1. THEMIS INSTRUMENT PER 1 UCB, May, 2005 EMC / Mag Instrument Test Plan & Results Michael Ludlam University of California - Berkeley

2. THEMIS INSTRUMENT PER 2 UCB, May, 2005 EMC Test Results Instrument suite EMC test was performed at EMCE in Fremont, CA on FM1, April 05. Only Conducted Emissions and Conducted Susceptibility measurements were made. Subsequent EMC testing (on FM2-6) will be done at bench level at UCB. Results detailed in THM_SYS_REP_003_EMC.doc (contains completed procedure THM_SYS_PROC_003_EMC.doc) EMC levels for E have been calculated and documented in “THEMIS Environmental Design Specification SAI-SPEC-1148 Revision – A”. H field levels are located in the magnetic test plan (reference on page 7 of these slides). These levels have been fixed since early 2004.

3. THEMIS INSTRUMENT PER 3 UCB, May, 2005 EMC Testing

4. THEMIS INSTRUMENT PER 4 UCB, May, 2005 Instrument Compatibility Grounding Instrument suite verified to meet grounding scheme prior to EMC testing. Voltage Ripple From ETU testing, Instruments have set limit on probe power bus of 100mV p-p noise (EFI constraint). Instrument Functionality No instrument to instrument noise issues.

5. THEMIS INSTRUMENT PER 5 UCB, May, 2005 Conducted Emission Results CE01 Conducted Emissions 30Hz – 15kHz Emissions slightly above specification at top end of test, however only by 0.8dB. CE03 Conducted Emissions 15kHz – 50MHz Background measurement taken is above the specification – therefore need to look at the difference between ‘background’ and ‘instrument on’. Slight difference in 1-9 MHz noise from EFI motors. CE07 Voltage Transients Passed

6. THEMIS INSTRUMENT PER 6 UCB, May, 2005 CE01

7. THEMIS INSTRUMENT PER 7 UCB, May, 2005 CE03 Instrument On. Motors On Ambient Instrument On. Motors Off

8. THEMIS INSTRUMENT PER 8 UCB, May, 2005 Conducted Susceptibility Results CS01 Conducted Susceptibility 30Hz – 50kHz Noise seen on EFI & SST, but no criteria failed. Passed. CS02 Conducted Susceptibility 50kHz – 400MHz Passed. CS07 Conducted Susceptibility spikes Passed.

9. THEMIS INSTRUMENT PER 9 UCB, May, 2005 Mag Test Plan DC Fields Detailed Magnetics Control Plan (ftp://apollo.ssl.berkeley.edu/pub/THEMIS/1 Management/1.3 Systems Engineering/1. Requirements/thm_sys_002d_Magnetic Cleanliness.pdf)ftp://apollo.ssl.berkeley.edu/pub/THEMIS/1 Management/1.3 Systems Engineering/1. Requirements/thm_sys_002d_Magnetic Cleanliness.pdf Early problem component identification and testing (EFI Motors and SST Sensors). Modelling of instrument fields. Magnetic mapping of all units before installation onto probes Deperming of tools for flight model assembly and integration AC Fields Careful implementation of Magnetics Control Plan recommendations e.g. twisting of power and return lines in harnesses. Currently there are no instrument AC fields issues SCM Team made measurements in clean room and at EMC of different instrument configurations. Final check during S/C EMC test.

10. THEMIS INSTRUMENT PER 10 UCB, May, 2005 Magnetic Coil Facility Used for instrument mapping and deperming