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EE 5340 Semiconductor Device Theory Lecture 8 - Fall 2009 Professor Ronald L. Carter ronc@uta.edu http://www.uta.edu/ronc
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L 08 Sept 182 Test 1 – Sept. 24, 2009 8 AM Room 108 Nedderman Hall Open book - 1 legal text or ref., only. You may write notes in your book. Calculator allowed A cover sheet will be included with full instructions. See http://www.uta.edu/ronc/5340/tests/ for examples from previous semesters.
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L 08 Sept 173 Si and Al and model (approx. to scale) q m,Al ~ 4.1 eV EoEo E Fm E Fp E Fn EoEo EcEc EvEv E Fi q s,n q si ~ 4.05 eV EoEo EcEc EvEv E Fi q s,p metaln-type s/cp-type s/c q si ~ 4.05 eV
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L 08 Sept 174 Making contact be- tween metal & s/c Equate the E F in the metal and s/c materials far from the junction E o (the free level), must be continuous across the jctn. N.B.: q = 4.05 eV (Si), and q = q E c - E F EoEo EcEc EFEF E Fi EvEv q (electron affinity) qFqF qq (work function)
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L 08 Sept 175 Equilibrium Boundary Conditions w/ contact No discontinuity in the free level, E o at the metal/semiconductor interface. E F,metal = E F,semiconductor to bring the electron populations in the metal and semiconductor to thermal equilibrium. E o - E C = q semiconductor in all of the s/c. E o - E F,metal = q metal throughout metal.
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L 08 Sept 176 Ideal metal to n-type barrier diode ( m > s,V a =0) E Fn EoEo EcEc EvEv E Fi q s,n qsqs n-type s/c qmqm E Fm metal q Bn qiqi q’nq’n No disc in E o E x =0 in metal ==> E o flat Bn = m - s = elec mtl to s/c barr i = Bn - n = m - s elect s/c to mtl barr Depl reg
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L 08 Sept 177 Metal to n-type non-rect cont ( m < s ) E Fn EoEo EcEc EvEv E Fi q s,n qsqs n-type s/c qmqm E Fm metal q B,n qnqn No disc in E o E x =0 in metal ==> E o flat B,n = m - s = elec mtl to s/c barr i = Bn - n < 0 Accumulation region Acc reg qiqi
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L 08 Sept 178 Ideal metal to p-type barrier diode ( m < s ) E Fp EoEo EcEc EvEv E Fi q s,p qsqs p-type s/c qmqm E Fm metal q Bn qiqi q p <0 No disc in E o E x =0 in metal ==> E o flat Bn = m - s = elec mtl to s/c barr Bp = m - s + E g = hole m to s i = Bp - s,p = hole s/c to mtl barr Depl reg q Bp qiqi
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L 08 Sept 179 Metal to p-type non-rect cont ( m > s ) No disc in E o E x =0 in metal ==> E o flat B,n = m - s,n = elec mtl to s/c barr Bp = m - s + E g = hole m to s Accumulation region E Fi EoEo EcEc EvEv E fP q s,n qsqs n-type s/c qmqm E Fm metal q Bn q( i ) qpqp Accum reg q Bp qiqi
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L 08 Sept 1710 Metal/semiconductor system types n-type semiconductor Schottky diode - blocking for m > s contact - conducting for m < s p-type semiconductor contact - conducting for m > s Schottky diode - blocking for m < s
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L 08 Sept 1711 Real Schottky band structure 1 Barrier transistion region, Interface states above o acc, p neutrl below o dnr, n neutrl D it -> oo, q Bn = E g - o Fermi level “pinned” D it -> 0, q Bn = m - Goes to “ideal” case
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L 08 Sept 1712 Fig 8.4 1 (a) Image charge and electric field at a metal-dielectric interface (b) Distortion of potential barrier at E=0 and (c) E 0
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L 08 Sept 1713 Poisson’s Equation The electric field at (x,y,z) is related to the charge density =q(Nd-Na-p-n) by the Poisson Equation:
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L 08 Sept 1714 Poisson’s Equation n = n o + n, and p = p o + p, in non-equil For n-type material, N = (N d - N a ) > 0, n o = N, and (N d -N a +p-n)=- n + p +n i 2 /N For p-type material, N = (N d - N a ) < 0, p o = -N, and (N d -N a +p-n) = p- n-n i 2 /N So neglecting n i 2 /N
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L 08 Sept 1715 Ideal metal to n-type barrier diode ( m > s,V a =0) E Fn EoEo EcEc EvEv E Fi q s,n qsqs n-type s/c qmqm E Fm metal q Bn q bi q’nq’n No disc in E o E x =0 in metal ==> E o flat Bn = m - s = elec mtl to s/c barr bi = Bn - n = m - s elect s/c to mtl barr Depl reg 0 x n x nc
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L 08 Sept 1716 Depletion Approximation For 0 < x < x n, assume n << n o = N d, so = q(N d -N a +p-n) = qN d For x n < x < x nc, assume n = n o = N d, so = q(N d -N a +p-n) = 0 For x = 0 -, there is a pulse of charge balancing the qN d x n in 0 < x < x n
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L 08 Sept 1717 Ideal n-type Schottky depletion width (V a =0) xnxn x qN d Q’ d = qN d x n x ExEx -E m xnxn (Sheet of negative charge on metal)= -Q’ d
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L 08 Sept 1718 Debye length The DA assumes n changes from N d to 0 discontinuously at x n. In the region of x n, Poisson’s eq is E = / --> dE x /dx = q(N d - n), and since E x = -d /dx, we have -d 2 /dx 2 = q(N d - n)/ to be solved n x xnxn NdNd 0
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L 08 Sept 1719 Debye length (cont) Since the level E Fi is a reference for equil, we set = V t ln(n/n i ) In the region of x n, n = n i exp( /V t ), so d 2 /dx 2 = -q(N d - n i e /Vt ), let = o + ’, where o = V t ln(N d /n i ) soN d - n i e /Vt = N d [1 - e /Vt- o/Vt ], for - o = ’ << o, the DE becomes d 2 ’/dx 2 = (q 2 N d / kT) ’, ’ << o
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L 08 Sept 1720 Debye length (cont) So ’ = ’(x n ) exp[+(x-x n )/L D ]+con. and n = N d e ’/Vt, x ~ x n, where L D is the “Debye length”
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L 08 Sept 1721 Debye length (cont) L D estimates the transition length of a step-junction DR. Thus, For V a = 0, i ~ 1V, V t ~ 25 mV < 11% DA assumption OK
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L 08 Sept 1722 Effect of V 0 Define an external voltage source, V a, with the +term at the metal contact and the -term at the n-type contact For V a > 0, the V a induced field tends to oppose E x caused by the DR For V a < 0, the V a induced field tends to aid E x due to DR Will consider V a < 0 now
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L 08 Sept 1723 Effect of V 0
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L 08 Sept 1724 Ideal metal to n-type Schottky (V a > 0) qV a = E fn - E fm Barrier for electrons from sc to m reduced to q( bi -V a ) q Bn the same DR decr E Fn EoEo EcEc EvEv E Fi q s,n qsqs n-type s/c qmqm E Fm metal q Bn q( i -V a ) q’nq’n Depl reg
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L 08 Sept 1825 Schottky diode capacitance xnxn x qN d -Q- Q Q’ d = qN d x n x ExEx -E m xnxn Q’
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L 08 Sept 1826 Schottky Capacitance (continued) The junction has +Q’ n =qN d x n (exposed donors), and Q’ n = - Q’ metal (Coul/cm 2 ), forming a parallel sheet charge capacitor.
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L 08 Sept 1827 Schottky Capacitance (continued) This Q ~ ( i -V a ) 1/2 is clearly non- linear, and Q is not zero at V a = 0. Redefining the capacitance,
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L 08 Sept 1828 Schottky Capacitance (continued) So this definition of the capacitance gives a parallel plate capacitor with charges Q’ n and Q’ p (=- Q’ n ), separated by, L (=x n ), with an area A and the capacitance is then the ideal parallel plate capacitance. Still non-linear and Q is not zero at V a =0.
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L 08 Sept 1829 Schottky Capacitance (continued) The C-V relationship simplifies to
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L 08 Sept 1830 Schottky Capacitance (continued) If one plots [C j ] -2 vs. V a Slope = -[(C j0 ) 2 V bi ] -1 vertical axis intercept = [C j0 ] -2 horizontal axis intercept = i C j -2 ii VaVa C j0 -2
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L 08 Sept 1731 References 1 Device Electronics for Integrated Circuits, 2 ed., by Muller and Kamins, Wiley, New York, 1986. See Semiconductor Device Fundamentals, by Pierret, Addison-Wesley, 1996, for another treatment of the model. 2 Physics of Semiconductor Devices, by S. M. Sze, Wiley, New York, 1981. 3 Semiconductor Physics & Devices, 2nd ed., by Neamen, Irwin, Chicago, 1997.
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