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Modeling defect level occupation for recombination statistics Adam Topaz and Tim Gfroerer Davidson College Mark Wanlass National Renewable Energy Lab Supported by the American Chemical Society – Petroleum Research Fund
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A semiconductor: Conduction Band Valence Band Defect States Energy
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Electrons Equilibrium Occupation in a Low Temperature Semiconductor. Holes Electron Trap Hole Trap
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Photoexcitation Photon
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Photoexcitation Photon
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Photoexcitation
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Radiative Recombination.
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Photon
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Radiative Recombination. Photon
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Electron Trapping.
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Defect Related Recombination.
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Heat
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Defect Related Recombination. Heat
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What do we measure? Recombination rate includes radiative and defect-related recombination. Measurements were taken of radiative efficiency vs. recombination rate. (radRate)/(radRate+defRate) vs. (radRate + defRate) Objective: Information about the defect-related density of states.
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The Defect-Related Density of States (DOS) Function Conduction Band Valence Band Defect States Energy Ev Ec Energy
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Band Density Of States Conduction Band Valence Band Energy
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Looking at the Data…
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Calculate x-Axis Use Rate value for y-Axis dP = hole concentration in valence band dN = electron concentration in conduction band
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The simple theory… Assumptions: dP = dN = n Defect states located near the middle of the gap No thermal excitation into bands. Fitting the simple theory: radB is given. Find defA to minimize logarithmic error defA is the defect related recombination constant radB is the radiative recombination constant.
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Simple Theory Fit…
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A Better Model… Assumptions: defA independent of temperature (and is related to the carrier lifetime) Calculations: Calculate Ef for a given temperature, bandgap and defect distribution Calculate QEfp / QEfn for a given exN (the value of exN is chosen to match experimental dPdN) Calculate occupations (dP, dN, dDp, and dDn) dDp = trapped hole concentration dDn = trapped electron concentration Ef is the Fermi energy QEFp/n is the quasi-Fermi energy for holes and electrons respectively exN is the number of excited carriers
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Calculating Ef… The Fermi energy Ef is the energy where: (# empty states below Ef) = (# filled states above Ef) Red area = Blue area Valence Band Conduction Band Defect States Ef Energy
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Calculating QEFp and QEFn… Find QEFp and QEFn such that: exN = increased occupation (red area) Ef QEFp QEFn exN Filled Hole States Filled Electron States Increased hole occupationIncreased electron occupation Energy
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Calculating band occupations… dP and dN depend on QEFp and QEFn, respectively. QEFn dN Conduction Band Valence Band QEFp dP Energy
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Calculating defect occupation… dDp and dDn depend on Ef, and QEF’s Note: graph represents an arbitrary midgap defect distribution QEFp QEFnEf Electron Traps dDpHole Traps dDn Trapped hole occupationTrapped electron occupation Energy
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Symmetric vs. Asymmetric defect distribution… Symmetric Defect DOS: EvEc
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Symmetric Defect Fit…
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Asymmetric defect DOS… Using 2 Gaussians…(fit for 2 Gaussians) EvEc
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2-Gaussian Asymmetric Fit…
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3-Gaussian Asymmetric Fit. EvEc
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3-Gaussian Asymmetric Fit…
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Conclusion… Simple Theory Defect slope is too steep and theory does not allow for temperature dependence! Temperature dependence and shallow defect slope can be modeled using: An occupation model that allows for thermal defect-to-band excitation. An asymmetric defect level distribution
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In-depth look at the model… Calculating DOS(e) DOS(e) = ValenceBand(e) + ConductionBand(e) + defDos(e) ValenceBand(e) = 0 if e > Ev, if e >= Ev ConductionBand(e) = 0 if e < Ec, if e <= Ec defDos(e) is an arbitrary function denoting the defect density of states. defDos(e) = 0 when e = Ec
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Fermi Function, and calculating Ef… Fermi Function: To calculate Ef, find Ef where:
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Calculating QEFp/n QEFp denotes the point where: QEFn denotes the point where:
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Calculating Occupations… Note: see slide 7 for rate value.
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Numerical Infinite Integrals… Need: a bijection And Then: Using ArcTan,
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