Download presentation
Presentation is loading. Please wait.
Published byMarianna Dorsey Modified over 9 years ago
1
EE 5340 Semiconductor Device Theory Lecture 11 – Spring 2011 Professor Ronald L. Carter ronc@uta.edu http://www.uta.edu/ronc
2
©rlc L11-24Feb20112 Metal/semiconductor system types n-type semiconductor Schottky diode - blocking for m > s contact - conducting for m < s p-type semiconductor contact - conducting for m > s Schottky diode - blocking for m < s
3
©rlc L11-24Feb20113 Real Schottky band structure 1 Barrier transistion region, Interface states above o acc, p neutrl below o dnr, n neutrl D it -> oo, q Bn = E g - o Fermi level “pinned” D it -> 0, q Bn = m - Goes to “ideal” case
4
©rlc L11-24Feb20114 Fig 8.4 1 (a) Image charge and electric field at a metal-dielectric interface (b) Distortion of potential barrier at E=0 and (c) E 0
5
©rlc L11-24Feb20115 Poisson’s Equation The electric field at (x,y,z) is related to the charge density =q(Nd-Na-p-n) by the Poisson Equation:
6
©rlc L11-24Feb20116 Poisson’s Equation n = n o + n, and p = p o + p, in non-equil For n-type material, N = (N d - N a ) > 0, n o = N, and (N d -N a +p-n)=- n + p +n i 2 /N For p-type material, N = (N d - N a ) < 0, p o = -N, and (N d -N a +p-n) = p- n-n i 2 /N So neglecting n i 2 /N
7
©rlc L11-24Feb20117 Ideal metal to n-type barrier diode ( m > s,V a =0) E Fn EoEo EcEc EvEv E Fi q s,n qsqs n-type s/c qmqm E Fm metal q Bn q bi q’nq’n No disc in E o E x =0 in metal ==> E o flat Bn = m - s = elec mtl to s/c barr bi = Bn - n = m - s elect s/c to mtl barr Depl reg 0 x n x nc
8
©rlc L11-24Feb20118 Depletion Approximation For 0 < x < x n, assume n << n o = N d, so = q(N d -N a +p-n) = qN d For x n < x < x nc, assume n = n o = N d, so = q(N d -N a +p-n) = 0 For x = 0 -, there is a pulse of charge balancing the qN d x n in 0 < x < x n
9
©rlc L11-24Feb20119 Ideal n-type Schottky depletion width (V a =0) xnxn x qN d Q’ d = qN d x n x ExEx -E m xnxn (Sheet of negative charge on metal)= -Q’ d
10
©rlc L11-24Feb201110 Debye length The DA assumes n changes from N d to 0 discontinuously at x n. In the region of x n, Poisson’s eq is E = / --> dE x /dx = q(N d - n), and since E x = -d /dx, we have -d 2 /dx 2 = q(N d - n)/ to be solved n x xnxn NdNd 0
11
©rlc L11-24Feb201111 Debye length (cont) Since the level E Fi is a reference for equil, we set = V t ln(n/n i ) In the region of x n, n = n i exp( /V t ), so d 2 /dx 2 = -q(N d - n i e /Vt ), let = o + ’, where o = V t ln(N d /n i ) soN d - n i e /Vt = N d [1 - e /Vt- o/Vt ], for - o = ’ << o, the DE becomes d 2 ’/dx 2 = (q 2 N d / kT) ’, ’ << o
12
©rlc L11-24Feb201112 Debye length (cont) So ’ = ’(x n ) exp[+(x-x n )/L D ]+con. and n = N d e ’/Vt, x ~ x n, where L D is the “Debye length”
13
©rlc L11-24Feb201113 Debye length (cont) L D estimates the transition length of a step-junction DR. Thus, For V a = 0, i ~ 1V, V t ~ 25 mV < 11% DA assumption OK
14
©rlc L11-24Feb201114 Effect of V 0 Define an external voltage source, V a, with the +term at the metal contact and the -term at the n-type contact For V a > 0, the V a induced field tends to oppose E x caused by the DR For V a < 0, the V a induced field tends to aid E x due to DR Will consider V a < 0 now
15
©rlc L11-24Feb201115 Effect of V 0
16
©rlc L11-24Feb201116 Ideal metal to n-type Schottky (V a > 0) qV a = E fn - E fm Barrier for electrons from sc to m reduced to q( bi -V a ) q Bn the same DR decr E Fn EoEo EcEc EvEv E Fi q s,n qsqs n-type s/c qmqm E Fm metal q Bn q( i -V a ) q’nq’n Depl reg
17
©rlc L11-24Feb201117 Schottky diode capacitance xnxn x qN d -Q- Q Q’ d = qN d x n x ExEx -E m xnxn Q’
18
©rlc L11-24Feb201118 Schottky Capacitance (continued) The junction has +Q’ n =qN d x n (exposed donors), and Q’ n = - Q’ metal (Coul/cm 2 ), forming a parallel sheet charge capacitor.
19
©rlc L11-24Feb201119 Schottky Capacitance (continued) This Q ~ ( i -V a ) 1/2 is clearly non- linear, and Q is not zero at V a = 0. Redefining the capacitance,
20
©rlc L11-24Feb201120 Schottky Capacitance (continued) So this definition of the capacitance gives a parallel plate capacitor with charges Q’ n and Q’ p (=- Q’ n ), separated by, L (=x n ), with an area A and the capacitance is then the ideal parallel plate capacitance. Still non-linear and Q is not zero at V a =0.
21
©rlc L11-24Feb201121 Schottky Capacitance (continued) The C-V relationship simplifies to
22
©rlc L11-24Feb201122 Schottky Capacitance (continued) If one plots [C j ] -2 vs. V a Slope = -[(C j0 ) 2 V bi ] -1 vertical axis intercept = [C j0 ] -2 horizontal axis intercept = i C j -2 ii VaVa C j0 -2
23
Diagrams for ideal metal-semiconductor Schottky diodes. Fig. 3.21 in Ref 4. ©rlc L11-24Feb201123
24
©rlc L11-24Feb2011 Energy bands for p- and n-type s/c p-type EcEc EvEv E Fi E FP q P = kT ln(n i /N a ) EvEv EcEc E Fi E FN q n = kT ln(N d /n i ) n-type 24
25
©rlc L11-24Feb2011 Making contact in a p-n junction Equate the E F in the p- and n-type materials far from the junction E o (the free level), E c, E fi and E v must be continuous N.B.: q = 4.05 eV (Si), and q = q E c - E F EoEo EcEc EFEF E Fi EvEv q (electron affinity) qFqF qq (work function) 25
26
©rlc L11-24Feb2011 Band diagram for p + -n jctn* at V a = 0 EcEc E FN E Fi EvEv EcEc E FP E Fi EvEv 0 xnxn x -x p -x pc x nc q p < 0 q n > 0 qV bi = q( n - p ) *N a > N d -> | p | > n p-type for x<0 n-type for x>0 26
27
©rlc L11-24Feb2011 A total band bending of qV bi = q( n - p ) = kT ln(N d N a /n i 2 ) is necessary to set E Fp = E fn For -x p < x < 0, E fi - E FP < -q p, = |q p | so p < N a = p o, (depleted of maj. carr.) For 0 < x < x n, E FN - E Fi < q n, so n < N d = n o, (depleted of maj. carr.) -x p < x < x n is the Depletion Region Band diagram for p + -n at V a =0 (cont.) 27
28
©rlc L11-24Feb2011 Depletion Approximation Assume p << p o = N a for -x p < x < 0, so = q(N d -N a +p-n) = -qN a, -x p < x < 0, and p = p o = N a for -x pc < x < -x p, so = q(N d -N a +p-n) = 0, -x pc < x < -x p Assume n << n o = N d for 0 < x < x n, so = q(N d -N a +p-n) = qN d, 0 < x < x n, and n = n o = N d for x n < x < x nc, so = q(N d -N a +p-n) = 0, x n < x < x nc 28
29
©rlc L11-24Feb2011 Depletion approx. charge distribution xnxn x -x p -x pc x nc +qN d -qN a +Q n ’=qN d x n Q p ’=-qN a x p Due to Charge neutrality Q p ’ + Q n ’ = 0, => N a x p = N d x n [Coul/cm 2 ] 29
30
©rlc L11-24Feb2011 Induced E-field in the D.R. The sheet dipole of charge, due to Q p ’ and Q n ’ induces an electric field which must satisfy the conditions Charge neutrality and Gauss’ Law* require thatE x = 0 for -x pc < x < -x p and E x = 0 for -x n < x < x nc ≈0≈0 30
31
©rlc L11-24Feb2011 Induced E-field in the D.R. xnxn x -x p -x pc x nc O - O - O - O + O + O + Depletion region (DR) p-type CNR ExEx Exposed Donor ions Exposed Acceptor Ions n-type chg neutral reg p-contact N-contact W 0 31
32
©rlc L11-24Feb2011 Induced E-field in the D.R. (cont.) Poisson’s Equation E = / , has the one-dimensional form, dE x /dx = / , which must be satisfied for = -qN a, -x p < x < 0, and = +qN d, 0 < x < x n, with E x = 0 for the remaining range 32
33
©rlc L11-24Feb2011 Soln to Poisson’s Eq in the D.R. xnxn x -x p -x pc x nc ExEx -E max 33
34
©rlc L11-24Feb2011 Soln to Poisson’s Eq in the D.R. (cont.) 34
35
©rlc L11-24Feb2011 Soln to Poisson’s Eq in the D.R. (cont.) 35
36
©rlc L11-24Feb2011 Comments on the E x and V bi V bi is not measurable externally since E x is zero at both contacts The effect of E x does not extend beyond the depletion region The lever rule [N a x p =N d x n ] was obtained assuming charge neutrality. It could also be obtained by requiring E x (x=0 x E x (x=0 x) E max 36
37
©rlc L11-24Feb2011 Sample calculations V t 25.86 mV at 300K = r o = 11.7*8.85E-14 Fd/cm = 1.035E-12 Fd/cm If N a 5E17/cm 3, and N d 2E15 /cm 3, then for n i 1.4E10/cm 3, then what is V bi = 757 mV 37
38
©rlc L11-24Feb2011 Sample calculations What are N eff, W ? N eff, = 1.97E15/cm 3 W = 0.707 micron What is x n ? = 0.704 micron What is E max ? 2.14E4 V/cm 38
39
©rlc L11-24Feb201139 References 1 Device Electronics for Integrated Circuits, 2 ed., by Muller and Kamins, Wiley, New York, 1986. See Semiconductor Device Fundamentals, by Pierret, Addison- Wesley, 1996, for another treatment of the model. 2 Physics of Semiconductor Devices, by S. M. Sze, Wiley, New York, 1981. 3 Semiconductor Physics & Devices, 2nd ed., by Neamen, Irwin, Chicago, 1997. 4 Device Electronics for Integrated Circuits, 3/E by Richard S. Muller and Theodore I. Kamins. © 2003 John Wiley & Sons. Inc., New York.
40
©rlc L11-24Feb201140 References 1 and M&K Device Electronics for Integrated Circuits, 2 ed., by Muller and Kamins, Wiley, New York, 1986. See Semiconductor Device Fundamentals, by Pierret, Addison-Wesley, 1996, for another treatment of the model. 2 Physics of Semiconductor Devices, by S. M. Sze, Wiley, New York, 1981. 3 and ** Semiconductor Physics & Devices, 2nd ed., by Neamen, Irwin, Chicago, 1997. Fundamentals of Semiconductor Theory and Device Physics, by Shyh Wang, Prentice Hall, 1989.
Similar presentations
© 2025 SlidePlayer.com. Inc.
All rights reserved.