1. INA826 EMI RR Testing

2. Testing Methodology Signal Generator DMM LPF
A sine wave applied to the input to simulate conducted EMI
10MHz to 6GHz
-10dBm power level (100mVp)
This conducted EMI signal will cause a change in the output offset of the part
DUT output is low-pass filtered
Change in offset is measured by a 6.5 digit DMM
Change in offset is input referred

3. Test Configurations
Bipolar (+/-12V) supplies were used with the reference pin grounded
Differential Measurement
Signal applied to non-inverting input
Inverting input grounded
Common-Mode Measurement
Signal applied to both inputs

4. Differential EMI RR of 3 Separate Units
The differential EMI RR performance is consistent across multiple INA826s

5. INA826 Differential EMI RR Gain Dependency
Differential EMI RR improves above 1GHz with increasing gain

6. Common-Mode EMI RR of 3 Separate Units
Low frequency common-mode EMI RR performance has more unit-to-unit variation than differential EMI RR performance

7. INA826 Common-Mode EMI RR Gain Dependency
Increasing gain generally improves CM EMI RR at high frequencies

8. Decoupling Capacitor Effects
Varying the decoupling capacitor size and type had negligible effect on EMI RR performance