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McGill Nanotools Microfabrication Processes
Matthieu Nannini Manager URL :: miam2.physics.mcgill.ca
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Outline Microfabrication Idea to device Conclusion Add material
Remove material Pattern material To the outside world Process flow example Idea to device Conclusion
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Add material: Thermal processes
Atmospheric Chemical Vapour Deposition Reaction between gases ans substrate at high temperature ( °C) Precise control of temperature High purity material Si + O2 SiO2 (dry SiO2) Si + H2O SiO2 (wet SiO2) McGill: Oxide thermal growth up to 1.5µm
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Add material CVD (Chemical Vapor Deposition)
Low Pressure Chemical Vapour Deposition Reaction between two gases at high temperature ( °C) Precise control of temperature High purity material 3 SiH2Cl2 + 4 NH3 → Si3N4 + 6 HCl + 6 H2 (silicon nitride) SiH4 → Si + 2H2 (polysilicon) McGill: Silicon Nitride LPCVD Amorphous and polycristalline silicon LPCVD
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Add material: Plasma Enhanced CVD (PECVD)
Plasma Enhanced Chemical Vapour Deposition Reaction between two °C and enhanced by plasma Allow oxide, nitride or oxynitride to be deposited on metals for insulation or passivation/ High deposition rate: ~1000 A/min McGill: Silicon Oxide Silicon Nitride Silicon Oxynitride (under dev.)
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Add material: PVD (Physical Vapor Deposition)
Evaporation Heat the target material until it melts and evaporates onto the sample Directional coating (shadow effect) Low to high etch rates Stack of material Materials available: Au, Ti, Cr, Pd, Al, Ni, Pt … sample
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Add material and pattern at once: lift-off
Resist coating sample sample UV patterning sample Metal evaporation development sample sample Resist dissolution
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Add material: PVD (Physical Vapor Deposition)
Sputtering Bombard the target with plasma discharge that extracts atoms from the target onto the sample Conformal coating Conductive and non conductive material Reactive sputtering with additional gas Stack of material Co-sputtering alloys Materials available: Au, Ti, Cr, Al, AlN, TiN, TiO2, ITO, Cu, Pd, W, Si, SiC… sample
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Outline Microfabrication Idea to device Conclusion Add material
Remove material Pattern material To the outside world Process flow example Idea to device Conclusion
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Remove material: Wet Etch
Chemical solution Usually Isotropic (can be anisotropic in crystals) Very selective: resist etch rate vs. material etch rate High etch rate Difficult to control precisely Resolution limitation Batch processing Masking material Etching
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Remove material: Dry Etch
Gas phase Sputter + chemical etch Anisotropic Less selective High resolution Excellent control Single wafer processing Gas McGill: Oxides/Nitrides: CF4, CHF3, O2, Ar Silicon: HBr, Cl2, Ar Metals: HBr, Cl2, Ar, N2, NF3
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Remove silicon: Deep Reactive Ion Etching
DRIE We need 2 gases, one for etching and another one to deposit a protective polymer. We need to alternate etching and deposition then we pulse the gas injection We need energetic ions to remove the polymer on the feature bottom to allow Si etching during SF6 cycle. McGill: Tegal SDE 110
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Outline Microfabrication Idea to device Conclusion Add material
Remove material Pattern material To the outside world Process flow example Idea to device Conclusion
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Pattern material: Photolithography
UV exposition through mask Resolution (~800nm): Wavelength (432nm) mask-substrate distance resist thickness To consider Large exposed area (150mm) Parallel Fast Limited resolution
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Pattern material: Mask design
Designing your mask Knowing what kind of shapes you need How many mask level ? Alignment needed ?
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Pattern material: Electrolithography
E-beam expose develop Electron beam direct exposition Principle: electron sensitive polymer Direct beam writing Resolution: 30nm E-beam quality (focus, stigmatism, alignment…) Stability of stage Thickness of polymer To consider Limited writing areas Serial writing slow
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Outline Microfabrication Idea to device Conclusion Add material
Remove material Pattern material To the outside world Process flow example Idea to device Conclusion
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To the outside world: Dicing
Precision diamond saw to cut out wafer in small dies Blade thicknesses from 100 to 250µm Accurate alignment (~ 50µm)
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To the outside world: wire bonding
WireBonder Connect microelectrodes to the outside world
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Process flow example Beware of Powerpoint engineering !! cleaning
SiN backside etch SiN deposition Top side protection Resist patterning Backside bulk etch SiN Dry etch Remove protection Backside resist patterning with alignment Beware of Powerpoint engineering !!
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