1. The Solar-B EUV Imaging Spectrometer: an Overview of EIS J. L. Culhane Mullard Space Science Laboratory University College London

2. 6 th Solar B Science Meeting, Kyoto 8 th November, 2005. EIS Instrument Overview 2 EIS on the Solar-B Spacecraft Roles and Responsibilities UK (MSSL (PI), Birmingham, RAL):  CCD cameras, Structure, On-board Processor, Filter Housing, Calibration USA (NRL, GSFC, Columbia):  Optics, Coatings, Mechanisms, Filters, Japan (NAOJ, ISAS):  Testing, Integration with Spacecraft Norway (UiO):`  EGSE Software All participants are involved in Post-launch Mission Operations and Data Analysis

3. 6 th Solar B Science Meeting, Kyoto 8 th November, 2005. EIS Instrument Overview 3 Large Effective Area in two EUV bands: 170-210 Å and 250-290 Å –Multi-layer Mirror (15 cm dia ) and Grating; both with optimized Mo/Si Coatings –CCD camera; Two 2048 x 1024 high QE back illuminated CCDs Spatial resolution: 1 arc sec pixels/2 arc sec resolution Line spectroscopy with ~ 25 km/s per pixel sampling Field of View ： –Raster: 6 arc min×8.5 arc min; –FOV centre moveable E – W by ± 15 arc min Wide temperature coverage: log T = 4.7, 5.4, 6.0 - 7.3 K Simultaneous observation of up to 25 lines/spectral windows EIS - Instrument Features

4. 6 th Solar B Science Meeting, Kyoto 8 th November, 2005. EIS Instrument Overview 4 EIS Optical Diagram Grating Front Baffle Entrance Filter Primary Mirror CCD Camera

5. 6 th Solar B Science Meeting, Kyoto 8 th November, 2005. EIS Instrument Overview 5 Primary Mirror Raster Drive Primary Mirror Assembly Multilayer-coated mirror shown installed in the instrument structure

6. 6 th Solar B Science Meeting, Kyoto 8 th November, 2005. EIS Instrument Overview 6 Slit/Slot and Shutter Assembly Slit/Slot Wheel Shutter Slit/Slot Wheel - before blackening

7. 6 th Solar B Science Meeting, Kyoto 8 th November, 2005. EIS Instrument Overview 7 Grating Assembly Grating Focus Drive

8. 6 th Solar B Science Meeting, Kyoto 8 th November, 2005. EIS Instrument Overview 8 Atomic Force Microscope Profile of Laminar Grating. Mean groove depth is 6.4 nm and the land width is 108 nm (4200 lines/mm) AFM profile of grating grooves in a 1 μm x 1 μm region near grating center for grating FL-8 Grating substrates fabricated by Zeiss - Holographic technique used to form a sinusoidal groove pattern - Ion beam etching used to shape laminar grooves and to achieve specified groove depth

9. 6 th Solar B Science Meeting, Kyoto 8 th November, 2005. EIS Instrument Overview 9 Dual CCD Camera CCD Camera and Readout Electronics Camera and associated electronics installed in the instrument structure CCDs with cold finger attachments

10. 6 th Solar B Science Meeting, Kyoto 8 th November, 2005. EIS Instrument Overview 10 EIS Instrument Pre-Calibration EIS Instrument Completed

11. 6 th Solar B Science Meeting, Kyoto 8 th November, 2005. EIS Instrument Overview 11 Spectroscopic Performance Long Wavelength Band Ne III lines near 267 Å from the NRL Ne–Mg Penning discharge source Gaussian profile fitting gives the FWHM values shown in the right-hand panel 57.7 mÅ 58.1 mÅ 57.9 mÅ  ~ 4600

12. 6 th Solar B Science Meeting, Kyoto 8 th November, 2005. EIS Instrument Overview 12 Spectroscopic Performance Short Wavelength Band Mg III lines near 187 Å from the NRL Ne–Mg Penning discharge source Gaussian profile fitting gives the FWHM values shown in the right-hand panel 47 mÅ  ~ 4000

13. 6 th Solar B Science Meeting, Kyoto 8 th November, 2005. EIS Instrument Overview 13 Observables Observation of single lines –Line intensity and profile –Line shift (  ) → Doppler motion –Line width (  w) and temperature → Nonthermal motion Observation of line pair ratios –Temperature –Density Observation of multiple lines –Differential emission measure  ww

14. 6 th Solar B Science Meeting, Kyoto 8 th November, 2005. EIS Instrument Overview 14 Four slit/slot selections available EUV line spectroscopy - Slits - 1 arcsec  512 arcsec slit - best spectral resolution - 2 arcsec  512 arcsec slit - higher throughput EUV Imaging – Slots –Overlappogram; velocity information overlapped –40 arcsec  512 arcsec slot - imaging with little  overlap –250 arcsec  512 arcsec slot - detecting transient events Slit and Slot Interchange

15. 6 th Solar B Science Meeting, Kyoto 8 th November, 2005. EIS Instrument Overview 15 EIS Field-of-View 360  512  EIS Slit Maximum FOV for raster observation 512  900  Raster-scan range Shift of FOV center with coarse-mirror motion 250  slot 40  slot 512 

16. 6 th Solar B Science Meeting, Kyoto 8 th November, 2005. EIS Instrument Overview 16 EIS Effective Area Primary and Grating: Measured- flight model data used Filters: Measured- flight entrance and rear filters CCD QE: Measured- engineering model data used Following the instrument end-to-end calibration, analysis suggests that the above data are representative of the flight instrument

17. 6 th Solar B Science Meeting, Kyoto 8 th November, 2005. EIS Instrument Overview 17 EIS Sensitivity IonWavelength (A) logTN photons ARM2-Flare Fe X184.546.001536 Fe XII186.85 / 186.886.1113/21105/130 Fe XXI187.897.00-346 Fe XI188.23 / 188.306.1141 / 15110/47 Fe XXIV192.047.30- 4.0  10 4 Fe XII192.396.1146120 Ca XVII192.826.7031 1.8  10 3 Fe XII193.526.11135305 Fe XII195.12 / 195.136.11241/16538/133 Fe XIII200.026.2020113 Fe XIII202.046.203582 Fe XIII203.80 / 203.836.207/2038/114 Detected photons per 1  1  area of the Sun per 1 sec exposure. IonWavelength (A) logTN photons ARM2-Flare Fe XVI251.076.40-108 Fe XXII253.167.11-71 Fe XVII254.876.60-109 Fe XXVI255.107.30- 3.3  10 3 He II256.324.7016 3.6  10 3 Si X258.376.111462 Fe XVI262.986.4015437 Fe XXIII263.767.20- 1.2  10 3 Fe XIV264.786.3020217 Fe XIV270.516.3017104 Fe XIV274.206.301476 Fe XV284.166.35111 1.5  10 3

18. 6 th Solar B Science Meeting, Kyoto 8 th November, 2005. EIS Instrument Overview 18 Doppler velocity Line width Bright AR line Flare line Photons (1  1  area) -1 sec -1 Photons (1  1  area) -1 (10sec) -1 Number of detected photons Doppler Velocity and Line Width Uncertainties

19. 6 th Solar B Science Meeting, Kyoto 8 th November, 2005. EIS Instrument Overview 19 Processed Science Data Products Intensity Maps (T e, n e ):Intensity Maps (T e, n e ): – images of region being rastered from the zeroth moments of strongest spectral lines Doppler Shift Maps (Bulk Velocity):Doppler Shift Maps (Bulk Velocity): – images of region being rastered from first moments of the strongest spectral lines Line Width Maps (Non-thermal Velocity):Line Width Maps (Non-thermal Velocity): – images of region being rastered from second moments of the strongest spectral lines

20. 6 th Solar B Science Meeting, Kyoto 8 th November, 2005. EIS Instrument Overview 20 First 90 Day Observing Plan Flare Trigger and Dynamics: patial determination of evaporation and turbulence in a flare  Spatial determination of evaporation and turbulence in a flare Active Region Heating:  Spatial determination of velocity field in AR loops for a range of T e values Quiet Sun Studies:  Correlate coronal T e, n e, v with the magnetic topology inferred from FPP Coronal Holes and Hole Boundaries:  Measurement of intensity and velocity field at a coronal hole boundary and at selected sites in coronal holes

21. 6 th Solar B Science Meeting, Kyoto 8 th November, 2005. EIS Instrument Overview 21 CONCLUSIONS Following SOHO CDS, the EIS instrument will provide the next steps in EUV spectral imaging of the corona: –x 10 enhancement in A eff from use of multilayers and CCDs –x 5 enhancement in spectral resolution –x 2-3 enhancement in spatial resolution –Like CDS; absolute calibration performed to ± 20% EIS will: –Address a broad range of coronal science topics –Enable major goals of Solar-B mission by relating coronal response to magnetic flux emergence and material flows

22. 6 th Solar B Science Meeting, Kyoto 8 th November, 2005. EIS Instrument Overview 22 END OF TALK