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Research in IC Packaging Electrical and Physical Perspectives
Chung-Kuan Cheng CSE Department UC San Diego La Jolla, CA
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Outline Short Biography Research Direction Challenges in IC Packaging
Potential Areas for Co-operation Conclusion
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Short Biography Ph.D., UC Berkeley,1984
Senior CAD Engineer, AMD, Professor, UC San Diego, 1986-Present Chief Scientist, Mentor Graphics, IBM Faculty Award, 2004, 2006 IEEE Fellow, 2000 Best Paper Awards, IEEE TCAD 1997, 2002 Excellence in Teaching, JSOE 1991 9 Patents (Pending), 2 Books, 175 papers 30 Ph.D. students, 15 Visiting Scholars
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Research Directions Synthesis (Power & Performance)
Networks on Chip Power, Clock Distribution, Global Interconnect Data Path Synthesis: Adders, Shifter, Multipliers, Division Operators Interconnect Technologies Packaging, MCM, Board, Interface Simulation (Whole Chip Analysis) SPICEDiego (Released by UCSD)
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Challenges in IC Packaging
Minimize power/ground fluctuations and simultaneous switching noise (SSN) in the package Control crosstalk and parasitic RLC Include chip and board interfaces in the design process (co-design) Use modeling and simulation tools to accurately predict and optimize performance Design a convenient and accurate platform to characterize performance Design novel packaging systems
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Potential Areas of Co-operation
Power/ground networks to minimize fluctuations and reduce SSN On-package decoupling capacitors Pin assignment and breakaway routing to minimize noise Electrical characterization of packages
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Area #1 and #2 – Power/Ground Networks
Spatial and temporal excitations Power ground distribution from board, packages, to chips. IR Drop: Static Analysis Resistive Networks Static Current Sources dI/dt: Dynamic Analysis RLC Networks Power on and off Sleep mode on and off Gated clocks Various operation modes
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Area #1 and #2 - Power/Ground Network Analysis: Natural Frequency
RLC Network Characteristics: Natural frequencies (Quality Factor) Operation Modes: Excite the resonance Decoupling Capacitance: Shift the natural frequencies.
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Howard Chen, IBM
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Area #3 - Pin Breakaway and Pin Assignment
Obj: min noise Design Space Pin assignment of power ground pins and signal pairs Breakaway sequences Breakaway patterns
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Area #3 - Pin Breakaway and Pin Assignment
Row by Row Escape: Escape interconnect row by row from outside toward inside.
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Area #3 – Pin Breakaway and Pin Assignment
Central Triangular Escape: Escape objects from the center of the outside row and expands the indent with a single triangular outline.
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Area #4 – Electrical Characterization
Electrical characterization necessary in order to validate simulation results Especially critical at fast edge rates and high frequencies. Test vehicle design to include package mounted on a PCB that simulates the actual end product Time domain (TDR) and frequency domain (Network Analyzer) characterization Correlation to simulated results
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UCSD Lab and Software Resources
Cal IT2 Atkinson Hall at UCSD Sigrity Suite: Speed2000, PowerSI, PowerDC, BBS Agilent ADS (Advanced Design System) IBM EIP (Electrical Interconnect and Packaging) HSpice, SPICEDiego
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Conclusion Goals of IC Package Design:
High Performance High Quality Low Power, Cost Research collaboration between UCSD and Qualcomm can result in ways of improving performance Theoretical knowledge in UCSD Practical knowledge in Qualcomm
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