1. Usability of Published SEE Data Munir Shoga The Radiation Group, Inc. 8/30/07

2. Bibliography of Author Graduated from Rutgers Univ and hold MS & Ph.D degs. in Elec. Engg (solid state devices) I was the SEU guy at Hughes / Boeing for ~ 20 years From part to system level, I assessed all space programs at Hughes/Boeing for 18 years ( > 50 programs) Have over 40 publications & presentations in SEE and other semiconductor devices Tested or supported over 2000 hours of beam time SEE testing parts and, some more, doing FXR & TID testing Holds four patents and two pending Two Boeing awards for technical excellence

3. Where can I find Test Data? Own data on C:\, D:\, flash memory cards, CDs, on one of laptops / PCs, in the office or at work, or on somebody else’s PC, etc. In various conference and none conference journals and proceedings Various internet websites and databases

4. Doing Your Job You may have –To do unit analysis of some 20 parts or many units on a system –You may have to design space hardware –Planning for a SEE test –You may need to perform rate prediction –May not have sufficient budget –Program schedule does not allow a test

5. How to get data? Search all PC hardware E-mail or call colleagues at work or in other companies Search all available journals and proceedings Search the internet (vendors and other available databases), etc. Do own testing

6. Can I use published data? Bias, temperature, frequency, or operating conditions are different than the published test data The test data is old? Did the part process / design change? Is there a vendor or fab location change? Is there sufficient data?

7. How useful is the Data? Will the data answer my questions: –Upset (SEU) characteristics –Transient (SET) characteristics –Latchup, burnout, gate rupture, SEFI, stuck bit, etc. Do I need to do more testing?

8. When to use published data? For critical applications you MUST test to your operational bias conditions, orbital conditions, and program requirements - You may use published data when writing your test plan For Non-Critical applications you may: –Use the data –Use transient (SET) characteristics in your design If you do not have budget to test If schedule does not allow for a test You may use the data but with a good engineering judgment

9. Introducing Single Event Effects Database Software Tow versions are available now for MS Windows: –SEE PRO 2007 for desktop –SEE NET PRO, a Client – Server (for the enterprise)

12. SEE PRO & SEE NET PRO Contains all published data, 1983 - 2007 Presented in a powerful & easy to search software interface Two versions: desktop and Client – Server for the Enterprise Updates every 6-months

13. SEE PRO cont’d It contains 24 years of test data (heavy ion, proton, and neutron) It has either a data set of cross sections vs. LET/Energy or just the LET Threshold and saturated cross section Data collected from conference proceedings, journals, and various Internet web sites Within minutes you can get useful part’s data

14. SEE PRO cont’d Enterprise access to the data Has e-mail address of most testers and hence one can e-mail the tester for a report or row data Any one with credentials can add data, reports, etc Very important: for companies with many individuals conducting tests and have lots of data, this is one place for every one to save their data and reports If some one leaves the company you know that all his test data and reports are in SEE PRO

15. Who is it for? For aerospace and avionic companies' survivability and design engineers Manufacturers building units and boards for space an avionics For consultants supporting space systems For component manufacturers to find out their parts SEE performance and their competition’s For researchers to investigate trends in technology, function, operational characteristics, etc.

16. Conclusion SEE PRO / SEE NET PRO –Reduce cost of searching SEE test data –Helps in planning new SEE testing –Helps design engineers in their part’s selection –A place to organize all your SEE test data and reports –Updates will be made every 6-months

17. Future Database Complete suite of radiation effects. It will contain: –TID data –Displacement damage –FXR data –Material database

18. Contact Information Munir Shoga The Radiation Group, Inc. 30251 Golden Lantern # 413 Laguna Niguel, CA 92677 Phone: (562) 858-0942 Fax: (949) 215-1620 E-Mail: munir@SEUdata.communir@SEUdata.com www.SEUdata.com