1. Standards Coordinating Committee 20 on Test and Diagnosis for Electronic Systems Slide 1 SCC20 Liaison Report Dr. John W. Sheppard CS SAB Meeting November 1, 2006

2. Standards Coordinating Committee 20 Slide 2 Scope “Provides for the management, development, and maintenance of language and interface standards supporting system-level (onboard and offboard) automatic test and diagnosis. These standards include (but are not limited to) test requirements, test programs, test procedures, diagnostic knowledge, maintenance information, and major hardware subsystem interfaces between and within Automatic Test Systems.”

3. Standards Coordinating Committee 20 Slide 3 Sponsors/Liaisons IEEE Sponsors and Liaisons: –Aerospace Electronic Systems Society (Joseph Stanco) –Computer Society (John Sheppard) –Instrumentation and Measurement Society (Mark Kaufman) Official Industry Liaisons: –US Department of Defense (William Ross) –UK Ministry of Defense (Malcolm Brown) –National Defense Industrial Association (Les Orlidge) Systems Engineering Committee Automatic Test Committee –IEC/TC93—Design Automation (Narayanan Ramachandran)

4. Standards Coordinating Committee 20 Slide 4 Organization Administration –Chair: Les Orlidge (AAI), Vice Chair: John Sheppard (ARINC/JHU) –Steering Committee (general oversight and approval) –Administrative Subcommittee (quality control and procedures review) Working Groups –Diagnostic and Maintenance Control –Hardware Interfaces –Test and ATS Description –Test Information Infrastructure Membership –2006 Annual Report to SA 102 members (25% increase over 2005) 40 interested parties (non-member) –2007 Membership—111 already signed up as full members.

5. Standards Coordinating Committee 20 Slide 5 Status Standards –IEEE Std 716-1995: ATLAS, reaffirmed 2006. –IEEE Std 1232-2002: Artificial Intelligence Exchange and Service Tie to All Test Environments (AI-ESTATE), dual logo’ed as IEC 62243 Ed 1.0. –IEEE Std 1445-1998: Digital Test Interchange Format (DTIF), reaffirmed 2004. –IEEE Std P1505: Receiver Fixture Interface (co-sponsored by I&M), approved by Standards Board at June meeting. –IEEE Std 1522-2004: Testability and Diagnosability Characteristics and Metrics. (Trial Use), to be reaffirmed. –IEEE Std 1546-2000: DTIF Users Guide, reaffirmed 2006. –IEEE Std 1641-2004: Signal and Test Definition, under consideration for IEC dual logo. –IEEE Std P1641.1: STD User’s Guide, approved 2006. –IEEE Std P1671: Automatic Test Markup Language, approved 2006. –IEEE Std P1636.1: ATML Test Results, in ballot.

6. Standards Coordinating Committee 20 Slide 6 Status Projects Underway –P1232: Revision to AI-ESTATE, PAR approved. –P1505.1: Common Test Interface Pin Map, new project. –P1552: Structured Architecture for Test Systems, PAR withdrawn. –P1636: Software Interface for Maintenance Information, Collection, and Analysis (SIMICA), work proceeding. –P1636.2 SIMICA Maintenance Action Information, draft completed. –P1641a: Amendment to STD, new PAR approved. –P1671.1: ATML Test Description, work proceeding. –P1671.2: ATML Instrument Description, work proceeding. –P1671.3: ATML UUT Description, work proceeding. –P1671.4: ATML UUT Configuration Information, new PAR approved. –P1671.5: ATML Test Adapter Information, new PAR approved. –P1671.6: ATML Station Configuration Information, new PAR approved.

7. Standards Coordinating Committee 20 Slide 7 Recent and Current Issues XML Schemata: –Committee has obtained written assurance from IEEE SA that all XML schemata developed as part of SCC20 standard will be posted on an IEEE SA website for free access and use. No special license arrangement was required. –Website already created: http://standards.ieee.org/downloads/1671

8. Standards Coordinating Committee 20 Slide 8 Schema Header This schema is specified in IEEE 1671- 2006, "IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML." This schema is a World Wide Web Consortium (W3C) Extensible Markup Language (XML) binding of the ATML Common component defined in IEEE 1671-2006, "IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML." The purpose of this schema is to provide unique types and attributes for ATML schemas. This schema uses the W3C XML Schema definition language as the encoding. This allows for interoperability and the exchange of ATML component instances between various systems. This schema shall not be modified but may be included in derivative works. Copyright (c) 2006 Institute of Electrical and Electronics Engineers, Inc. USE AT YOUR OWN RISK

9. Standards Coordinating Committee 20 Slide 9 Next Meeting Next SCC20 Meeting: –April 2007 in Madrid, Spain –Sponsored by Indra Sistemas S.A.