2. K.Azadkish H. Asadi M.N.Amiri S.Amininasab E.Bahjati H.Hamidi A.R.Jafari M.J.Hosseinishahi Dastjerdi * X-ray Photoelectron Spectroscopy Instrumental & Application

3. 2014/04/06 کاربرد و دستگاهوری طیف بینی فوتوالکترون اشعه ی ایکس 1393/01/17 K.Azadkish H. Asadi M.N.Amiri S.Amininasab E.Bahjati A.R.Jafari H.Hamidi M.J.Hosseinishahi Dastjerdi * کمال آزادکیش حسین اسدی محمد نبی امیری سعید امینی نسب اسماعیل بهجتی احمد رضا جعفری هادی حمیدی محمد جواد حسینی شاهی دستجردی*

4. Introduction Instrumental Application XPS Comparison with other techniques Conclusion 1

5. Introduction XPS Received the 1981 Nobel Prize in Physics for his work K. Siegbahn Re: Douglas A. Skoog, F James Holler, Stanley R. Crouch/ Principles of Instrumental Analysis / Sixth edition 2

6. What is XPS? Introduction Principles of XPS Re: www.surfaceanalysis.org 3

7. Conduction Band Valence Band L2,L3 L1 K Fermi Level Free Electron Level Incident X-ray 1s 2s 2p Introduction Re: Siegbahn, K.; Edvarson, K. I. Al (1956). "β-Ray spectroscopy in the precision range of 1 : 1e6". Nuclear Physics 4

8. Introduction Binding energy of the electron The kinetic energy of the emitted electron Work function Re: Siegbahn, K.; Edvarson, K. I. Al (1956). "β-Ray spectroscopy in the precision range of 1 : 1e6". Nuclear Physics 5

9. Instrumental 6

10. Sources Sample Holders AnalyzersTransducers Re: Douglas A. Skoog, F James Holler, Stanley R. Crouch/ Principles of Instrumental Analysis / Sixth edition Multichannel transducer Hemispherical capacitor Multichannel analyzer Lens Out put display 7

11. Application Application Of XPS Quantitative Analysis Qualitative Analysis Chemical Shifts and Oxidation States Chemical Shifts and Structure 8

12. 9 Re: Surface Sensitive Technique XPS Comparison with other techniques

13. Conclusion One of the most important applications of XPS has been the identification of oxidation states of elements in inorganic compounds XPS provides information about not only the atomic composition of a sample but also the structure and oxidation state of the compounds being examined. XPS is used from starting Li(A>=3) because of smaller orbital’s radius and analysis of organic compounds cannot be done with XPS because of degredation with radiation 10

14. Conclusion 11 Spectra are a plot of detected electron current (Intensity) vs KE (plotted as BE). Peaks occur at characteristic BEs. Narrow scans at high instrumental resolution are often used for – more quantitative estimate of the composition (from peak areas) – Chemical states of the different elements on the surface. – Relative intensity measurements can provide information about the thickness of an over layer. Survey scan gives information about the elements present; it is a plot of intensity over a wide BEs at low instrumental resolution.

16. Application Auger Re: Siegbahn, K.; Edvarson, K. I. Al (1956). "β-Ray spectroscopy in the precision range of 1 : 1e6". Nuclear Physics A

17. Application Re: http://edu.nano.ir/index.php?actn=papers_view&id=105&action2=print B

18. Conduction Band Valence Band L2,L3 L1 K FermiLevel FreeElectronLevel Emitted Auger Electron 1s 2s 2p Application Re: Siegbahn, K.; Edvarson, K. I. Al (1956). "β-Ray spectroscopy in the precision range of 1 : 1e6". Nuclear Physics A-1

19. Application C

20. D