1. Renaat VerbruggenCA421 Patterns & Metrics 1 CA421 Software Patterns & Metrics

2. Renaat VerbruggenCA421 Patterns & Metrics 2 Renaat Verbruggen School of Computing Room L2.43 (01)700.5257 renaat@computing.dcu.ie Moodle: CA421 Q&A etc.

3. Renaat VerbruggenCA421 Patterns & Metrics 3 Assessment Patterns Project, individual, 25% Final Exam, 2 hours, 75%

4. Renaat VerbruggenCA421 Patterns & Metrics 4 Presentation Lectures Readings available through Moodle Get the full readings completed early, use the summaries to revise.

5. Renaat VerbruggenCA421 Patterns & Metrics 5 Topics 1. Object-oriented Design Patterns 2. Architectural Patterns 3. Software Metrics 4. Software Cost Estimation 5. Software Test

6. Renaat VerbruggenCA421 Patterns & Metrics 6 Book: If you are to buy one book for the course then I recommend: Object-Oriented Software Engineering: Practical Software Development using UML and Java Second Edition Timothy C. Lethbridge and Robert Laganière McGraw Hill, 2005 ISBN 0-07-710908-2 Timothy C. LethbridgeRobert Laganière The first edition is still worth picking up 2nd hand: ISBN 0-07-709761-0

7. Renaat VerbruggenCA421 Patterns & Metrics 7 Book… Website associated with book, including lectures by authors etc. at: http://www.site.uottawa.ca/school/research/lloseng/s upportMaterial/slides/ http://www.site.uottawa.ca/school/research/lloseng/s upportMaterial/slides/ However I will link locally to the notes that we will be covering in lectures.

8. Renaat VerbruggenCA421 Patterns & Metrics 8 Electronic Books in DCU library DCU Library currently subscribes to a number of e-books which can be accessed via the Safari Books Online database. You can search the entire set of 40 e-books by keyword, author, subject, title, etc..Safari Books Online

9. Renaat VerbruggenCA421 Patterns & Metrics 9 Electronic Journals in DCU library ACM Digital Library Fulltext access to approximately 95% of all ACM (Association for Computing Machinery) articles and transactions. Abstracts of Proceedings are also available. Coverage: 1991 - to date ACM Digital Library

10. Renaat VerbruggenCA421 Patterns & Metrics 10 Electronic Journals … IEL - IEEE/IEE Electronic Library Represents 30% of electrical engineering and computer science literature. IEL provides access to all IEEE journals, transactions, magazines and conference proceedings; IEE journals and conference proceedings; and current IEEE standards. Full-text is available from 1988 and selected content available from 1950. IEL - IEEE/IEE Electronic Library E-tutorials User Guides (pdf): basic | advancedbasicadvanced Search IEEE Help FAQ Coverage: 1988-

11. Renaat VerbruggenCA421 Patterns & Metrics 11 Any Questions ?