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2007. 2. 6 IHEP, Bejing 9th ACFA ILC Physics and Detector Workshop & ILC GDE Meeting The preliminary results of MPGD-based TPC performance at KEK beam test Yukihiro Kato Kinki University (ILC-TPC Collaboration)
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2007. 2. 6 IHEP, Bejing 9th ACFA ILC Physics and Detector Workshop & ILC GDE Meeting Motivation Comparison of several readout scheme (gas amplifiers) using same Field Cage, Electronics, analysis procedure, MWPC: beam test in Jun. 2004 GEM: beam test in Apr. 2005, Oct. 2005 MicroMEGAS: beam test in Jun. 2005, Oct 2005 Understand the basic performance of MPGD-based TPC Results are updated from ACFA05
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2007. 2. 6 IHEP, Bejing 9th ACFA ILC Physics and Detector Workshop & ILC GDE Meeting ILC-TPC collaboration Asia Japan (KEK, Saga, Tokyo A&M, Tsukuba, Kogakuin, Kinki, Hiroshima) Philippines ( MSU-Iligan ) Europe Germany ( DESY, MPI ) France ( CEA Saclay, LAL Orsay, IPN Orsay ) North America Canada ( Carlton, Montreal )
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2007. 2. 6 IHEP, Bejing 9th ACFA ILC Physics and Detector Workshop & ILC GDE Meeting KEK PS beam line π2 beam line: π +, π ‐, p (P = 0.6 ~ 4 GeV/c)
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2007. 2. 6 IHEP, Bejing 9th ACFA ILC Physics and Detector Workshop & ILC GDE Meeting π2 beam line
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2007. 2. 6 IHEP, Bejing 9th ACFA ILC Physics and Detector Workshop & ILC GDE Meeting PC-MAG known as JACCEE magnet for BESS-II B field : 1 ~ 1.2T@ center, No Return Yoke inner diameter: 850 mm, effective length: 1000 mm Transported to DESY for EUDET at Dec. 2006
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2007. 2. 6 IHEP, Bejing 9th ACFA ILC Physics and Detector Workshop & ILC GDE Meeting MP-TPC Pad plane: effective area 75×75 mm 2 Maximal drift length: 260 mm Detachable endplate MWPC and MPGD (GEM, MicroMEGAS) Field Cage Preamplifiers Readout plane
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2007. 2. 6 IHEP, Bejing 9th ACFA ILC Physics and Detector Workshop & ILC GDE Meeting GEM (Gas Electron Multiplier) Two copper foils separated by kapton (polymide), multiplication takes place in holes, uses 2 or stages for safer operation. High electric field inside the holes CERN GEM geometry Copper electrodes (5μm thick) Kapton insulator (50μm thick) Bi-conical holes due to chemical etching Hole size D ~ 60 μm, pitch p ~ 140μm Using 3 stages induction gap: 1.0mm, transfer gap: 1.5mm
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2007. 2. 6 IHEP, Bejing 9th ACFA ILC Physics and Detector Workshop & ILC GDE Meeting MicroMEGAS Mesh size: 50μm Micromesh sustained by 50 μm pillars, multiplication between anode and mesh, one stage Self-suppression of positive ion feedback 50μm line of electric force pillar
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2007. 2. 6 IHEP, Bejing 9th ACFA ILC Physics and Detector Workshop & ILC GDE Meeting Readout scheme and Gas DAQ electronics: ALEPH TPC electronics ・ Charge sensitive pre-amp+shaper amp (500ns) ・ 8-bit FADC with 12.5MHz sampling rate B field: 0, 0.5, 1.0 Tesla Readout Device Pad Size (pitch)GasDrift field GEM (triple GEM) 1.17mm ×6mm (1.27mm ×6.3mm) TDR: (Ar:CH4:CO2 = 93:5:2) P5: Ar-methane (5%) 220V/cm 100V/cm MicroMEGAS 2mm ×6mm (2.3mm ×6.3mm) Ar-isobutane (5%)220V/cm MWPC 2mm ×6mm (2.3mm ×6.3mm) TDR220V/cm
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2007. 2. 6 IHEP, Bejing 9th ACFA ILC Physics and Detector Workshop & ILC GDE Meeting Typical event (MicroMEGAS, B=0.5T)
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2007. 2. 6 IHEP, Bejing 9th ACFA ILC Physics and Detector Workshop & ILC GDE Meeting Pad-response per region MicroMEGAS, Ar-isobutane (5%), B=0.5T, E = 220 V/cm z = 0 mm z = 260 mm the avalanche charge spread for single electron
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2007. 2. 6 IHEP, Bejing 9th ACFA ILC Physics and Detector Workshop & ILC GDE Meeting Pad-response per region GEM, TDR, B = 1T, E = 100V/cm z = 0 mm z = 260 mm
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2007. 2. 6 IHEP, Bejing 9th ACFA ILC Physics and Detector Workshop & ILC GDE Meeting Transverse diffusion properties B (Tesla)Diffusion constant (C D )C D by Magboltz simulation 0480±3469731±23 0.5289±4285696±28 1.0195±14193723±88 preliminary result diffusion in readout MicroMEGAS
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2007. 2. 6 IHEP, Bejing 9th ACFA ILC Physics and Detector Workshop & ILC GDE Meeting Transverse diffusion properties GEM B=1T Gas TDR (E=220V/m) P5 (E=100V/m) CDCD 213.0±0.4174.0±0.4 C D [ Magbolz ] 200166 432±3 502±2 TDR P5 preliminary result
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2007. 2. 6 IHEP, Bejing 9th ACFA ILC Physics and Detector Workshop & ILC GDE Meeting Spatial resolution vs. drift distance C D : diffusion constant from data σ 0 : resolution without diffusion N eff : effective number of electrons diffusion other effects
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2007. 2. 6 IHEP, Bejing 9th ACFA ILC Physics and Detector Workshop & ILC GDE Meeting Spatial resolution MicroMEGAS preliminary result B 0 T 0.5 T1.0 T N eff 15.1±1.218.7±2.615.8±7.7
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2007. 2. 6 IHEP, Bejing 9th ACFA ILC Physics and Detector Workshop & ILC GDE Meeting Spatial resolution GEM TDR N eff = 21.4±0.3 P5 N eff = 23.0±0.7 preliminary result
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2007. 2. 6 IHEP, Bejing 9th ACFA ILC Physics and Detector Workshop & ILC GDE Meeting Analytic formula for spatial resolution [A] Finite pad pitch: rapidly disappears as z increases. N independent. [B] Diffusion, gas gain fluctuation, finite pad pitch term: scales as 1/Neff, for δ function like PRF asymptotically: [C] Electronic noise: z independent
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2007. 2. 6 IHEP, Bejing 9th ACFA ILC Physics and Detector Workshop & ILC GDE Meeting Comparison with measurements Formulation can explain the MicroMEGAS data.
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2007. 2. 6 IHEP, Bejing 9th ACFA ILC Physics and Detector Workshop & ILC GDE Meeting diffusion and resolution MicroMEGAS GEM MWPC Gas Ar-isobutane (5%) TDRP5TDR 723±88432±2502±21270±4 CDCD 195±14213.0±0.4174.0±0.4211±1 C D [Magboltz] 193200166200 N eff 16±8212320 B = 1T data preliminary results
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2007. 2. 6 IHEP, Bejing 9th ACFA ILC Physics and Detector Workshop & ILC GDE Meeting Summary The values of diffusion constant (C D ) are consistent with Magboltz simulation. In the case of MicroMEGAS, σ PR 0 has a large error. It is much smaller than the pad pitch. Need to spread the avalanche size by resistive foil, etc. Spatial resolution can be described with the simple analytic formula.
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2007. 2. 6 IHEP, Bejing 9th ACFA ILC Physics and Detector Workshop & ILC GDE Meeting Backup slide
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2007. 2. 6 IHEP, Bejing 9th ACFA ILC Physics and Detector Workshop & ILC GDE Meeting K.Fujii
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2007. 2. 6 IHEP, Bejing 9th ACFA ILC Physics and Detector Workshop & ILC GDE Meeting K.Fujii
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2007. 2. 6 IHEP, Bejing 9th ACFA ILC Physics and Detector Workshop & ILC GDE Meeting K.Fujii
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