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1 HFT Technology and Mechanical Design Wieman RNC LBNL TAC Review Wed. 11:30 – 12:05 15-Mar-2006
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2 Topics Requirements and features CMOS APS Detector Technology uAPS Introduction uBasis for Technology Choice uDevelopment history uEfficiency vs Accidentals based on electron beam measurements uR&D plan, a 4 ms chip followed by a 0.2 ms chip uDetector Verification in STAR Environment Mechanical Concept uMinimum mass ladders uSingle end support Stable reproducible spatial alignment Rapid insertion and removal uThin beam pipe system Conclude with summary of R&D issues
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3 Requirement Detect low momentum D’s in the environment of high multiplicity heavy ion collisions and high luminosity at RHIC in the most effective manner consistent with available resources
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4 Some HFT features Pointing resolution(13 12GeV/p c) m LayersLayer 1 at 1.5 cm radius Layer 2 at 5 cm radius Hit resolution8.7 m Position stability10 m Radiation thickness per layer X/X0 = 0.28% Beam pipe radiation thickness X/X0 = 0.14% Number of pixels98 M Raw data rate31 GBytes/sec Stored data rate after sparcification 90 MBytes/sec Integration time (affects pileup) R&D phase 4 ms Final detector 0.2 ms Rapid installation and replacement Reproducible positioning
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6 MIMOSTAR APS uses forward biased diode Pixel signal read every 4 ms Correlated double sample (CDS) – the difference between each sample Decay time is long compared to sample period ~100 ms
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7 Basis for CMOS APS Technology Choice Hybrid technology (silicon pixels bump bonded to ASIC readout) uAdvantages: Very fast, short integration time, no pileup Potential for trigger generation Rad hard Well established technology, ATLAS etc uDisadvantages: Too thick for optimum pointing accuracy required for low momentum D meson reconstruction Additional mass required for cooling Requires establishing complicated partnerships for production and testing (can’t just buy units)
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8 Basis for CMOS APS Technology Choice CCD technology uAdvantage: Successfully used in high precision vertex detector, VXD3 of SLD uDisadvantages: Limited radiation tolerance Sufficient readout speed pushes technology boundaries Limited industry access DEPFET technology uAdvantages: Excellent signal to noise Sophisticated thin ladder structures High speed Probably RAD hard uDisadvantages: Single foundry Highly specialized one of a kind technology No currently installed systems
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9 Basis for CMOS Technology Choice CMOS APS technology uAdvantages: Relatively RAD hard Available through multiple standard CMOS foundries Inexpensive commercial thinning Good success rate making working detectors by many institutions Excellent position resolution and fine granularity Partnered with the leading institution, IReS (now IPHC) in Strasburg Young technology, can expect considerable growth in capability uDisadvantages: Young technology for vertex detectors, currently no installed systems Limited signal to noise Current designs have relatively long integration times, i.e. potential pileup at highest luminosities
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10 Si Pixel Developments in Strasbourg Mimosa – 1 u4k array of 20 m pixels with thick epi layer Mimosa – 4 uIntroduce Forward Biased Diode Mimosa – 5 u1M array of pixels, 17 m pixels using AMS 0.6 process uUsed at LBNL for ladder development Mimosa – 8 uFast parallel column readout with internal data sparsification MimoSTAR – 1 128x128 pixels using TSMC 0.25 MimoSTAR – 2 128x128 pixels using AMS 0.35 –Duct tape these to the STAR Beam Pipe for 07 run MimoSTAR – 3320x640 pixels using AMS 0.35 MimoSTAR – 4 640x640 pixels production run Ultra – 1 Ultra – 2
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11 IReS MIMOSTAR chips MIMOSTAR1 (0.25 m TSMC) uReduced size prototype but sophisticated chip with complete functions for operation in a real detector system uEverything operating except pixel signal because of 0.25 m TSMC feature: Unexpected short signal decay time compared to theory and AMS experience. MIMOSTAR2(0.35 m AMS optical process) uTested in beam u700-800 e most probable for Min-I u10-12 e-rms, noise. uSignal decay time 100 ms
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12 MIMOSTAR2, features Parallel voltage out - for readout chip (abandoned) Serial current loop out – for off ladder ADC up to 80 MHz 128 X 128 u½ Standard forward bias design u½ Rad Hard forward bias design, reduced oxide Leakage Current 3-5 fA at room temperature, shot noise adds 4 e-rms for 4 ms integration (total noise 16 e-rms) Min-I cluster signal 700-800 e Successful radiation test, 20 Krad OK
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13 Ultimate (fast APS detector) - good for high luminosity at RHIC Submitted requirements list to IReS. In discussion Technology MIMOSA8 Ladder active area 2cm 20cm Pixel size 30 m 30 m ~Pixel mapping on the ladder 640 6400 Minimum operating distance from beam1.5 cm Power 100 mW/cm 2 Operating temperature 30 C Integration time[1][1] 0.2 ms Mean silicon thickness 100 m Readout time 1 ms Efficiency (min I)[2][2] 98% Accidental cluster density 50/cm 2 Binary readout, number of threshold bits[3][3] 2 Radiation tolerance [4][4] 124 kRad Number of conductors supporting the ladder (10 chips/ladder)[5][5] 140 Triggered readout, maximum trigger delay[6][6] 2 s
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14 Ultimate Chip 640X640 30 m pixels 200 sec integration time, a factor 20 improvement, will work at the highest luminosities Digital readout, 3 bit ADCs, i.e. CDS plus two threshold levels 4 parallel LVDS lines 1 ms readout and dead time Feasibility of this concept proven with MIMOSA8 uMultiple analogue storage on the pixel for reduced dead time? Not clear that this option is possible. 4ch LVDS 640
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15 Efficiency vs Accidentals A critical issue with thin APS CMOS detectors Can data sparcification be achieved without loss of efficiency? Following study shows that planned simple high speed algorithm will work
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16 Accidental vs Efficiency Test based on Measured charge spectrum APS measured signal spectrum in ALS electron beam agrees with Bichsel theory To find efficiency add large measured signals scaled to distribution to empty APS noise frames and apply filter algorithm Find accidental rate by using filter algorithm on empty noise frames noise contribution
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17 Test of two threshold algorithm Require > 98% efficiency # of accidentals uLimit set by outer layer background rate u< 5 hits/cm 2 Data shows stable region of good efficiency and low noise
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18 Event size and data rate, data reduction crucial Some numbers: Item number bits/address18 inner ladders6 outer ladders18 half chips per ladder20 ave hits/half chip, inner, L = 10 27 200 ave hits/half chip, outer, L = 10 27 40 Only the hit addresses generate significant data volume. The totals are: Item number Event Size90 kBytes Data Rate at 1 KHz event rate90 Mbytes/sec The HFT event size is significantly smaller than the TPC which has an event size of 2 MBytes for central Au+Au Raw data rate: 31 GBytes/sec Reduction 1/340,000
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19 R&D Plans, Scope change R&D phase for technology verification using MIMOSTAR2 (4 ms integration) technology uInstall n 4 ladder modules uVerify mechanical insertion technology and stability control uVerify DAQ and data reduction technology Final phase MIMOSTAR-Ultimate (200 s integration) uFull 24 ladder, 2 , installation uMultiple backup copies for rapid repair uThe full luminosity solution
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20 Main R&D effort this year Build two ladders with two MIMOSTAR2 chips each u( each chip 4 mm x 4 mm) Install chip to chip (for coincidence) at an intersection region, preferably STAR Operate with DAQ 1000 ALTERA/NIOS/SIU-RORC based system and STAR trigger interface Gain operating experience and obtain track density numbers at small radius
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21 Mechanical Mechanical support Beam pipe
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22 HFT Mechanical requirements Full self consistent spatial mapping prior to installation Installation and removal does not disturb mapping Rapid replacement 10 Micron stability (mapping of BarBar with visual coordinate machine)
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23 Conceptual mechanical design
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26 Kinematic mounts
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27 Beam pipe Meetings and discussions with Wolfram Fisher Dick Hseuh Robert Pak Dan Weiss Our beam radius OK for accelerator, but we are a limiting aperture Accelerator can live with 10 -5 (we expect 10 -9, but what can we live with?) PHENIX has adopted our 1.5 cm radius, 0.5mm wall. Preferred bake out 200-250 C to activate NEG coating
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28 Important R&D Issues - Electronics QuestionSolutionstatus Chip thinningThin and test (APTEK)Done with earlier chips, MIMOSTAR needs testing Off chip digitization and data sparcification ADC/FPGA/SRAM daughter board On going Analog signal pathbuffer/FLEXcable/Drivers/twis ted pair/ADC In design Latchup and recoverBNL SEU test facility/PS control Planning STAR particle background at small radius Measure with test laddersPlanning DAQ and Trigger interfacesBuild prototype ladders and readout In progress Full size chip and readout in STAR environment Part of 4 ms systemTo do Scaling chip design mm to cm and to production quantities (4 ms design) Prototype and Engineering runs with testing On going Scaling chip design mm to cm and to production quantities (0.2 ms design) Prototype and Engineering runs with testing On going
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29 Important R&D Issues - Mechanical QuestionSolutionstatus Maintain 10 micron stability and reproducibility Design Ladders and do vibration tests In progress Ladder thermal distortion tests In progress Design support arms and testTo do Design Kinematic couplers and test To do Design Transfer mechanics and test To do Design Metrology tools and test To do Measure and Analyze STAR thermal and vibrational environment Initial test done, more to do Maintain highly regulated temperature control Analyze and Design cooling systems To do Interface to ISTAnalyze and DesignTo do Small beam pipe issuesDesign and insertTo do
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30 Conclusion
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