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Published bySheryl Carson Modified over 9 years ago
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Nanocrystal Non-volatile Memory Devices Kedar Patel Liu et al (April 2006) Blauwe (Trans. on Nanotechnology, March 2002) Lin et al (TED, April 2006)
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NV Memory Device Programming Channel Hot Electron injection or Fowler- Nordheim tunneling into poly or nc-Si Erase Fowler Nordheim tunneling to substrate or source
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Quantum Scale! For 50nm x 50nm memory cell (transistor) and 10 12 cm -2 nanocrystal density: 25 nc per cell For 32nm x 32nm memory cell (transistor) and 10 12 cm -2 nanocrystal density: 10 nc per cell
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Fabrication Excess Si-Precipitation –Few 1-10keV, 10 16 cm -2 Si implanted in SiO 2 + 1000C N 2 anneal 3-10nm nc-Si precipitates, ~10 12 cm -2 Aerosol Deposition –Pyrolysis of Silane (SiH 4 ) at 950C Direct Deposition –LPCVD of Poly-Si; stop shortly after nucleation of sites before a continuous film is formed
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PbSe or Co Nanocrystals Tang et al (TED, March 2007)
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