1. SRAM DESIGN PROJECT PHASE 2 Nirav Desai 4280229 VLSI DESIGN 2: Prof. Kia Bazargan Dept. of ECE College of Science and Engineering University of Minnesota, Twin Cities 1 University of Minnesota

2. SRAM CELL READ AND WRITE MARGIN FROM BUTTERFLY CURVE NMOS inverter = 110nM PMOS inverter = 220nM NMOS Access = 90nM NMOSinv/NMOSaccess = 1.2 PMOSinv/NMOSaccess=2.4 Cbitline = 0.747fF for 512 cell array ( Interconnect Parasitics from ASU PTM Website ) University of Minnesota

3. SRAM CELL READ AND WRITE MARGIN FROM BUTTERFLY CURVE NMOS inverter = 150nM PMOS inverter = 555nM NMOS Access = 180nM NMOSinv/NMOSaccess = 1.2 PMOSinv/NMOSaccess = 3 Cbitline = 0.747fF Curve shows SRAM cell is close to write failure. Bitline Precharge to less than 1.1V could be explored to increase SNM. University of Minnesota

4. Simulation Setup M0,M1,M3,M4 form the cross coupled inverter pair M5,M6 are access transistors C1, C2 is the bitline capacitance M7 is the precharge switch for bitline ( bit ) - V3 precharges the bitline to 0.8V V6 precharges bitbar and writes a 0 to the cell V(write) V(ic) V(word) V(qbar) V(q) V(bitbar) V(bit) University of Minnesota

5. Timing Waveforms for Characterization V(write) – Applied to source of M7 (precharge switch) V(word) – Wordline Voltage V(qbar) V(q) V(ic) – Enables the precharge switch M7 V(bitbar) V(bit) V(write) precharges Cbit to 0.8V via M7 V(word) disables access transistors M5 and M6 during precharge. V(qbar) and V(q) are used to generate the butterfly curves. V(ic) enables M7 during precharge It could be implemented as NOT(V(word)). V(bitbar) precharges to 0.8V, shows charge pumping when M7 turns off and follows V(qbar) when wordline is enabled. V(bit) follows V(q) after word line is enabled. V(bit) precharged to Vdd by V6 University of Minnesota

6. PASS TRANSISTOR BASED TREE DESIGN a0 a1 a2 1:8 Row Decoder Tree 8 MSB BUFFERS in Similar Tree Decoder for 16 LSB Bits University of Minnesota

7. TREE DECODER DESIGN From row buffer From column buffer To Word Line Buffer 2 4 = 16 LSB Bits for Word Line Address from Column Buffers 2 3 = 8 MSB Bits for Word Line Address from Row Buffers Directions of Increasing bit number University of Minnesota

8. PASS TRANSISTOR BASED TREE DESIGN IN OUT CK Identical Sizing for NMOS and PMOS to minimize charge injection effects Delay drops by ~40ps/2 for every Doubling of transistor widths Delay drop saturates around 1000nM to 89ps Used W/L of 880/50 for final tree University of Minnesota

9. TREE DECODER TIMING DIAGRAMS The following waveforms were applied to the row and column selection inputs of the tree decoder University of Minnesota

10. TREE DECODER TIMING DIAGRAMS It takes one cycle for initializing the tree decoder after which we get clean pulses for each row output LSB pulse is wider than MSB pulse in bottom figure to allow the tree to clear present state before next University of Minnesota

11. TREE DECODER TIMING DIAGRAMS The top waveforms shows the matrix point output where the row and column select inputs are high The output node discharges when the input goes low University of Minnesota

12. SRAM TIMING CIRCUIT in SAE/Write Enable Wordline Enable Precharge Read/Write Input Pulse Precharge Disable Pulse Word Line Enable Pulse Read/Write Output Pulse Timing Sequence: 1.Disconnect Precharge 2.Enable Word Line 3.SAE / Write Enable 4.Wait for read/write 5.Disble SAE/Write Enable 6.Disable Wordline 7.Reconnect Precharge and discharge all word lines University of Minnesota

13. Sense Amplifier Enable Wordline Precharge or1 or2 or1 or2 or1 or2 Predischarge Transistor for Output Node when no Signal at the input OUT Write Driver Enable (WE) Wordline Precharge Read Bit Write Bit Same circuit as above right Pass Transistors are used for combining the Wordline and Precharge Signals from Read and Write instructions 2 copies of timing circuit from previous slide for read and write University of Minnesota SRAM TIMING INTEGRATION CIRCUIT

14. READ WRITE CIRCUIT ( Design by Bong Jin ) Sense Amplifier Write Driver Precharge Circuit University of Minnesota

15. READ WRITE CIRCUIT TEST SETUP Bitline Capacitance estimate from ASU PTM Website Cbit estimate for 512 rows NMOS Switches to allow read without disabling write circuit Single SRAM Cell for simulations University of Minnesota

16. READ / WRITE TIMING WAVEFORMS Precharge Pulse ( Active Low ) Data Meant to be written to cell Write Enable Pulse Read Enable Pulse Output of Write Buffer Disable output buffer ( tristate logic ) Bitline Bitline Bar Data Output Data Out Bar University of Minnesota

17. SRAM Cell Layout University of Minnesota

18. 4X4 SRAM Array Layout VDD GND WORD 1 WORD 0 B0 B0BARB1 B1BAR This unit can be replicated in all directions without any changes. LVS check remaining Array Size = 3.7975umX2.4725um University of Minnesota

19. References Digital Integrated Circuits Jan Rabaey, Anantha Chandrakasan, Borivoje Nikolic ( SRAM Cell Design, Decoders, Read Write Circuits ) CMOS VLSI Design by Weste and Harris ( Butterfly Curves ) CMOS Circuit Design, Layout and Simulation Baker, Li, Boyce (Decoder Design) Course slides of Prof. Kia Bazargan ( Precharge Techniques, Decoders, SRAM Cell Design ) University of Minnesota