1. Surface Plasmons devices and leakage radiation microscopy
A.Drezet
(ISIS- Univ. Louis Pasteur, Strasbourg, France)
A. Hohenau, D. Koller, F. R. Aussenegg, J.R Krenn
Nano - Optics Group ● Institute of Physics ● Univ. Graz, Austria
nanooptics.uni-graz.at
Marseille ,

2. e e Surface Plasmon polaritons (SPPs) at a single interface z SPP
Dielectric(Air,SiO2)
E,B e
Metal (Au,Ag) e Hy
Raether, Surface Plasmons (Springer, Berlin, 1988).
Genet and Ebbesen, Nature 445, 39 (2007).
Drezet et al., Micron 38, 427 (2007).

3. SPP dispersion relation on a 70 nm thick gold film
Total
Internal
reflection
Au/glass
Au/air
KSPP
Johnson and Christy, PRB 6, 4370 (1972).

4. SPP dispersion relation on a 70 nm thick gold film
Au/glass
Au/air

5. e e Leakage Radiation (LR) SPP modes metal glass z SPP air Air side LR
Glass side LR
Hecht et al., PRL 77 ,1889 (1986).
A. Bouhelier et al., PRB 63, (2001).

6. Leakage Radiation cone
LR cone
SPP
LR cone
Rough Ag surface
H. J Simon, J. K. Guha, Opt. Comm. 18, 391 (1976).

7. SPP SPP Au IO O2 LR LR Lens CCD
NSOM (near field scanning optical microscope)
SPP
SPP Au
Polar. IO O2 LR LR
Lens
15 µm
CCD

8. Addressing a nanoobject with SPP
NSOM
4.2 K
l=514 nm
SPP
R= distance hole-tip (nm)
Quantum dots
(CdTe/ZnTe)
Brun et al., Europhys. Lett. 64 , 634 (2003)

9. Leakage Radiation Microscopy (LRM)
laser
LRM on 50 nm Au film O1
SPP
SPP Au
l=800 nm IO O2 LR LR
Lens
CCD
Stepanov et al., Optics Letters 30, 1524 (2005).
Hohenau et al., Optics Letters 30 ,893 (2005).

10. SPP 2D Bragg reflectors Bragg condition:
Drezet et al., Europhys.Lett. 74, 693 (2006)

11. SPP interferometer
2D dipole model
V=1, R= 0.95

12. LRM: Imaging the direct and the Fourier space
Drezet et al., APL 89, (2006).

13. (A) A) SPP dispersion in the direct space T 20 µm R L
Bragg mirror (out of resonance)
Bragg condition:
(A) T
20 µm R L

14. (B) SPP decay in the direct space Intensity (arbitrary units) 10 µm20 30 40 1
(B)
10 µm
Intensity (arbitrary units)
0.5
x (µm)

15. (A) B) SPP dispersion in the Fourier space Intensity (arbitrary units)1
LRM (Fourier) L
(A)
Intensity (arbitrary units)
0.5
7.8
8.0
8.2
k (1/µm)
Drezet et al., Appl.Phys.Lett. 89, (2006).

16. C) SPP Fourier optics
(a)
(A) L R
20 µm T
(C)
(D)
(B) T C L R

17. SPP in plane elliptical cavity
Reflectance %
Interferences
Appl.Phys.Lett. 86, (2005)

18. SPP in plane interferometryD1 D2
Bragg
mirror
SEM
Intensity (a. u.)
ridge
LRM
Phase difference
15 µm
Ditlbacher et al.,APL. 81, 1762 (2002).
Drezet et al., Plasmonics (2006).
Phase difference

19. SPP in plane demultiplexer-plasmonic crystal
LRM
Plasmonic crystal
l=750 nm 3
SPP Au a e1 e2
550 nm b
l=800 nm
30 µm
Drezet et al., Nanolett. (pub. on line15 mai 2007).

20. SPP in plane Tritter = beam splitter 3 inputs-3outputs
LRM (direct) (Fourier) e2 e1 d
500nm
15 µm
(Ewald sphere)

21. SPP in plane reflection microscope (M=3)
theory
SPP
2 µm
LRM
400 nm
Drezet et al. Submitted to Optics letters (2007).

22. 6 µm
2 µm
3 µm
Intensity (arb.units)
1 µm
1.4 µm
500 nm
10 µm
X (µm)

23. Summary
LRM is a straightforward and reliable technique
for probing SPP fields in direct and Fourier space.
LRM allows precise quantitative analysis of SPP
propagations.
Fast method: alternative to PSTM, NSOM, NFO