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Www.qmaxtest.com BS Test & Measurement Technique for Modern Semi-con devices & PCBAs.

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Presentation on theme: "Www.qmaxtest.com BS Test & Measurement Technique for Modern Semi-con devices & PCBAs."— Presentation transcript:

1 www.qmaxtest.com BS Test & Measurement Technique for Modern Semi-con devices & PCBAs

2 www.qmaxtest.com QMAX a market leader in ATE for PCBA and Semiconductor industry. 9/15/2015 © Qmax Test Technologies Pvt Ltd., 1997-2008 2

3 www.qmaxtest.com QMAX Key Customer Segments DEFENCE AEROSPACE RAILWAYS R&D LABS INDUSTRIAL AUTOMATION SEMI-CON TELECOM AUTOMOBILE BIO-MEDICAL EDUCATION 9/15/2015 © Qmax Test Technologies Pvt Ltd., 1997-2010 3

4 www.qmaxtest.com Evolution of IC Packaging 9/15/20154 DIPSOICSOJ PGA QFPPLCC

5 www.qmaxtest.com 9/15/20155 QFN BGA Evolution of IC Packaging-Cont...

6 www.qmaxtest.com 9/15/20156 Leading to->Evolution in PCBA Only DIP Package Surface Mount SOIC,PLCC packages SOIC and BGAs Majority BGA Pkg

7 www.qmaxtest.com Evolution summary Silicon Technology growth lead to miniaturization of device packaging, leading to …. 9/15/2015 © Qmax Test Technologies Pvt Ltd., 1997-2008 7 Surface mount packaging styles, leading to …. Double Sided and Multilayered PCBs, leading to …. Reduced or almost no access to test pins or pads

8 www.qmaxtest.com 9/15/20158 The Problem ? How to test for manufacturing defects in Mass Production Hardware Design Houses PCBA Repair and Recovery Industry

9 www.qmaxtest.com 9/15/2015 © Qmax Test Technologies Pvt Ltd., 1997-2008 9 The Solution IEEE Std 1149.1 - JTAG Boundary Scan Standard This allows pin level access to BS compliant devices independent of the packaging technology via a 4 wire serial interface.

10 www.qmaxtest.com Boundary Scan Chip Architecture 9/15/201510 TDITMS TCLK TRST*TDO SCAN CELLS JTAG TAP Interface Signals

11 www.qmaxtest.com 9/15/201511 Using the Boundary Scan Path TDI TCK TMS TDO PCB

12 www.qmaxtest.com Boundary Scan with Multiple Chips 9/15/2015 © Qmax Test Technologies Pvt Ltd., 1997-2008 12

13 www.qmaxtest.com JTAG-4 wire serial communication 9/15/2015 © Qmax Test Technologies Pvt Ltd., 1997-2008 13

14 www.qmaxtest.com Boundary Scan Tests 9/15/2015 © Qmax Test Technologies Pvt Ltd., 1997-2008 14 Scan Chain Test Interconnect Test Non-BS Devices Functional Test Memory Interconnect Test Cluster Testing Core Logic Test ( BIST)

15 www.qmaxtest.com 9/15/2015 © Qmax Test Technologies Pvt Ltd., 1997-2008 15 Boundary Scan Tests-Cont… Digital I/o Via Edge Connector enhance test coverage Same IEEE 1149.1 BS Test Port can be used for In-System Programming of CPLDs, FPGA & Flash Memory following the IEEE 1532 Standard.

16 www.qmaxtest.com IEEE Std 1532 Concept 9/15/201516

17 www.qmaxtest.com Benefits of IEEE1532 Allows configuring, programming, read back, verify, erase of programmable devices after it has been assembled on the PCB. Allows concurrent programming which improve significantly the time it cost to program a board with several programming devices. Eliminate the need to have multiple vendor programming tools to program their respective devices. 9/15/2015 © Qmax Test Technologies Pvt Ltd., 1997-2008 17

18 www.qmaxtest.com Qmax Products- Engineering Labs & Academy 9/15/2015 © Qmax Test Technologies Pvt Ltd., 1997-2008 18 QMAX - QSCAN-QT900

19 www.qmaxtest.com QT900-Boundary Scan Test System 9/15/2015 © Qmax Test Technologies Pvt Ltd., 1997-2008 19

20 www.qmaxtest.com QT900 Testing BGA based PCB 9/15/2015 © Qmax Test Technologies Pvt Ltd., 1997-2008 20

21 www.qmaxtest.com 9/15/2015 © Qmax Test Technologies Pvt Ltd., 1997-2008 21 QT-PXI-95 Controller and Digital Card

22 www.qmaxtest.com 9/15/201522 9/15/201522 QST4416-FC Linear & Mixed signal Test system

23 www.qmaxtest.com 9/15/2015 © Qmax Test Technologies Pvt Ltd., 1997-2010 23 QST4416-FC Tester Contents Standard PC with PCI or PCIe interface Calibration Kit – Keithley 2100 USB Power Supply Modules ± 54V Analog ± 15V_Analog ± 5V_Analog +5V_ Digital + 3.3V_Digital QST4416FC Test system – 6U, 9 slots cabinet with freely configurable Analog and Digital Instrumentations Handler Interface Manipulator – Optional ( 3 models) GPIB interface - Optional Testing utility – QST Comprehensive System software Application specific Load boards

24 www.qmaxtest.com 9/15/2015 © Qmax Test Technologies Pvt Ltd., 1997-2010 24

25 www.qmaxtest.com Qmax Product Package A Complete package with Tutorial and practical sessions from What is Boundary Scan ? To How its used to test latest Digital IC, In-Circuit and Out Circuit mode. ( Covering both the IEEE 1149.1 and IEEE 1532 Standards) 9/15/2015 © Qmax Test Technologies Pvt Ltd., 1997-2008 25

26 www.qmaxtest.com Get to know the depth of Semiconductor IC Testing, out-circuit & In- circuit. The right way to test a Populated PCB, Simple to complex Aware of the various ATEs’ and the System requirements for Board level and component level testing. Various Techniques & Technologies involved to test and troubleshoot simple to complicated ICs on board. Art of parametric Testing. Challenges faced in today’s Testing & the need of Design for Testability( board level & component level ), its limitations. Introduction to PCB Design and how it plays major role in PCBA Industry. What do I learn from Test Engineering Course ?

27 www.qmaxtest.com Product Application Development Engineer PCBA Industry (Design & Development, Repair, QA ) ATE Hardware Design Engineer Hardware Test Engineer Hardware Test Development Engineer PCB Layout & Design Engineer Any possible Career Opportunities?

28 www.qmaxtest.com Time for QUESTIONS 9/15/2015 © Qmax Test Technologies Pvt Ltd., 1997-2008 28

29 www.qmaxtest.com From Rajiv VK DGM-Technology Development Qmax Test Equipments Pvt., Ltd., You can visit us at www.qmaxtest.com

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