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Modern VLSI Design 4e: Chapter 6 Copyright 2008 Wayne Wolf Topics Memories: –ROM; –SRAM; –DRAM; –Flash. Image sensors. FPGAs. PLAs.
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Modern VLSI Design 4e: Chapter 6 Copyright 2008 Wayne Wolf High-density memory architecture
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Modern VLSI Design 4e: Chapter 6 Copyright 2008 Wayne Wolf Memory operation Address is divided into row, column. –Row may contain full word or more than one word. Selected row drives/senses bit lines in columns. Amplifiers/drivers read/write bit lines.
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Modern VLSI Design 4e: Chapter 6 Copyright 2008 Wayne Wolf Read-only memory (ROM) ROM core is organized as NOR gates— pulldown transistors of NOR determine programming. Erasable ROMs require special processing that is not typically available. ROMs on digital ICs are generally mask- programmed—placement of pulldowns determines ROM contents.
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Modern VLSI Design 4e: Chapter 6 Copyright 2008 Wayne Wolf ROM core circuit
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Modern VLSI Design 4e: Chapter 6 Copyright 2008 Wayne Wolf Static RAM (SRAM) Core cell uses six-transistor circuit to store value. Value is stored symmetrically—both true and complement are stored on cross- coupled transistors. SRAM retains value as long as power is applied to circuit.
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Modern VLSI Design 4e: Chapter 6 Copyright 2008 Wayne Wolf SRAM core cell
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Modern VLSI Design 4e: Chapter 6 Copyright 2008 Wayne Wolf SRAM core operation Read: –precharge bit and bit’ high; –set select line high from row decoder; –one bit line will be pulled down. Write: –set bit/bit’ to desired (complementary) values; –set select line high; –drive on bit lines will flip state if necessary.
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Modern VLSI Design 4e: Chapter 6 Copyright 2008 Wayne Wolf SRAM sense amp
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Modern VLSI Design 4e: Chapter 6 Copyright 2008 Wayne Wolf Sense amp operation Differential pair—takes advantage of complementarity of bit lines. When one bit line goes low, that arm of diff pair reduces its current, causing compensating increase in current in other arm. Sense amp can be cross-coupled to increase speed.
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Modern VLSI Design 4e: Chapter 6 Copyright 2008 Wayne Wolf 3-transistor dynamic RAM (DRAM) First form of DRAM—modern commercial DRAMs use one-transistor cell. 3-transistor cell can easily be made with a digital process. Dynamic RAM loses value due to charge leakage—must be refreshed.
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Modern VLSI Design 4e: Chapter 6 Copyright 2008 Wayne Wolf 3-T DRAM core cell
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Modern VLSI Design 4e: Chapter 6 Copyright 2008 Wayne Wolf 3-T DRAM operation Value is stored on gate capacitance of t 1. Read: –read = 1, write = 0, read_data’ is precharged; –t 1 will pull down read_data’ if 1 is stored. Write: –read = 0, write = 1, write_data = value; –guard transistor writes value onto gate capacitance.
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Modern VLSI Design 4e: Chapter 6 Copyright 2008 Wayne Wolf 3-T DRAM operation Value is stored on gate capacitance of t 1. Read: –read = 1, write = 0, read_data’ is precharged; –t 1 will pull down read_data’ if 1 is stored. Write: –read = 0, write = 1, write_data = value; –guard transistor writes value onto gate capacitance.
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Modern VLSI Design 4e: Chapter 6 Copyright 2008 Wayne Wolf 1-T DRAM Word line controls pass transistor. Pass transistor guards access to capacitor. Read is destructive.
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Modern VLSI Design 4e: Chapter 6 Copyright 2008 Wayne Wolf Stacked capacitor DRAM
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Modern VLSI Design 4e: Chapter 6 Copyright 2008 Wayne Wolf Trench capacitor DRAM
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Modern VLSI Design 4e: Chapter 6 Copyright 2008 Wayne Wolf Floating gate transistor Poly 1 gate is not connected. Schematic symbol: p n+ poly 1 poly 2 SiO 2
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Modern VLSI Design 4e: Chapter 6 Copyright 2008 Wayne Wolf Fowler-Nordheim tunneling p n+ poly 1 poly 2 SiO 2 n-well n+p+ floating -- + 20 V
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Modern VLSI Design 4e: Chapter 6 Copyright 2008 Wayne Wolf Fowler-Nordheim erasing p n+ poly 1 poly 2 SiO 2 n-well n+p+ floating -- + 20 V
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Modern VLSI Design 4e: Chapter 6 Copyright 2008 Wayne Wolf NOR flash architecture Same as NOR ROM but with floating gate pulldowns. pullup +
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Modern VLSI Design 4e: Chapter 6 Copyright 2008 Wayne Wolf NAND flash architecture Want to provide banked memory for higher data throughput. Widely used for data storage. Likely to become standard architecture. bank 0 bank 1 bank 2 bank 3 address data address 1address 2 data 1 data 2
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Modern VLSI Design 4e: Chapter 6 Copyright 2008 Wayne Wolf 2-bit NAND flash cell bit n+ source Select bottom Select top RA0 RA1
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Modern VLSI Design 4e: Chapter 6 Copyright 2008 Wayne Wolf NAND flash cell programming bit Select bottom Select top RA0 RA1 +20V +5V 0V +7V Row not programmed
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Modern VLSI Design 4e: Chapter 6 Copyright 2008 Wayne Wolf Wear in flash memory Write cycles slowly damage devices. Limited number of write cycles: 10,000. Software balances utilization of locations to level wear across the device.
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Modern VLSI Design 4e: Chapter 6 Copyright 2008 Wayne Wolf Image sensors Two major types of image sensors: –Charge-coupled device (CCD) requires specialized fabrication steps. –CMOS image sensor uses standard CMOS technology, perhaps with low-noise modifications. CMOS image sensor is an array circuit similar to a RAM.
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Modern VLSI Design 4e: Chapter 6 Copyright 2008 Wayne Wolf Photodiodes Photodiode turns photons into electrons. Photocurrent density: photons + n p x1 x2 x3
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Modern VLSI Design 4e: Chapter 6 Copyright 2008 Wayne Wolf Active pixel sensor (APS) circuit
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Modern VLSI Design 4e: Chapter 6 Copyright 2008 Wayne Wolf APS column
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Modern VLSI Design 4e: Chapter 6 Copyright 2008 Wayne Wolf SRAM-based FPGAs Program logic functions, interconnect using SRAM. Advantages: –dynamically reconfigurable; –uses standard processes. Disadvantages: –SRAM burns power. –Possible to steal, disrupt configuration bits.
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Modern VLSI Design 4e: Chapter 6 Copyright 2008 Wayne Wolf Logic elements Logic element includes combinational function + register(s). Use SRAM as lookup table for combinational function.
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Modern VLSI Design 4e: Chapter 6 Copyright 2008 Wayne Wolf LUT-based logic element Lookup table configuration bits out inputs Can multiplex at output or address at input
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Modern VLSI Design 4e: Chapter 6 Copyright 2008 Wayne Wolf Example 1, 1, 1, 1, 1, 1, 1, 0 111 0, 1, 1, 0, 1, 0, 0, 1 111 01
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Modern VLSI Design 4e: Chapter 6 Copyright 2008 Wayne Wolf Evaluation of SRAM-based LUT N-input LUT can handle function of 2 n inputs. All logic functions take the same amount of space. SRAM is larger than static gate equivalent of function. Burns power at idle.
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Modern VLSI Design 4e: Chapter 6 Copyright 2008 Wayne Wolf Static CMOS gate vs. LUT Number of transistors: –NAND/NOR gate has 2n transistors. –4-input LUT has 128 transistors in SRAM, 96 in multiplexer. Delay: –4-input NAND gate has 9 delay. –SRAM decoding has 21 delay. Power: –Static gate’s power depends on activity. –SRAM always burns power.
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Modern VLSI Design 4e: Chapter 6 Copyright 2008 Wayne Wolf Registers in logic elements Want to selectively add register to LE: Comb logic DQ Configuration bit LE out
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Modern VLSI Design 4e: Chapter 6 Copyright 2008 Wayne Wolf Other LE features Multiple logic functions in an LE. Addition logic: –carry chain.
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Modern VLSI Design 4e: Chapter 6 Copyright 2008 Wayne Wolf Programmable interconnect MOS switch controlled by configuration bit: DQ
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Modern VLSI Design 4e: Chapter 6 Copyright 2008 Wayne Wolf Programmable vs. fixed interconnect Switch adds delay. Transistor off-state is worse in advanced technologies. FPGA interconnect has extra length = added capacitance.
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Modern VLSI Design 4e: Chapter 6 Copyright 2008 Wayne Wolf Programmable logic array (PLA) Used to implement specialized logic functions. A PLA decodes only some addresses (input values); a ROM decodes all addresses. PLA not as common in CMOS as in nMOS, but is used for some logic functions.
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Modern VLSI Design 4e: Chapter 6 Copyright 2008 Wayne Wolf PLA organization AND planeOR plane p1 p2 p3 p4 f0f0 f1f1 i0i0 i0’i0’i1i1 i1’i1’ product term
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Modern VLSI Design 4e: Chapter 6 Copyright 2008 Wayne Wolf PLA structure AND plane, OR plane, inverters together form complete two-level logic functions. Both AND and OR planes are implemented as NOR circuits. Pulldown transistors form programming/personality of PLA. Transistors may be referred to as programming tabs.
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Modern VLSI Design 4e: Chapter 6 Copyright 2008 Wayne Wolf PLA AND/OR cell programming tab no tab V SS input 1input 2 output 1 output 2
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