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SPS Beam Position Monitors: MOPOS Front-End Electronics Jose Luis Gonzalez BE/BI 22/11/2013.

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Presentation on theme: "SPS Beam Position Monitors: MOPOS Front-End Electronics Jose Luis Gonzalez BE/BI 22/11/2013."— Presentation transcript:

1 SPS Beam Position Monitors: MOPOS Front-End Electronics Jose Luis Gonzalez BE/BI 22/11/2013

2 Outline SPS Multi Orbit POsition System (MOPOS) System overview Front-End Architecture Rad-tol requirements, design and status Possible impact and mitigation Long-term radiation test planning and strategy BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/20132

3 BA2 BA3 BA4 ECA4 BA5 ECA5 BA6 BA7 BA1 TT40 TT41 (CNGS) TI8 (LHC) TI2 (LHC) TT20 (SPS NA) TT66 (HiRadMat) TT60 TT10 (PS) SPS Multi Orbit POsition System (MOPOS) MOPOS Front-End 216 BPMs in the tunnel Exposed up to 100 Gy/y Optical transmission MOPOS Read-Out In surface buildings (BA1...6) BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/20133

4 MOPOS: Simplified Block Diagram BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/20134 LogAmps Serial ADC 10MHz Serial ADC 10MHz Pickup U D R L x y FPGA Optical Link @ 2.4 Gb/s FPGA Digital Board Read-Out Board Timing Distribution VME Interface SPS Tunnel Front-End CHASSIS Software Radio Frequency Analogue Board

5 Front-End Architecture BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/20135

6 Analogue Board Log-Amps AD8302 ADL5519 MAX2016 ADC Drivers ADA4932-2 THS4521 Voltage regulators LT1963AEQ TL1963-KTT LP3875-ADJ TPS7A4501-KTT BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/20136

7 PSI Irradiation Facilities (PIF) BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/20137  Energy: 230 MeV  Flux: 1.6 10 8 p/cm 2 s  Fluence: 1.874 10 12 p/cm 2  Current: 4.7 nA  Collimator: 58 mm (Si)  Dose/run: 1 kGy - 10 5 rad/3.5 h

8 PSI: Analogue Test Setup BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/20138

9 LogAmp ADL5519 & ADC-Drivers BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/20139

10 Analogue Components LogAmps AD8302: Analog Devices, Dual Log Amps ADL5519: Analog Devices, Dual Log Detector MAX2016: Maxim, Dual Log Detector ADC Drivers ADA4932: Analog Devices, Differential ADC driver THS4521: Texas Inst., Differential ADC driver These components have been qualified at PSI (TID 1kGy) BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/201310

11 Voltage Regulators BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/201311

12 Analogue Components Low Dropout Regulators LT1963A: Linear Tech., LDO Regulator (1/3 bad) LP3875: National Semi., LDO Regulator (3/3 bad) TL1963A: Texas Inst., LDO Regulator TPS7A4501: Texas Inst., LDO Regulator These components have been qualified at PSI (TID 1kGy) BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/201312

13 Optical Transceivers Test Board Commercial SFP Modules Double-fiber SFP FTTX Technology: FT3A05D Single-fiber, bidirectional Ligent: LTE5350-BC and LTE3550-BC Lightron: WSP24-313LC-I5A and WSP24-513LC-I3A Source Photonics: SPL-35-GB-CDFM and SPL-53-GB-CDFM Yamasaki: 541315L-15B and 541315L-15Y BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/201313

14 PSI Test Setup Energy: 230 MeV; Current: 2nA (~3.5 rad/s) or 3 nA (~6 rad/s) ; Collimator: 58 mm (Si) TID goal: 1 kGy - 10 5 rad/component Measurements every second: Communication rate: 1.25 Gb/s 32-bit word sent from the controller board (FPGA, Spartan6) Electrical loopback on the SFP Board Cross-check between sent and received 32-bit word 2 SFP modules tested in parallel For each channel, 3 counters are enabled: single bit errors, multiple bit errors, total errors BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/201314

15 Measurements – Best SFP Parts BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/201315

16 SFP Test Results Summary Ligent and Yamasaki components are very sensitive to the radiation level @ PIF Source-Photonics components are more resistant but with many error bursts FTTX and Lightron components behave much better but still generate many error bursts  For the MOPOS Front-End: decision to use the Versatile Transceiver (VTRx) developed at CERN TESTS to be done with long transmission fibres (up to 1.5 km) BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/201316

17 CERN VTRx Radiation Specs Versatile Link Technical Specification, rev. 2 [J. Troska et al.] BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/201317 Tolerance Level Dose and fluence (20 Mev neutron equivalent) Calorimeter 10 kGy 5 x 10 14 n/cm 2 Tracker 500 kGy 6 x 10 15 n/cm 2

18 Short-Term Strategy Current Front-End Digital PCB (vers. 1) Analog Devices Octal 14-bit ADC: AD9252 Xilinx Spartan6 FPGA (Triplication, Hamming Code Correction…) CERN VTRX Optical Transceiver Will allow the first functional tests of the MOPOS system in 2014 (both hardware and software) BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/201318

19 Long-Term Strategy: Radiation Tests for ADC & Digital Parts Beam Tests Conditions: equivalent to PSI Test Beams (230 MeV; TID: 1 kGy) In our section there is no manpower available in 2014 BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/201319

20 Analogue/Digital Converters 40…65Msps – LVDS Serial ADC AD9252: Analog Devices Octal 14-bit AD9259: Analog Devices Quad 14-bit LTM9009: Linear Tech. Octal 14-bit LTC2171: Linear Tech. Quad 14-bit ADS5294: Texas Inst. Octal 14-bit ADS6442: Texas Inst. Quad 14-bit BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/201320

21 ADC Radiation Tests (H. Takai/BNL) BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/201321 TWEPP2013

22 Digital Components Low Voltage and LVDS Buffers 74VCX162244: Fairchild 16-bit Buffer/Line Driver 74ALVCH162244: Texas 16-bit Buffer/Line Driver 74VMEH22501: Texas 8-bit Bus Transceiver FIN1108: Fairchild 8-port LVDS Repeater BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/201322

23 Digital Components: FPGA SERDES integrated – SRAM technology Xilinx SPARTAN6 (currently used) Test of the first board prototype: SPS – 2014 Altera Stratix V Cycling Redundancy Check of FPGA configuration Possibility to get the corresponding ASIC External SERDES  FPGA + GBT project SRAM – if failures are mostly related to SERDES Antifuse – Microsemi Axcelerator AX2000 Flash RAM – for SRAM configuration M25P128 – Numonyx BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/201323

24 THANK YOU FOR YOUR ATTENTION! BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/201324

25 Spare Slides: PSI Radiation Tests BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/201325

26 PSI: SFP Radiation Setup BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/201326

27 SFP Tests: FTTX FT3A05D BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/201327

28 SFP Tests: Lightron I3A BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/201328


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