Wafer-Level Burn-In and Test  Low-cost WLP  Wafer-level and Tests (necessity)  Non-destructive probing and technologies

28 Wafer-Level Burn-in and Test

29 Summary and Future Trends  Wafer-level Packaging technology  Fundamental advantage  Cost, Size, electrical performance, and Reliability.  Ultimate IC packaging technology  So far…  Mostly small I/O ICs.  High I/O with very high pitch. (still needs to be worked on)

30 Summary and Future Trends cont.

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