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Petros OikonomakosBashir M. Al-Hashimi Mark Zwolinski Versatile High-Level Synthesis of Self-Checking Datapaths Using an On-line Testability Metric Electronics and Computer Science University of Southampton, UK Electronic Systems Design Group
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Motivation On-line testability and Self-checking design High reliability requirements Hostile environments …but significant hardware and / or performance penalties High-level synthesis Fast time-to-market Fast and efficient design space exploration Specification-driven optimisation at the highest level of abstraction High-level synthesis for on-line testability
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Outline Introduction Physical and Algorithmic Duplication and Inversion-based Self-checking Design High-level Synthesis Background Implementation : Transforms, Metric, Algorithm Synthesis and Simulation Results Conclusion
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Introduction Self-checking design at the RTL : typical in industry Self-checking design before high-level synthesis Self-checking design after high-level synthesis Our approach : self-checking design within high-level synthesis!!!
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Self-checking design CUT CUT* Comparator Duplication CUT INV(CUT) Comparator Inversion CUT* : functionally equivalent to CUT Fault secure by nature INV(CUT) : functional “inverse” of CUT Fault secure for arithmetic modules
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Self-checking design Physical vs. Algorithmic Duplication Physical Duplication physically duplicated operators over 100% hardware overhead Algorithmic Duplication behaviourally duplicated operations possible significant hardware savings
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Self-checking design Physical vs. Algorithmic Inversion Physical Inversion no advantage over duplication Algorithmic Inversion allied to algorithmic duplication possibly more hardware savings than algorithmic duplication
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High-level synthesis background behavioural HDL code initial design iterative refinement (optimisation loop) driven by a cost function based on available (scheduling, allocation) transformations controlled by an algorithm
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transform and data selection validity check High-level synthesis optimisation loop transformation valid? cost estimation perform transform?perform another transform? execution end y n y nyny n
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Implementation - Transforms within the Multiple Objective Optimisation in Data and control path Synthesis (MOODS) High-level Synthesis Suite N #1 C1 #2 C2 Initial state
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Implementation - Transforms within the Multiple Objective Optimisation in Data and control path Synthesis (MOODS) High-level Synthesis Suite N #1 C1 #2 C2 N+1 C3 #2´ N+2 != Applying an on-line test resource insertion transform
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Implementation - Transforms within the Multiple Objective Optimisation in Data and control path Synthesis (MOODS) High-level Synthesis Suite N #1 C1 #2 C2 N+1 C1 #2´ != Optimising for area
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Implementation - Transforms within the Multiple Objective Optimisation in Data and control path Synthesis (MOODS) High-level Synthesis Suite N #1 C1 #2 C2 N+1 C3 #2´ N+2 != Applying an on-line test resource insertion transform
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Implementation - Transforms within the Multiple Objective Optimisation in Data and control path Synthesis (MOODS) High-level Synthesis Suite N C1 C2 C3 #1 #2 #2´ != Optimising for speed
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Implementation - Metric Overall cost function Cost=c 1 α 1 +c 2 α 2 +...+c n α n Enhancing the cost function to include on-line testability α n+1 =T on-line =σ 1 P 1 +σ 2 P 2 (1-P 1 )+σ 3 [log(L -1 )+σ 4 ] P 1 : % of on-line testable operations P 2 : % average idle time availability L : average error latency σ 1,σ 2,σ 3,σ 4 : constants
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Implementation - Algorithm Simulated annealing Choice between duplication and inversion based on clock period requirements Area- and / or delay-oriented heuristics …more on MOODS : reference [7]
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Experimental results 3-dimensional design space, on-line testability on the z-axis x-y plane : untestable designs design space exploration area (slices) delay (ns) testability % area (slices) delay (ns) testability % area (slices) delay (μs) testability % tsengdiffeq qrs z z z x x x y y y
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Experimental results The significance of design space exploration Optimisation SettingsResults Area (slices)Max Freq. CyclesTestability Area, delay146 48MHz 7 - Area, delay, testability165 (+13%) 4MHz 7 Inv (100%) Delay, testability172 (+17.8%) 38MHz 7 Dupl (100%) (tseng benchmark) optimum design depends on clock speed requirements the tool provides options the designer makes decisions!
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Experimental results Simulation transparent fault injection and simulation, at the RTL independent experiments, a single fault at a time random faults, random inputs Results (Tseng benchmark)
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Conclusion Integral, cost function-driven on-line test synthesis framework Properties and contributions: Versatility : hardware- or time-redundancy according to designer’s requirements Fully automatic insertion of self-checking resources Quantification of on-line testability Utilisation of the inversion testing idea
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