1. Quality Test of L1 sensors HPK 10 sensors –Tested all, 6 sent to Fermilab – Test structures, HPK 133 L00 CDF ELMA 9 sensors –Tested 6 of 9

2. HPK V depletion ~120V consistent I leakage at V depletion ~ 50nA (except 07) Breakdown: seen once s/n20 at 750V Strip leakage ~ 0.04nA Poly resistor value ?? Capacitance 70pF I dielectric: LCR noise Bad Channels

3. –HPK01 none –HPK03 bad strip 42; –HPK04 bad strip 346; –HPK06 PH 13, 47, 267; –HPK07 bad strips 27, 320; –HPK09 none –HPK11 leaky 169; –HPK12 none –HPK13 none; Rpoly strange shape –HPK20 none; HPK claims two low Cac Fermilab

4. Polysilicon Resistor Using 237 bias/no bias

5. Interstrip Resistor Using 237 Bias/NO Bias

6. Polysilicon Resistor Using 487 Bias/NO Bias

7. ELMA V depletion ~ 26V I leakage at V depletion ~ 50nA Breakdown ALL at 250-350V Strip leakage ~ 0.15nA Poly resistor value: vary, better than HPK Capacitance ~ 80pF I dielectric

8. Bad Strips L1-001 1, 43, 140, 256, 276 L1-002 95-109, 362, 383 L1-003 275,384; Rpoly ~ 4MOhm L1-004 32, 168, 263, 356, 373 L1-005 180, 368 L1-006 107, Rpoly ~ 1.3 Mohm

9. Conclusion HPK – Polysilicon resistors are out of specs ELMA – Low breakdown voltage