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EDMS No. 888499 Photoinjector General + Photocathodes presented by Konrad Elsener (CERN-AB)
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EDMS No. 888499 Acknowledgements (PHIN) We acknowledge the support of the European Community- Research Infrastructure Activity under the FP6 “Structuring the European Research Area” programme (CARE, contract number RII3-CT-2003-506395).
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EDMS No. 888499 Outline Overview Photocathodes: Status + Outlook (photocathode for CLEX) PHIN in CTF2 Summary
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EDMS No. 888499 Overview LASER RF GUN RF equip. Photocathode “Photoinjector” bunched electron beam Cs2Te UV …cf. next two talks… G. McMonagle (yesterday)
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EDMS No. 888499 Photocathodes cf. presentation by R. Losito, 17 Jan. 2007 HIGHLIGHT end of 2006: Photocathode No. 166 produced (after > 3 years interruption) Cs-Te cathode, co-evaporation, Quantum Efficiency > 6% very detailed description of No. 166: CTF3-Note-089 many thanks to Eric Chevallay
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EDMS No. 888499 Photocathodes – No. 167 HIGHLIGHT 2007: Photocathode No. 167 produced 29 November (Cs-Te cathode, co-evaporation) Quantum Efficiency Lifetime measured during 1000 hours
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EDMS No. 888499 data taken in DC-gun, 80 kV (-> 8 MV/m) 29 Nov. 2007 Xmas break 9 Jan. 2008 CTF3 specs (drive beam) Photocathodes - No. 167
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EDMS No. 888499 manipulator DC- gun preparation chamber transport carrier ~ 1.4 m Photocathodes – No. 167
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EDMS No. 888499 basic unit: Cu “plug” on the “arm” inside the transport carrier: up to 4 plugs Photocathodes - No. 167
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EDMS No. 888499 Photocathodes Process Control and Reproducibility (A. Barbiero and E. Chevallay) - cleanliness / UHV vacuum
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EDMS No. 888499 H2H2 CO N 2 N CH 4 O H 2 O... a long period of improvements, pumping, leak testing, baking-out, leak testing, repair, pumping, baking out,... vacuum before cathode preparation: < 3x10 -11 mbar residual gas analysis in preparation chamber (29 Nov. 2007) Photocathodes - vacuum
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EDMS No. 888499 Photocathodes – film thickness Process Control and Reproducibility (A. Barbiero and E. Chevallay) - cleanliness / UHV vacuum - film thickness monitoring (Te, not Cs) -> new stylus profilometer, calibrated
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EDMS No. 888499 Photocathodes - film thickness Te films on quartz substrate new Stylus Profilometer
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EDMS No. 888499 Photocathodes – film thickness cross-check of Stylus Profiler using a calibrated sample* (Rank Taylor Hobson) with 3 grooves, 24 nm each solid lines: =24 nm dashed line: =26 nm Result: Profilometer intrinsic error < 2 nm * sample on loan from CERN-TS/MME (W. Vollenberg) 0.5 mm
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EDMS No. 888499 Photocathodes – transfer arm Process Control and Reproducibility (A. Barbiero and E. Chevallay) - cleanliness / UHV vacuum - film thickness monitoring -> stylus profilometer, calibrated - possibility of cathode chemical analysis (X-ray Photoel. Spectr.) -> new, smaller transfer arm (for 1 plug) (collaboration with team of M. Taborelli / TS-MME)
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EDMS No. 888499 Photocathodes – transfer arm (attached to preparation chamber) (courtesy A. Barbiero)
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EDMS No. 888499 Photocathodes – plug surfaces Process Control and Reproducibility (A. Barbiero and E. Chevallay) - cleanliness / UHV vacuum - film thickness monitoring -> stylus profilometer, calibrated - possibility of cathode chemical analysis (XPS) -> new transfer arm - reproducible “plug” surface -> test programme on surface preparation + analysis (work in progress - No. 166 and No. 167 are very different)
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EDMS No. 888499 photocathode for CLEX Preparation chamber for CLEX (ex-CTF2 Probe-Beam) Cs + Te sources (no co-evaporation); 1 quartz thickness monitor (DN 100 flange) manipulator arm (position for “plug”) pumping port
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EDMS No. 888499 “CTF2” (south) photoemission laboratory “CTF2”
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EDMS No. 888499 “CTF2” - status
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EDMS No. 888499 Acknowledgments Nathalie Lebas: expert help with the laser Arnaud Brielmann: expert help with controls and interlocks (for equipment safety)
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EDMS No. 888499 Summary + Outlook Photoemission Laboratory: ready for production of cathodes Cs-Te cathode No. 167: ready for PHIN work in progress to improve reproducibility near future: CLEX cathode continue contributions to PHIN in “CTF2”
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EDMS No. 888499 spare slides
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EDMS No. 888499 spare slides 8 Nov. 2007
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EDMS No. 888499
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PHIN overview
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