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Nanocharacterization
나노구조의 특성 SPM의 원리 및 응용 전자분광학의 원리 및 응용
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1. 나노구조의 특성 Quantum confinement Quantum size effect
Energy bands and electronic transition Charge quantization Thermodynamic properties
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Nanostructures
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Comparison: Microstructure vs. Nanostructure
Microstructure Nanostructure Physics Semi-classical Quantum mechanical Electron Particle–like Wave-like nature E or k-space Continuous Discrete Current Continuous Quantized Decision Deterministic Probabilistic Fabrication Micro-fabrication Nano-fabrication Surface area/ Small Very large volume Packing Low Very high
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What is new phenomena ? Length Scale: 10-9~10-7 M (1~100 nm)
Quantum size confinement Wave-like transport Dominant interfacial phenomena Electrical, optical, thermal, magnetic, chemical, mechanical, and biological properties ??
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Electron Nature in Smaller Sizes
Energy quantization d ~ Fermi wave length of electron in a metal (lF) or exciton diameter in a semionductor Charge quantization Charging energy (Ec) >> Thermal energy (kT) Ballistic d<mean free path (l) Free electron case: see Kittel Y = exp(ikr), k =2pn/L E= h2k2/2m N = 2x (4pkF3/3)/(2p/L)3 = VkF3/3p2 Let electron concentration N = N/V EF= (h2/2m) kF2 = (h2/2m) (3p2 N) 2/3 kF = (3p2 N)1/3 lF= 2p/kF= 2p (3p2 N)-1/3
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Exciton : e-h pair bounded by attractive electrostatic interaction
H atom-like state E E Conduction band Exciton levels Eg Exciton binding energy: Eex Eg-Eex n =2 n=1 Eg Valence band Binding energy: Eex =me4/2eh2n2 Bohr (exciton) radius: r = n2eh2/me2; 1/m=1/me +1/mh Si Ge GaAs CdSe KCl Eex (meV) r (nm)
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Quantum Confinement Exciton r radius
Energy for the lowest excited state relative to Egap E(R) = h2p2/2mR2 – 1.8e2/2eR … dot R Particle in a box problem R<< r: Strong Confinement - 1st term (localization) dominant - Electron and hole are quantized - Energy gap ~1/R2 eg) Si<4.3 nm, Ge<11.5 nm, GaAs<12.4 R>> r: Weak confinement - 2nd term (coulomb attraction) dominant - Exciton confinement character L.E. Brus, J. Chem. Phys. 80, 4403(1984)
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Density of State: # of states per unit energy range
1D D D DOS DOS DOS N = 2n/L N =2pn2/L2 N =8pn3/3L3 dN /dE ~ E-1/2 dN /dE = const dN /dE ~ E 1/2 k=2pn/L E = hk2/2m k =(2mE)-1/2/h N = 2xn/L= k/p = (1/ph)(2mE) 1/2 dN /dE = ((2m)1/2/2ph)(E)-1/2
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Size Effect: Energy Levels and DOS
Semiconductor Bulk Nano atom particle 3d d d d CB VB LUMO HOMO DOS Band gap EF Energy Size controlled band gap tuning Discrete Energy levels A.P. Alivisatos, Science 271, 933 (1996)
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Size Effect:1D-Quantum well states
F.J. Himpsel et al, Adv. Phys. 47, 511 (1998)
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Size Effect: Optical Spectra
Shift to higher energy in smaller size Discrete structure of spectra Increased absorption intensity A.P.Alivisatos, J. Phys. Chem. 100, (1996)
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Size effect: Tunable Band Gap
Bulk Si = 1.14 eV GaAs =1.5 eV Optical excitation is significantly enhanced, both, in frequency and intensity, in smaller sizes. S. Ogut et al, Phys. Rev. Lett. 79, 1770 (1997)
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Energy Bands
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Energy Band Structure: Energy vs. k
Y = Cnfn V = Cn V n (h2/2m)2Y + V Y = E Y Ej= a +2b cos 2pj/N index j = 0, 1, 2 … Define a new index k = 2pj/Na: wave vector E(k) = a +2b coska, Yk = eiknafn : Bloch wave function (symmetry adapted LCAO) a 2 1 E …. …. a -2b …. = 2 p/k = 2a = ∞ a a +2b …. p/a k=0 p/a
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Electronic Transition
Electric Transition dipole moment mif = <ff |er| fi> Direct transition (Dk=0) In phase Added transition dipole Electronically allowed transition E ff mif fi ff Indirect transition (Dk ≠ 0) Out of phase Cancelled transition dipole Electronically forbidden but vibronically allowed mif fi p/a k=0 p/a Band width: overap of wave functions Slope dE/hdk = hk/m = vg: group velocity of electron
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Absorption spectra: Direct and Indirect Transition
Electronic absorption spectra for three sizes of CdSe nanocrystals, in the wurtzite (direct) and rock salt (indirect) structures. In each instance the direct gap spectrum is structured and intense, while the indirect gap one is featureless and relatively weaker. The relative absorption efficiencies do not change, despite the concentration of oscillator strength due to quantum confinement.
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Fermi Golden rule Transition rate
W = ∫(2p/h 2) | mif |2d(Ef -Ei hv) r(Efk) r(Eik)dE mif : Transition dipole moment r(Efk); r(Eik): density of states of final and initial states mif = <ff |er| fi>< ff,vib | fi,vib ><eikfna | eikina> Phase factor or envelope function Electric dipole Transition moment Frank-Condon factor
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Size Effect: Enhanced Absorption
For quantum dot, Energy levels: discrete DOS: delta function N(E) E k E DxDp ~ h x: well defined p=hk: Not well-defined k is not an exact quantum number for QD Envelope functions sample larger k-space Overlap of wave functions - Increased absorption intensity M.S. Hybersten, Phys. Rev. Lett. 72, 1514 (1994)
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Photon absorption: Direct vs. Indirect Transition
phonon q Eg hv k Selection rule k’ = k (Dk = 0) k’ = k + q (Dk ≠ 0) Energy relationship hv = Eg hv = Eg + hv(q) Interaction electronic: two body vibronic: three body Transition rate fast ~ sec slow ~ 10-2 sec Radiative efficiency high low Example GaAs (Eg (dir.) =1.4 eV) Si (Eg (ind.) = 1.1 eV) (Eg (dir.) = 3.37 eV)
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Size Effect: Radiative Transition Rate
Radiative transition rate (1/t) increases with smaller sizes. For the size >2nm, phonon assisted transitions dominate, while zero-phonon transitions allowed for smaller sizes 1.5 nm Si dots: quasi direct transition
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Approaches for Light Emission from Si
Quantum confinement Zone folding: quasi-direct gap Er doped Si Direct gap formation by alloying
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Property:Polarized PL from Nanowire InP
J. Wang et al, Science 293, 1455 (2001) Polarization ratio: r= (I⊥- I∥)/(I⊥+ I∥) = 0.96 Large dielectric contrast between nanowires and surrounding Polarization sensitive Nanoscale photodetector
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Charge Quantization e e d Charging energy: Ec = e2/2C >> kT
3 2 1 e e N=0 d Charging energy: Ec = e2/2C >> kT At T =300K kT = 26 meV C<< 3.1x10-19 F C = 4pe d 4pe = 1.1x10-10 J -1 C2m-1 For charge quantization, the diameter of dot (d) must be << 28 nm
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Tunneling Spectroscopy of InAs QD
STM T=4.2K Optical d = 32A S-like P-like U. Banin et al, Nature, 400, 926 (2000) Ec=0.11 eV: single electron charging energy Eg=1.02 eV: nanocrystal band gap
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Property: Crystallization of Opals from Polydisperse Nanoparticles
Driving force for size selective crystallization and phase separation is the size dependence of the dispersional interactions. Dispersional interactions are strong enough to dominate over entropic effects, but weak enough to allow the nanocrystals to anneal into low energy, equilibrium configuaration. Ohara et al, Phys. Rev. Lett. 75, 3466 (1995)
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Property: Melting Temperature of Nanocrystal
A.P.Alivisatos, J. Phys. Chem. 100, (1996)
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Property: Thermodynamic Behaviors of Metal Clusters
As the cluster size decreases, the melting temperature (Tm) monotonically decreases, However, when the cluster size is small enough, Tm does not vary monotonically with cluster size. The absence of a premelting peak in heat capacity curves for some clusers. Premelting: surface melting, partial melting, orientational melting, and isomerization Y.J. Lee et al, J. Comp. Chem 21, 380 (2000), Phys. Rev. Lett. 86, 999 (2001)
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2. SPM의 원리 및 응용 References:
1. Nanotechnology Research Directions: IWGN report (1999): 2. Scanning Tunneling Microscopy and related methods edited by R.J. Behm, N. Garcia, and H. Rohrer (1990) 3. R.J. Hamers, Scanning Probe Microscopy in Chemistry, J. Phys. Chem.100, (1996) 4. G.S. McCarty and P.S.Weiss, Scanning Probe Studies of Single Nanostructures, Chem. Rev. 99, 1983 (1999) 5. PSIA, 6. ThermoMicroscope, 7. Digital Instrument, 8. H.-Y. Nie, publish.uwo.ca/~hnie/mmo/all.html IWGN: Interagency working group on nanoscience , engineering, technology
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강의 내용 나노시스템의 특성 개요 기존 현미경과 SPM의 분해능 비교 STM/STS의 원리 및 응용 AFM의 원리 및 응용
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Scientific Issues in Nanoscience
(Nanotech.Res. Directions: IWGN report,1999) Fundamental properties of isolated nanostructures Fundamental properties of ensemble of isolated nanostructures Assemblies of nanoscale building blocks Evaluation of concepts for devices and systems Nanomanufacturing Connecting nanoscience and biology Molecular electronics Local probes with nm spatial resolution for characterization
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Tools for Characterization
Structural analysis: SEM, TEM, XRD, SAM, SPM, PEEM, LEEM, STXM, SXPEM Chemical analysis: AES, XPS, TPD, SIMS, EDX, SPM Electronic, optical analysis: UV/VIS, UPS, SPM Magnetic analysis: SQUID, SMOKE, SEMPA, SPM Vibrational analysis: IR, HREELS, Raman, SPM Local physico-chemical probe: SPM e, hv, ion tip e, hv, ion
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현미경들의 분해능 비교 106 SEM OM Vertical scale TEM 104 102 STM (A) 1
Lateral scale (A)
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Characteristics of Microscopies
OM SEM/TEM SPM Operation air,liquid vacuum air,liquid,UHV Depth of field small large medium Lateral resolution mm nm:SEM nm: AFM 0.1nm:TEM nm: STM Vertical resolution N/A N/A nm: AFM 0.01nm: STM Magnification X-2x103X X-106X x102X- 108X Sample not completely un-chargeable surface height transparent vacuum <10 mm compatible thin film: TEM Contrast absorption scattering tunneling reflection diffraction
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분해능의 한계 HM (High Resolution Optical Microscope)
diffraction limit ~ 150 nm PCM (Phase Contrast Microscope) subwave length 배율 가능 X-ray Microscope l ~1A; Synchrotron radiation and X-ray optics SEM (Scanning Electron Microscopy) Focused e-beam size > 3nm TEM (Transmission Electron Microscopy) ~1 A; 얇은 박막시료 LEEM (Low Electron Emission Microscopy) low energy e-beam; 20nm PEEM (Photoemission electron Microscopy) lateral resolution~100nm; chemical analysis FIM (Field Ion Microscopy) tip 형태 시료
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Interaction of Electrons with Sample
When 20 KV e-beam is used for Ni(Z=28). Auger electron :10-30A Secondary electron: 100A Backscattering electron : 1-2 mm X-ray ~ 5 mm Penetrated electron: 5 mm Atomic Number Accelerating voltage Incidence angle Interaction Volume
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Principle: Scanning Electron Microscopy (SEM)
Beam size: a few – 30 A Beam Voltage: 20-40kV Resolution: A Magnification: 20x-650,000x Imaging radiations: Secondary electrons, backscattering electrons Topographic contrast: Inclination effect, shadowing, edge contrast, Composition contrast: backscattering yield ~ bulk composition Detections: - Secondary electrons: topography - Backsactering electrons: atomic # and topography - X-ray fluorescence: composition E-gun Lens Detectors Secondary electron Sample
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Instrumentation: SEM
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Principle: Transmission Electron Microscopy (TEM)
Beam size: a few – 30 A Beam Voltage: 40kV- 1MV Resolution: 1-2A Imaging radiations: transmitted electrons, Imaging contrast: Scattering effect Magnification: 60x-15,000,000x Image Contrast: 1) Amplitude (scattering) contrast - transmitted beam only (bright field image) - diffraction beam only (dark field image) 2) Phase (interference) contrast - combination of transmitted and diffraction beam - multi-beam lattice image: atomic resolution (HRTEM) E-gun Condenser lens Thin sample Objective lens Projector Screen
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Example: TEM images of Co-nanoparticles
60 nm Self-assembled 2D-monolayer Surface Modification A A Co nanoparticles 평균 지름 = 7.8 ±1 nm B B Self-assembled 3D-multilayer From J.I. Park and J. Cheon
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Interactions used for Imaging in SPM
Tunneling I~exp(kd) (b) Forces F(d) ~ various (c) Optical near fields E ~1/d4 (d) Capacitance C(d) ~ 1/d (e) Thermal gradient (f) Ion flow f(d) ? Resolution limits The property probed The probe size
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Scanning Probe Microcopy
Scanning Tunneling Microscopy(STM): topography, local DOS Atomic Force Microscopy (AFM): topography, force measurement Lateral Force Microscopy (LFM): friction Magnetic Force Microscopy (MFM): magnetism Electrostatic Force Microscopy (EFM): charge distribution Nearfield Scanning Optical Microscopy (NSOM): optical properties Scanning Capacitance Microscopy (SCM): dielectric constant, doping Scanning Thermal Microscopy (SThM): temperature Ballistic Electron Emission Microscopy (BEEM): interface structure Spin-polarized STM (SP-STM): spin structure Scanning Electro-chemical Microscopy (SECM): electrochmistry Scanning Tunneling Potentiometry (SPM): potential surface Photon Emission STM (PESTM): chemical identification
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Scanning Tunneling Microscope
Coarse positioning device Scanning Modes: 1. Constant current 2. Constant height Piezo tube scanner X,Y,Z Tip Current Feedback Computer amplifier controller Sample 구성: piezo tube scnner, tip, feedback control system Voltage between tip and sample, tunneling current is measured, feed back controller compare with set current, Vary the voltage applied to PZT scanner to maintain the set current Sample bias voltage Real space imaging with atomic resolution
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Constant current STM image corresponds to
Theory of STM J. Tersoff and D.R. Hamann, Phys. Rev. lett. 50, 1988 (1983) Figure From J. Wintterlin sample tip Ef eVbias Ef d For meta surface, LDOS at a surface follows the corrugation of the surface atoms For semiconductors, the suface state tend to be localized on some atoms or bonds It ~ tip2 sample2 e-2d ~ sample2 d(E-Ef) for low voltage limit; a point tip Constant current STM image corresponds to a surface of constant state density.
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Tunneling Spectroscopy
d: fixed It ~ r tip (E) r sample (E-eV)T(E,V) dE (Z)IV- x,y : Topography di/dV~ rsample (E): LDOS d2i/dV2: local vibrational spectra A Si(111)-2x1 Si DOS features seen inI/V curves are obscured by the fact that It depend on separation and aplied volatge. This dependence can be partially removed by plotting the ration of differential to total conductivity dI/dV(I/V) dI/dV(I/V) The normalized conductivity =surface DOS at least for a metal Ni Theory I vs V (di/dV)/(I/V) vs V J. A. Stroscio et al. Phys. Rev. Lett. 57, 2579 (1986)
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Applications of STM Surface geometry Molecular structure
Local electronic structure Local spin structure Single molecular vibration Electronic transport Nano-fabrication Atom manipulation Nano-chemical reaction
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Atom-resolved Surface Structure
2x1 c(4x2) p(2x2) Buckled 2x1 p(2x2) c(4x2) Various Reconstructions of Ge(100)-2x1 J.Y. Maeng et al (2001)
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Si(100) and Ge(100) 2x1 surface - * Clean Surface Structure Si(001)
at 80 K Clean Surface Structure Lattice Constant Dimer Length Tilt Angle - * Buckled-Symmetric Si(100) 5.43 Å 2.32 Å 70 0.66 eV 25 meV Ge(100) 5.658 Å 2.41 Å 140 1.11 eV 60 meV
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Molecular Orbitals sample tip - + Occupied state (HOMO) Ef Ef d
sample tip Occupied state (HOMO) Ef Ef d Unoccupied state (LUMO) STM image: Spatial location of the molecular orbitals, rather than, geometrical position of atoms -sample bais image: occupied orbitals +biais image: unoccupied orbitals Ef Ef d J.J.Boland, Adv. Phys. 42, 129(1993)
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STM Topograph of Quantum Dot
Ge pyramid containing ~2000 Ge atoms on Si(100) Ge dome grown by PVD on a 600 C Si(100) R.S. Williams et al, Acc. Chem. Res. 32, 425 (1999)
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STM Images of Ni Clusters at Different Sample Bias Voltages
Spectroscopic information can be obtained by recording multiple images at different voltages Or spectra can be acquired at one selected point by holding the the probe still and sweeping the bias voltage
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STS and STM of Self-assembled Co-nanoparticles
Tip on self-assembled monolayer Tip on a Co nanoparticle I vs V dI/dV vs V Pileni et al, Appl. Surf. Sci. 162/163, 519 (2000)
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Tunneling Spectroscopy of InAs QD
STM T=4.2K Optical d = 32A S-like P-like Fig 1 a : double barrier junction configuration Fig 1b shows Tunneling conductance spectrum and a series of single electron tunneling peaks DT: hexane dithiol Chrging energy(addtion spectrum) and discrete energy level spacings( excitation spectrum) of the QD S-like feature: doublet P-like feature: 6 peaks; p orbital can take 6 electrons Ec=0.11 eV: single electron charging energy Eg=1.02 eV: nanocrystal band gap U. Banin et al, Nature, 400, 926 (2000)
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Electronic Properties of Carbon Nanotubes
Constant LDOS Metallic SWNT Semiconducting SWNT
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Single Molecule Vibrational Spectroscopy
Vibration excitation of the molecule occurs when tunneling electrons have enough energy to excite a quantized vibrational level Inelastic tunneling channel B.C. Stipe. et. al., Science 280, 1732 (1998)
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Real Space Imaging of Two-Dimensional Antiferromagnetism On the Atomic Scale Weisendanger et al, Science 288, 1805 (2000) Nonmagnetic W tip Magnetic W tip
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Atomic Manipulation by STM
Iron on Copper (111): Circular corral radius= 71.3 A 48 Fe atoms Quantum-mechanical interference patterns M.F. Crommie, C.P. Lutz, D.M. Eigler. Science 262, (1993).
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Molecular Adsorption: 2+2 cycloaddition reaction
Fabrication of molecularly ordered organic films Anisotropic optical and electrical properties A Possible way to orient molecular devices R.J. Hamers et al, J. Phys. Chem., 101, 1489 (1997)
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In-situ Monitoring of Self-assembly
Self-directed growth of Nanostructures Wolkow et al, Nature, 406, 48 (2000)
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Single-Bond Formation by STM
H.J. Lee and W. Ho, Science, 286, 1719(1999)
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