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Characterization of Void Growth in High Temperature Fatigued Copper through USANS Guangjun Cheng Stephen Fenimore Rohan Hule Jinkee Lee Christopher Metting Maria Torija
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Outline USANS Problem background Experimental design Analysis Results Conclusions
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USANS Capabilities Low q range –3x10 -5 Å -1 < q < 0.01 Å -1 Particle Diameter:0.1 μ m < D < 10 μm
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Problem Background Fatigue causes voids in copper lattice Voids grow nucleate at grain boundaries Lead to mechanical failure Relationship between stress and void growth
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Experimental Design Fatigue conditions –405 o C –17 cycles/second –Max stress amplitude: 34 MPa Monitor void growth by varying the number of fatigue cycles –25,000; 50,000; 100,000 cycles USANS to examine growth shape and size
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Reduced Slit Smeared USANS Data Slope= -1 (plate) Slope= -3 (Porod)
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Porod Scattering, 100,000 cycles 3 Intercept ~surface area/sample volume -3
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Invariant Area under curve ~ Volume Fraction
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Modified Guinier (plate) m= -T 2 /12
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Results Number of Cycles 25,00050,000100,000 Surface area/Sample volume (cm 2 /cm 3 )160240 Volume fraction5.80E-041.70E-032.90E-03 Average diameter ( m) 0.600.72 Average volume ( m 3 ) 0.110.20 Number of voids/sample volume (cm -3 )1.50E+101.40E+10 Plate thickness ( m) 0.360.550.63
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Comparison with prior work Scripta Met. 24 (1990) 227-232
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Conclusions USANS proved to be a powerful tool for this investigation Average volume increases with cycle number Number of nucleation sites is independent of the number of cycles
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HURRAY for USANS! Thanks to John Barker, Man-Ho Kim, and David Mildner Questions?
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Data reduction for USANS: Smearing corection
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Scattering for non-interacting particles
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Particle Volume fraction- Invariant
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Interfacial Surface Area
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