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ES 240 Project: Finite Element Modeling of Nano- Indentation of Thin Film Materials.

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Presentation on theme: "ES 240 Project: Finite Element Modeling of Nano- Indentation of Thin Film Materials."— Presentation transcript:

1 ES 240 Project: Finite Element Modeling of Nano- Indentation of Thin Film Materials

2 1. Introduction to Nanoindentation Process 2. Model Description 3. Model Validation 4. Results and Discussion 5. Effect of Substrates 6. Conclusion and Future Work Outline

3 Displacement Sensor Force Sensor Film Substrate Indenter 1. Introduction to Nanoindentation Process

4 100 nm 1000 nm 900 nm Indenter: Diamond Film: Copper Substrate: 1. Copper 2. Sapphire 3. Silicon 4. Glass 5. Polymer 2. Model Description -Dimensions and Materials of The Model

5 Elastic Materials E (GPa) v (-) Diamond11470.3 Sapphire4400.3 Silicon1720.3 Glass730.3 Polymer300.3 Elastic/Plastic Mateirial E (GPa) V(-)Y (GPa) Plastic Constitutive Copper1300.31.3 2. Model Description -Materials Properties

6 Indenter Film Substrate Element Type: 4-Noded Axisymmetric Element Size (Edge length): ~2 nm (Indentation region) ~10 nm (Other region) Mesh Sensitivity: Refined-mesh model gives similar results. 2. Model Description -Mesh and Element

7 Experimental : Theoretical: : Reduced Modulus : Film’s E and v : Indenter’s E and v : Indenter and film’s contact area 3. Model Validation -Reduced Modulus (copper substrate)

8 Simulated: Theoretical: 3. Model Validation -Theoretical and Simulated Results (copper substrate)

9 4. Model Results - Mises Stress (copper substrate)

10 4. Model Results - Effective Plastic Strain (copper substrate)

11 Model’s Prediction Experimental Results (W, Nix et al, Acta Materialia, 50, 23, 2002) 5. Effect of Substrates - Load vs. Displacement

12 Model’s Prediction Experimental Results (W, Nix et al, Acta Materialia, 50, 23, 2002) 5. Effect of Substrates - Reduced Modulus

13 5. Effect of Substrates - Deflection of Substrate

14 1. Nanoindentation process can be simulated using finite element method. 2. The reduced modulus predicted by the finite- element model is very close to analytical results. 3. Stiff substrate tends to overestimate thin film’s modulus, and compliant substrate tends to underestimate thin film’s modulus. 5. Conclusion


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