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On Timing- Independent False Path Identification Feng Yuan, Qiang Xu Cuhk Reliable Computing Lab, The Chinese University of Hong Kong ICCAD 2010
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Outline Introduction Preliminaries False Path Examination Method Experimental Results & Conclusion
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Outline Introduction Preliminaries False Path Examination Method Experimental Results & Conclusion
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Introduction False Path The test vector which cannot propagate in function mode. Used in STA of timing-driven placement. In manufacturing testing is unnecessary and may cause over-testing. Optimization does not help to improve the performance of the circuit.
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Introduction (cont.) Kinds of False Path Timing-don’t-care false paths Path in async. clock domain crossovers Timing-independent false paths Logically unsensitizable in function mode Delay-dependent false paths Logically sensitizable but dominated by one or more side-input signals all the time
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Outline Introduction Preliminaries False Path Examination Method Experimental Results & Conclusion
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Illegal State Identification Previous Work[12]
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False Path caused by Illegal State If a path is activated only with illegal states in the circuit, this path is a false path.
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Outline Introduction Preliminaries False Path Examination Method Experimental Results & Conclusion
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Controlling Signal 0 x 0 1 x x 1 x 1 0 x x
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Criterion A path is a timing-independent false path iff there exist at least one on-path signal such that when it is a non-controlling value, one or more of its corresponding side-input signals are with controlling values in function mode. Meet some illegal state?
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Criterion (cont.) A path is not a timing-independent false path iff there any on-path signal such that when it is a non-controlling value, one or more of its corresponding side-input signals are with non-controlling values in function mode.
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Path Sensitizaton Given a path P, to determine whether it is a timing-independent false path. Propagate logic ‘0’and ‘1’ at launch point.
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Proposed Examination Procedure Phantom logic AND gate Use AND gates and inverters to represent the illegal states. Set output of AND gates to be logic ‘0’
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Outline Introduction Preliminaries False Path Examination Method Experimental Results & Conclusion
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Find False Path The number of false paths is exponential to circuit size. Find the root cause structures Prime False path segment
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Static Implication Learning Consider illegal state: {FF0(1), FF2(1)} Conduct implication for the inverse values of FF0(0), FF2(0) independently FF0(0)=>B(0)=>G(0) FF2(0)=>A(0)=>C(1) =>D(0)=>F(1) Use counter-positive low
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Suspicious Node Extraction Suspicious Node Starting point of S-Frontier All the possible false segments can be detect. The selected points are as less as possible. Affect Node The nodes have implications after Static Implication Learning. Not all the affect nodes need to consider as the starting points.
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S-Frontier Propagation Do a BFS process to launch nodes with 0(1) Created at each suspicious node Launch 0(1) and propagate to new node Add the implication and check if meet the illegal state. Check the starting point is already in existing false path segment to avoid finding the same segment.
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Outline Introduction Preliminaries False Path Examination Method Experimental Results & Conclusion
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Experiment Results Benchmark ISCAS’89 IWLS 2005 Environment 2GHz PC 1GB memory Competitor [5] Fast Identification of Untestable Delay Faults Using Implications
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Experiment Results (cont.) Use PrimeTime to fetch 5000 critical paths Worse Case Delay(WCD) Report the true critical paths delay
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Experiment Results (cont.) Use academic ATPG tool Atalanta [7] Check whether we can find a solution to activate them.
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Conclusion Develop novel false path identification techniques by taking illegal states in the circuit into consideration. The proposed solution find much more false paths than existing FPI techniques.
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